2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)最新文献_第5页

The state of interchangeability in ATE ATE中互换性的状态

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885622

K. Fertitta, D. Eriksson

{"title":"The state of interchangeability in ATE","authors":"K. Fertitta, D. Eriksson","doi":"10.1109/AUTEST.2000.885622","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885622","url":null,"abstract":"The Interchangeable Virtual Instrument (IVI) Foundation formed in August of 1998 to address the challenge of instrument interchangeability in the test and measurement industry. Since its inception, the NI Foundation has engaged in vigorous standardization activities along several different though coherent, axes. Instrument class specifications are continuously under development for some of the most pervasive types of instruments. Architectural standards establishing IVI conformance criteria will broaden the capability of vendors, end-users, and system integrators to innovate while simultaneously allowing them to integrate into a heterogeneous IVI-based system. IVI Measurement Stimulus Subsystems (NI-MSS) standards under development offer the promise of a higher level of interchangeability than instrument-centric standards can offer. Shared NI infrastructure components will ensure interoperability in IVI systems by providing a common model for services such as configuration, installation, resource sharing, event notification and management and component instantiation. In addition, the Foundation has embraced COM technology as a powerful means for delivering interchangeable ATE software services.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"363 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123560707","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Case study: modular ATE system design 案例研究:模块化ATE系统设计

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885644

T. Elmore

引用次数: 1

Architecting production test systems 构建生产测试系统

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885643

C. Nair

引用次数: 0

Common test-platform family for module, board, and sub-assembly level test 通用测试平台系列，用于模块，电路板和子组件级测试

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885573

M. Breen

{"title":"Common test-platform family for module, board, and sub-assembly level test","authors":"M. Breen","doi":"10.1109/AUTEST.2000.885573","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885573","url":null,"abstract":"As defense industry procurement budgets continue to decrease and contractor consolidation increases, the demand for cost effective and timely product testing and efficient test facility utilization increases. To reduce the product test cost and cycle-time and test-facility space requirements, the Raytheon Missile Systems Test-Systems-Design-Center (TSDC) developed and implemented the Standard Test Equipment Platform (STEP) family. The STEP family consists of the Analog STEP (ANSTEP), Analog/Digital STEP (ADSTEP), Radio Frequency (RF) STEP (RFSTEP), and Infra-red (IR) STEP (IRSTEP). The family is capable of testing electronic modules, boards, and sub-assemblies in the analog and low-level digital; digital simulation generation; intermediate frequency, RF, and microwave; and IR regimes. This paper presents: 1. The STEP approach to reducing product-test cost, cycle-time, and facility requirements, 2. The history and development of the STEP family, 3. A technical overview of each member of the STEP family, and 4. The implementation of the STEP family as if relates to reducing product-test, cost cycle-time, and facility requirements while meeting difficult test requirements; influencing standardized test requirements; providing extensive test-level capability; providing a wide stimulus, switching, and measurement capability; establishing an easily integrated common technical data package; and ensuring a clear expansion/evolution path.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127107963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

The Raytheon missile systems test systems development process 雷神导弹系统测试系统开发过程

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885583

R. Lytle, S.B. Spires

引用次数: 1

Useful features of automated test systems in the R&D laboratory 研发实验室自动化测试系统的有用功能

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885647

J. Czapski

引用次数: 3

TPS rehosting at the station interface TPS在站点界面重新托管

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885599

C. Stoldt

引用次数: 0

A vision of guided weapons ATS standardization-a synergistic, cooperative approach 制导武器ATS标准化的设想——一种协同、合作的方法

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885572

C. Davis, M. Ellis

引用次数: 1

Keeping the tiger in the army's tanks an approach to commercialize military maintenance 把老虎放在军队的坦克里是一种使军事维修商业化的方法

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885651

W. Downing

引用次数: 0

Distributed and concurrent test environments on popular COTS platforms 流行的COTS平台上的分布式和并发测试环境

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI: 10.1109/AUTEST.2000.885638

R. Toal, R. Hayes

引用次数: 3