Boundary-scan bursts into the modern production facility

R. Dellecker
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引用次数: 7

Abstract

The IEEE 1149.1 boundary-scan standard was adopted ten years ago to solve anticipated problems in printed circuit board testing as board densities and complexities continued to escalate. We can see today that the foresight of the original JTAG committee was excellent. For the first several years after adoption of the standard, relatively few users had implemented boundary-scan solutions in their production lines. Now, however, for a number of reasons, interest in boundary-scan has rapidly intensified: IC manufacturers have accepted boundary-scan as a feature that must be included in new ICs; advances in board and IC packaging technologies have accelerated, making new test strategies imperative; standard tools for engineering and production are now available to support boundary scan, dramatically reducing test development effort, capital investments, along with a corresponding reduction in time to market. As a result, virtually every manufacturer of modern electronic boards has either adopted boundary-scan or faces difficult problems in manufacturing that could be resolved through boundary-scan. This paper examines recent developments in boundary-scan technology as it relates to the development and production environments. Advanced tools, packaged to meet the needs of these environments, have brought boundary-scan into its prime. A detailed description of lifecycle implementation of boundary-scan is provided covering R&D, the factory, and service.
边界扫描进入了现代化的生产设施
十年前,IEEE 1149.1边界扫描标准被采用,以解决印刷电路板测试中随着电路板密度和复杂性不断升级而出现的预期问题。我们今天可以看到,最初的JTAG委员会的远见卓识是非常出色的。在采用该标准后的最初几年中,在其生产线中实现边界扫描解决方案的用户相对较少。然而,现在,由于许多原因,对边界扫描的兴趣迅速增强:IC制造商已经接受边界扫描作为必须包含在新IC中的功能;电路板和集成电路封装技术的进步已经加速,使得新的测试策略势在必行;用于工程和生产的标准工具现在可用于支持边界扫描,大大减少了测试开发工作,资本投资,以及相应的上市时间缩短。因此,几乎每个现代电路板制造商要么采用边界扫描,要么面临可以通过边界扫描解决的制造难题。本文研究了边界扫描技术的最新发展,因为它与开发和生产环境有关。为满足这些环境的需要而打包的高级工具使边界扫描进入了鼎盛时期。详细描述了边界扫描的生命周期实现,包括研发、工厂和服务。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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