{"title":"Using databases to streamline Test Program Set development","authors":"G. Shoopman","doi":"10.1109/AUTEST.2000.885629","DOIUrl":null,"url":null,"abstract":"Databases can be used to improve efficiency and accuracy during Test Program Set (TPS) development. Key elements of the development process such as requirements analysis, establishing a fault universe, failure modes, standardization, Operational Test Program Set (OTPS) groupings, fault detection and isolation requirements, hardware design, and TPS performance, can easily be controlled and monitored using a Rapid Application Development (RAD) environment. This paper describes the guidelines, using RAD, to establish and design a group of Units Under Test (UUTs) resulting in improvements in quality, efficiency, and accuracy that are incorporated into each TPS.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"48 5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2000.885629","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Databases can be used to improve efficiency and accuracy during Test Program Set (TPS) development. Key elements of the development process such as requirements analysis, establishing a fault universe, failure modes, standardization, Operational Test Program Set (OTPS) groupings, fault detection and isolation requirements, hardware design, and TPS performance, can easily be controlled and monitored using a Rapid Application Development (RAD) environment. This paper describes the guidelines, using RAD, to establish and design a group of Units Under Test (UUTs) resulting in improvements in quality, efficiency, and accuracy that are incorporated into each TPS.