{"title":"缩小[低成本通用电子测试设备与高成本ATE之间的差距]","authors":"T. Webb","doi":"10.1109/AUTEST.2000.885648","DOIUrl":null,"url":null,"abstract":"This paper takes a look at some of the more common methods being used for circuit card test and repair. Examining the high and low end techniques, prepares the way to explore mid-range capabilities that can augment both. For the most part circuit card repair is carried out using low cost General Purpose Electronic Test Equipment (GPETE) or high cost Automatic Test Equipment (ATE) utilizing Test Program Sets (TPS). Whereas both methods have their advantages they leave a gap between the technologies used and the practical aspect. This paper, highlights an alternative method being adopted by various branches of the US government to increase the repair capabilities within the military.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"98 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Bridging the gap [between low-cost general purpose electronic test equipment and high cost ATE]\",\"authors\":\"T. Webb\",\"doi\":\"10.1109/AUTEST.2000.885648\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper takes a look at some of the more common methods being used for circuit card test and repair. Examining the high and low end techniques, prepares the way to explore mid-range capabilities that can augment both. For the most part circuit card repair is carried out using low cost General Purpose Electronic Test Equipment (GPETE) or high cost Automatic Test Equipment (ATE) utilizing Test Program Sets (TPS). Whereas both methods have their advantages they leave a gap between the technologies used and the practical aspect. This paper, highlights an alternative method being adopted by various branches of the US government to increase the repair capabilities within the military.\",\"PeriodicalId\":334061,\"journal\":{\"name\":\"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)\",\"volume\":\"98 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2000.885648\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2000.885648","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Bridging the gap [between low-cost general purpose electronic test equipment and high cost ATE]
This paper takes a look at some of the more common methods being used for circuit card test and repair. Examining the high and low end techniques, prepares the way to explore mid-range capabilities that can augment both. For the most part circuit card repair is carried out using low cost General Purpose Electronic Test Equipment (GPETE) or high cost Automatic Test Equipment (ATE) utilizing Test Program Sets (TPS). Whereas both methods have their advantages they leave a gap between the technologies used and the practical aspect. This paper, highlights an alternative method being adopted by various branches of the US government to increase the repair capabilities within the military.