基于65nm闪存的fpga上重离子诱导单事件瞬态的新传播模型

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2020-10-01 DOI:10.1109/RADECS50773.2020.9857686

B. Du, M. Colucci, S. Francola, L. Aranci, E. Artina, N. Ratti, E. Picardi, R. Mancini, V. Piloni, S. Azimi, L. Sterpone

{"title":"基于65nm闪存的fpga上重离子诱导单事件瞬态的新传播模型","authors":"B. Du, M. Colucci, S. Francola, L. Aranci, E. Artina, N. Ratti, E. Picardi, R. Mancini, V. Piloni, S. Azimi, L. Sterpone","doi":"10.1109/RADECS50773.2020.9857686","DOIUrl":null,"url":null,"abstract":"We present a SET generation and propagation model based on Hann-smoothing function for 65nm Flash-based FPGAs. The model has been characterized with heavy-ions radiation campaigns demonstrating its viable usage for circuit analysis and mitigation purposes.","PeriodicalId":371838,"journal":{"name":"2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"150 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A Novel Propagation Model for Heavy-Ions Induced Single Event Transients on 65nm Flash-based FPGAs\",\"authors\":\"B. Du, M. Colucci, S. Francola, L. Aranci, E. Artina, N. Ratti, E. Picardi, R. Mancini, V. Piloni, S. Azimi, L. Sterpone\",\"doi\":\"10.1109/RADECS50773.2020.9857686\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a SET generation and propagation model based on Hann-smoothing function for 65nm Flash-based FPGAs. The model has been characterized with heavy-ions radiation campaigns demonstrating its viable usage for circuit analysis and mitigation purposes.\",\"PeriodicalId\":371838,\"journal\":{\"name\":\"2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)\",\"volume\":\"150 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RADECS50773.2020.9857686\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS50773.2020.9857686","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

提出了一种基于han -smoothing函数的65nm flash fpga的SET生成和传播模型。该模型具有重离子辐射运动的特征，证明了其用于电路分析和缓解目的的可行性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

A Novel Propagation Model for Heavy-Ions Induced Single Event Transients on 65nm Flash-based FPGAs

We present a SET generation and propagation model based on Hann-smoothing function for 65nm Flash-based FPGAs. The model has been characterized with heavy-ions radiation campaigns demonstrating its viable usage for circuit analysis and mitigation purposes.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

自引率

0.00%

发文量