{"title":"基于vxi的航空电子设备自动测试解决方案:问题与实现","authors":"Jian Hou, Weiguo Feng","doi":"10.1109/AUTEST.2000.885642","DOIUrl":null,"url":null,"abstract":"This paper discusses the considerations to design a general-purpose automatic test system. A general-purpose ATE-which is developed to replace some 30 existing non-automatic tester- is described. The architecture and implementation of hardware and software are all described. Instrument independence and interchangeability are gained in some degree.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A VXI-based automatic test solution for avionics: issues and implementation\",\"authors\":\"Jian Hou, Weiguo Feng\",\"doi\":\"10.1109/AUTEST.2000.885642\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses the considerations to design a general-purpose automatic test system. A general-purpose ATE-which is developed to replace some 30 existing non-automatic tester- is described. The architecture and implementation of hardware and software are all described. Instrument independence and interchangeability are gained in some degree.\",\"PeriodicalId\":334061,\"journal\":{\"name\":\"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2000.885642\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2000.885642","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A VXI-based automatic test solution for avionics: issues and implementation
This paper discusses the considerations to design a general-purpose automatic test system. A general-purpose ATE-which is developed to replace some 30 existing non-automatic tester- is described. The architecture and implementation of hardware and software are all described. Instrument independence and interchangeability are gained in some degree.