2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)最新文献_第4页

Next generation functional test program development system 下一代功能测试程序开发系统

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885578

D. Rolince, D. Giles

引用次数: 3

New support perspectives and contracting methodologies for the consolidated automated support system (CASS) 综合自动化支助系统（CASS）的新支助视角和合同方法

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885581

D. Maples, L. Haftel, C. Ruzicka

引用次数: 5

Automatic test equipment (ATE) on a network (securing access to equipment and data) 网络上的自动测试设备(ATE)(保护对设备和数据的访问)

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885630

J. R. McCarty

{"title":"Automatic test equipment (ATE) on a network (securing access to equipment and data)","authors":"J. R. McCarty","doi":"10.1109/AUTEST.2000.885630","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885630","url":null,"abstract":"Integrating ATE into a network allows faster software upgrades to operating systems and Test Program Sets (TPS) for ATE systems. Upgrades to operating systems can be made to several ATE stations at one time from one computer TPS can be stored onto a sewer that can be shared by all the ATE stations. This allows upgrades to TPS at one location and not across ad of the ATE stations. Test data, calibration data, and other files on ATE stations can be monitored for troubleshooting of the system. Having ATE stations on a network, however, could pose some security risks if security is not addressed during the integration design process. The designer must have intimate knowledge of the network architecture and network security products to secure access to the equipment and protect the information flow to and from the ATE. The OSI model can assist the designer in understanding the network architecture and understanding at which level of the architecture the different security products can be applied to meet the security goals. At the network architectural level the ATE integrator becomes familiar with routers, switches, hubs, and methods of controlling traffic on a network. At the secured level the ATE integrator addresses which level of the OSI model to secure. Security can be applied at the top of the model at the application layer with products like Public Key Infrastructure (PKI), at the middle of the model at the session layer with products like firewalls, or at the bottom of the model at the physical layer with cryptographic devices. The last item that the designer needs to include during the integration of ATE onto a network is the network administrators.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134133033","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Simulation-based techniques for calculating fault resolution and false removal statistics 用于计算故障解决和错误清除统计的基于仿真的技术

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885627

E. Gould, D. Hartop

引用次数: 1

Video data acquisition and analysis system (DSA 3000) 视频数据采集与分析系统(dsa3000)

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885654

S. Pelusi

{"title":"Video data acquisition and analysis system (DSA 3000)","authors":"S. Pelusi","doi":"10.1109/AUTEST.2000.885654","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885654","url":null,"abstract":"Today's weapon systems require sophisticated algorithms to capture end analyze target and scene video. Many of the same algorithms are commonly used throughout video-based munitions and technologies. Consequently, Raytheon Missile Systems has developed a standard tool to support the design and validation of systems using video imagery. The DAS 3000 provides an integrated test environment for imaging missile systems, machine vision systems, and surveillance systems. The DAS 3000 is a video capture, sensor/seeker characterization, and analysis tool, which provides a total test solution capable of supporting a product throughout its life cycle. In today's market, a low cost standard tool, which incorporates test requirements for video, capture and display, real-time processing analysis, and video reduction across multiple product lines is extremely valuable. This paper initially discusses and elaborates on the video capture, display, and real-time requirements challenging our engineers to date. The paper then discusses the internal modularity of the software to provide technology specific algorithms. The interface of the tool is discussed to demonstrate the video reduction and editing that may be applied to frames and sequences of video to enhance and simplify the test environment of video based products. Finally, various engineering environments the DAS 3000 is capable or supporting are discussed. These areas include standalone-engineering analysis typically used for research and development, design validation, operational testing, integration and test, and automated production test equipment.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121749880","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

A VXI-based automatic test solution for avionics: issues and implementation 基于vxi的航空电子设备自动测试解决方案:问题与实现

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885642

Jian Hou, Weiguo Feng

引用次数: 3

Proposal to TPS delivery in 4 months? 建议在4个月内交付TPS ?

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885590

R. Taylor

引用次数: 0

Boundary-scan bursts into the modern production facility 边界扫描进入了现代化的生产设施

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885588

R. Dellecker

{"title":"Boundary-scan bursts into the modern production facility","authors":"R. Dellecker","doi":"10.1109/AUTEST.2000.885588","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885588","url":null,"abstract":"The IEEE 1149.1 boundary-scan standard was adopted ten years ago to solve anticipated problems in printed circuit board testing as board densities and complexities continued to escalate. We can see today that the foresight of the original JTAG committee was excellent. For the first several years after adoption of the standard, relatively few users had implemented boundary-scan solutions in their production lines. Now, however, for a number of reasons, interest in boundary-scan has rapidly intensified: IC manufacturers have accepted boundary-scan as a feature that must be included in new ICs; advances in board and IC packaging technologies have accelerated, making new test strategies imperative; standard tools for engineering and production are now available to support boundary scan, dramatically reducing test development effort, capital investments, along with a corresponding reduction in time to market. As a result, virtually every manufacturer of modern electronic boards has either adopted boundary-scan or faces difficult problems in manufacturing that could be resolved through boundary-scan. This paper examines recent developments in boundary-scan technology as it relates to the development and production environments. Advanced tools, packaged to meet the needs of these environments, have brought boundary-scan into its prime. A detailed description of lifecycle implementation of boundary-scan is provided covering R&D, the factory, and service.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132020967","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

The use of field programmable gate arrays for reusable interfaces 使用现场可编程门阵列的可重用接口

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885646

N. Stong

引用次数: 1

Prognostics Framework-UPDATE II 预后框架-更新

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885631

L. Su, M. Nolan, G. deMare, B. Norman

引用次数: 3