2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)最新文献_第9页

The problem with aviation COTS 航空COTS的问题

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885634

L. D. Alford

引用次数: 27

Guided weapons test station upgrade-a cooperative effort with Taiwan 与台湾合作升级制导武器试验站

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885574

S. Stanfield

{"title":"Guided weapons test station upgrade-a cooperative effort with Taiwan","authors":"S. Stanfield","doi":"10.1109/AUTEST.2000.885574","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885574","url":null,"abstract":"The Naval Air Warfare Center-Weapons Division (NAWC-WD) in cooperation with the Taiwan Chang Shun Institute of Science and Technology (CSIST) has undertaken a product improvement project to upgrade the first generation common munitions tester, the Guided Weapons Test Station (GWTS). The GWTS is mostly commercial-off-the-shelf (COTS) equipment. As such it is subject to component obsolescence. The P/sup 3/I project replaces obsolete COTS, including the system controller with more supportable items. The project goes Further by replacing Compaq/DEC Alpha UNIX with Windows NT12000. This shift requires an en masse re-host of the GWTS software suits Re-host is a challenging process, not without risk, but will more closely align the GWTS design with industry standards. Resources expended now will be more than offset by future savings. The GWTS project is not being conducted in a vacuum. Navy project leaders ensure that CSIST management is continually aware of technical and schedule status, and CSIST engineers will join the team. Raytheon, who is exploring options for new common munitions ATE, monitors upgrade progress, and they have Invited NAWC-WD participation in trade studies for a future Standard Missile test station. The GWTS upgrade team and Raytheon have mutually benefited from this cooperation.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127366925","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Writing test modules using standard interfaces and languages 使用标准接口和语言编写测试模块

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885611

Jeff Laney

引用次数: 0

Implementing AI-ESTATE in a component based architecture, Phase-II 在基于组件的体系结构中实现AI-ESTATE，第二阶段

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 1999-08-30 DOI: 10.1109/AUTEST.2000.885625

A. Giarla, W.L. Simerly

{"title":"Implementing AI-ESTATE in a component based architecture, Phase-II","authors":"A. Giarla, W.L. Simerly","doi":"10.1109/AUTEST.2000.885625","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885625","url":null,"abstract":"This paper discusses Phase-II of an Air Force funded SBIR R&D project concerned with implementing the IEEE 1232 Standard known as AI-ESTATE in a component based Automatic Test System (ATS). The intent of our Phase-II work is to provide the Air Force with a \"working tool\" that demonstrates the utility of our architectural approach as well as the utility of AI-ESTATE. The intent of our component based approach to ATS design is to provide a de-coupling of the diagnostic reasoner from the rest of the ATS as well as provide for a true open system at a reduced procurement and maintenance costs. AI-ESTATE is used to provide a standardized interface between the reasoner and the other ATS elements as well as provide standardized information and data model formats. The architecture consists of a COTS Test System (VXI package with LabVIEW), four \"domain\" type components: Diagnostic Engine Component (DEC), Application Executive Component (AEC), Test System Component (TSC) and Model Editing Component (MEC) that plug into our \"Interoperable, Connectivity Enabling Framework\" (ICEF) based on COM/DCOM. The four components and framework are discussed in general terms. The DEC implements AI-ESTATE and is further discussed in derail as are the other components. Also discussed are operational uses, diagnostic development, vendor competition and benefits.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"189 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133068929","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 8

VXI synchro/resolver and phase-angle voltmeter COTS resources for F-15 AADTS program ATE 用于F-15 AADTS程序的VXI同步/解析器和相角电压表COTS资源

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.2000.885639

M.W. Johnson

{"title":"VXI synchro/resolver and phase-angle voltmeter COTS resources for F-15 AADTS program ATE","authors":"M.W. Johnson","doi":"10.1109/AUTEST.2000.885639","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885639","url":null,"abstract":"This paper describes the Technology Inc (MTI) F-15 AADTS (Analog Avionic Depot Test Station) system and the two NAI, Inc VXI Commercial-Off-The-Shelf (COTS) resource cards it uses: the synchro/resolver simulation and measurement card and the phase-angle voltmeter card. The MTI AADTS ATE system incorporates an open architecture VXIbus-based and GPIB-based design for test and maintenance of F-15 analog circuit cards. It's an upgrade and refurbishment of an older system, designed to allow old test programs and old test adapters to run on it. All of the instruments in the tester are Commercial-Off-The-Shelf (COTS) units, including the NAI Model 5388 synchro/resolver resource and Model 227 phase-angle voltmeter. NAI's model 5388 is a C size VXI COTS Synchro-Resolver Simulation and Angle Position Measurement card. Interfacing to rugged reliable synchros, the 5388 functionality is based upon highly accurate synchro-to-digital conversion and digital-to-synchro simulation. NAI's model 227 is a wideband message-based phase-angle voltmeter, utilizing the latest DSP technology to provide high performance phase-sensitive, frequency selective voltage measurements. The phase-sensitive measurements of in-phase and quadrature voltage, as well as phase angle, can be made at any frequency from 10 Hz to 100 kHz.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128211953","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Using databases to streamline Test Program Set development 使用数据库来简化测试程序集的开发

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.2000.885629

G. Shoopman

引用次数: 0

Bridging the gap [between low-cost general purpose electronic test equipment and high cost ATE] 缩小[低成本通用电子测试设备与高成本ATE之间的差距]

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.2000.885648

T. Webb

引用次数: 0

Modeling analog chips as if they are digital 模拟模拟芯片，如果他们是数字化的

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.2000.885591

M. Can

引用次数: 0