2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)最新文献_第8页

Iconic test programming a tool for test program interoperability 标志测试编程是测试程序互操作性的工具

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885589

Patrice Demazoin, J. Barbier

引用次数: 1

STE and calibration.....the IPT approach STE和校准.....IPT方法

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885584

B. Willoughby

{"title":"STE and calibration.....the IPT approach","authors":"B. Willoughby","doi":"10.1109/AUTEST.2000.885584","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885584","url":null,"abstract":"Times have changed: the threat today is not what it was 10 or even 5 years ago. Today the Navy has the same number of surface combatants as it did in the 1930's. Defense spending is down worldwide; yet the U.S. still represents 33% of worldwide defense spending, in contrast to Russia's now 7% representation. This has driven us to greatly extended life cycles for our systems and drives us to greatly reduce development times. There are many traps to schedule reduction; one of them is in the area of special test equipment (STE). Today we no longer buy black boxes or standalone weapons, but rather we buy integrated weapons system. This provides a great challenge to the STE community and hence the metrology community as well. The interactions between subsystems (and hence test equipment as well) produce conditions of tolerance stack up which can produce out of spec test results from subassemblies that are within spec. This paper discusses some of the problems we have seen with regard to STE and potential calibration problems. We will then discuss a potential model and solution to reduce these problems.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121925285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Hardware emulation and test at the flightline 硬件仿真与试飞

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885580

L. Orlidge

{"title":"Hardware emulation and test at the flightline","authors":"L. Orlidge","doi":"10.1109/AUTEST.2000.885580","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885580","url":null,"abstract":"Confirming mission readiness is the most critical function flightline testers perform. Ideally, pre-night mission readiness assessments would exercise and verify every critical function of the weapon system that could be called upon in battle. No existing flightline test system can provide this level of readiness assessment. So what is wrong with today's testers? First, it is not practical to perform operational end-to-end testing of major subsystems with conventional testers. Second, many testers cannot readily make use of failure data that is available from on-board vehicle health monitoring systems or current testers use hardware intensive architectures-architectures that drive performance versus size, weight, and total ownership cost tradeoffs. How can we change this? Integrating portable maintenance aids (PMAs) and maintenance information systems into the test repertoire can help significantly; however, these solutions do little to augment the information available for system test and diagnosis. Adding conventional test instrumentation under PMA control would provide the additional information we seek, but as cited above, hardware intensive solutions is one of the problems with today's flightline testers. Emulating test instrumentation using virtual instruments (VI) specifically addresses the problems and limitations associated with hardware intensive test systems. This paper will describe the VI concept and Honeywell's two embodiments of VI, and will discuss VI's applicability to flightline test and the next generation automatic test systems.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"80 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122029785","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

MIL-STD-1553 using a universal serial bus and a notebook PC MIL-STD-1553采用通用串行总线和笔记本电脑连接

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885653

Paul Harames, N. Stong

引用次数: 1

The role of a signal interface in supporting instrument interchangeability 信号接口在支持仪器互换性中的作用

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885621

N. Ramachandran, R. Oblad, I. Neag, D. Tyler

引用次数: 15

Combining the "information" and "measurement" worlds to improve system performance and operational readiness 结合“信息”和“度量”世界来改进系统性能和操作准备

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885633

F. Cruger, B. Zarlingo, J. Regazzi

引用次数: 2

A signal server software architecture 一个信号服务器软件体系结构

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885612

S. Jones

引用次数: 0

Test software design techniques for reuse and portability 测试软件设计技术的重用性和可移植性

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885610

B. DeAbren

引用次数: 1

Nanotechnology-based molecular test equipment (MTE) for circuit board test 基于纳米技术的电路板分子测试设备(MTE)

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885579

R. G. Wright, M. Zgol, L. Kirkland

{"title":"Nanotechnology-based molecular test equipment (MTE) for circuit board test","authors":"R. G. Wright, M. Zgol, L. Kirkland","doi":"10.1109/AUTEST.2000.885579","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885579","url":null,"abstract":"This paper describes original research efforts in the design, simulation, and development of nanotechnology-based molecular test equipment (MTE). This is a research effort for testing printed circuit boards independent of traditional automatic test equipment (ATE) through the fabrication of MTE within integrated circuits (ICs). The MTE is embedded within the IC substrate and encapsulated within nanoprobes that connect between the surface and the substrate of the IC at various functional areas. A process is followed whereby IC device simulation is performed to assess the electrical, chemical, and structural properties of integrated and adjacent substrate devices. Through this approach the nominal and failed device performance parameters of interest to substrate-based MTE are found. Discussion of the development and application of MTE within IC architectures is provided, including such topics as the effect of substrate composition on the design and realization of MTE, interfaces between MTE and IC devices, and reporting of MTE results to the IC surface and technician. Potential application areas within different device functions will also be identified. A chemical structure diagram is also provided to illustrate the implementation of MTE using discrete device configurations with MTE-augmented logic.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"145 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123484877","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Automating legacy off-load efforts 自动化遗留的卸载工作

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885596

S. Wegener

引用次数: 0