2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)最新文献

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DTULive: functional digital programming environment DTULive:功能数字编程环境
F. Meunier, G. Puzio
{"title":"DTULive: functional digital programming environment","authors":"F. Meunier, G. Puzio","doi":"10.1109/AUTEST.2000.885587","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885587","url":null,"abstract":"As the cost and complexity of digital test programs have been increasing exponentially with the level of integration, new, move effective methods of developing test programs must be used to develop effective tests. This paper presents an overview of a new product, DTULive, that provides a functional, non-simulation, test programming environment for complex circuit cards.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115646255","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Integration of commercial-off-the-shelf (COTS) video stimulus instrument with fielded automated test system (ATS) 商用现货(COTS)视频刺激仪与现场自动测试系统(ATS)的集成
M. A. Mott, F. Khan
{"title":"Integration of commercial-off-the-shelf (COTS) video stimulus instrument with fielded automated test system (ATS)","authors":"M. A. Mott, F. Khan","doi":"10.1109/AUTEST.2000.885637","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885637","url":null,"abstract":"This paper describes the incorporation of a Commercial-Off-The-Shelf (COTS) video stimulus instrument in the Navy's Consolidated Automated Support System (CASS) ATS. Included are COTS instrument selection, CASS software modifications, CASS modifications, and product enhancements, which evolved out of the effort. The video stimulus requirement of the U.S Navy's Consolidated Automated Support System (CASS) was fulfilled via the integration of a commercial instrument into the CASS. The effort involved product research, selection, and testing; mechanical and electrical design and testing; software engineering; integration; and fielding. The major component (a commercial video stimulus instrument) was selected. CASS software was modified to support an ATLAS interface to the instrument. The CASS ATS was modified to accommodate the instrument; this modification required mechanical design testing. The video signal path (instrument to CASS interface) was developed; and the product was enhanced to provide rudimentary animation capabilities in support of infrared tracking systems. The focus of the paper is product selection and requirements matching; software development and integration with the existing product; system testing and calibration; retrofitting of fielded systems. A brief section focuses on enhancements (beyond the original scope) that evolved from capabilities of the COTS instrument.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115659677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Testing multiple laser systems on the Chameleon EO system: a single target approach 在变色龙EO系统上测试多个激光系统:单目标方法
F. Kearns
{"title":"Testing multiple laser systems on the Chameleon EO system: a single target approach","authors":"F. Kearns","doi":"10.1109/AUTEST.2000.885567","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885567","url":null,"abstract":"Over the last few decades, laser weapon systems have evolved rapidly. This evolution has resulted in a proliferation of many different laser system types. In the past, nearly all weapons systems contained primarily Ng:Yag lasers. Today, a wide range of lasers including eyesafe lasers and long wavelength CO/sub 2/ lasers are commonplace. When these lasers are integrated into weapon systems they take on many different forms. During the same time, Strong DoD initiatives for standardized test equipment have emerged with the goal of testing a wide variety of systems on a single set of common test equipment. This paper describes the basic performance parameters and system design approaches of laser weapon systems, the challenges they present to test equipment standardization, and the proposed solutions provided by use of the Chameleon Target.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123573909","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A performance tracking methodology and decision support model 性能跟踪方法和决策支持模型
W. A. Hansen, K. Fitzgibbon, N. Flann, L. Kirkland
{"title":"A performance tracking methodology and decision support model","authors":"W. A. Hansen, K. Fitzgibbon, N. Flann, L. Kirkland","doi":"10.1109/AUTEST.2000.885601","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885601","url":null,"abstract":"This paper presents a methodology to detect performance degradation with a certain degree of confidence, and a decision support model to help engineers and technicians to solve ongoing diagnostic and repair problems. The method is capable of detecting changes in performance trends when data captured at different times or ages during the system's active life, is compared to estimated performance limits. This paper applies the method to the specific case of aircraft avionic systems and their associated support equipment. The methodology is currently being developed and applied to existing aircraft avionic equipment and maintenance processes. The methodology explores the ability of statistical control process (SPC) applications and expert systems (ES) based technologies to develop trend analyses data and provide performance degradation information to maintenance engineers, technicians, and managers. The paper addresses specific data capture and component identification problems encountered in actual test data, anal discusses automated solutions for these problems. A complete architecture is presented displaying the data capture process, data storage, statistical and expert system processing, and output information display. The solution includes the specific technology used to implement the process and output information samples based on actual test data.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124938715","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A flexible automatic test system for turbine machinery 一种灵活的涡轮机械自动测试系统
L.F. Wang, K. Tan, H.X. Wu
{"title":"A flexible automatic test system for turbine machinery","authors":"L.F. Wang, K. Tan, H.X. Wu","doi":"10.1109/AUTEST.2000.885607","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885607","url":null,"abstract":"The objective of this paper is to discuss the general development of a Flexible Automatic Test System For Turbine Machinery (FATSFTM). In order to meet the test needs of a large and diverse community of turbine machinery, the automatic test system should have a contemporary windows interface, have graphical interaction and be easily configured to include the functions required by current and emerging test demands. The design and implementation of such a test system is approached from an object-oriented software engineering point-of-view for ease of extension, expansion and maintenance. Practical application has proved the validity and effect of the implemented automatic test system in helping turbine developers improve the performance of turbine machinery.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126569697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A method for testing partially programmable logic arrays in CPLDs 一种测试cpld中部分可编程逻辑阵列的方法
J. Bailey, C. Stroud, N. J. Vocke, N. Lau, W. R. Orso, C. Tran
{"title":"A method for testing partially programmable logic arrays in CPLDs","authors":"J. Bailey, C. Stroud, N. J. Vocke, N. Lau, W. R. Orso, C. Tran","doi":"10.1109/AUTEST.2000.885586","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885586","url":null,"abstract":"We describe a method for developing a minimal set of four test configurations with associated minimum sets of test patterns that completely tests reprogrammable Programmable Logic Arrays (PLAs) with partially programmable OR-planes typically found in Complex Programmable Logic Devices (CPLDs). The resultant set of test configurations and vectors detect all single and multiple stuck-at faults (including line and transistor faults) as well as all bridging faults without requiring hardware modifications in the PLA. Previous methods for testing reprogrammable PLAs have dealt only with fully programmable OR-planes.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126754638","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Test engineering education: a guide to a successful curriculum 测试工程教育:成功课程指南
L. Ungar
{"title":"Test engineering education: a guide to a successful curriculum","authors":"L. Ungar","doi":"10.1109/AUTEST.2000.885603","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885603","url":null,"abstract":"An extensive curriculum in test engineering was presented to approximately 20 beginning and intermediate engineers with Bachelors and Masters degrees in Electrical and Electronics Engineering. Over a period of 33 weeks these engineers were taught the rigors of test engineering, including such subjects as Test Program Set (TPS) Development, ATLAS, Building an ATE, Instrumentation and ATE Architecture, the VXIbus, Software Test, Quality Assurance, Design for Testability, Built-In Self Test, Integrated Diagnostics and Artificial Intelligence in Test, Electromagnetic Compatibility (EMC), and nonmental Testing. Graduates immediately began to develop TPSs for F-16 Avionics circuit card assemblies. This work involved re-hosting many of the TPSs. The performance of these graduates at their job is used as one of the evaluating factor for the success of the curriculum. Comments from instructors are also included. Finally a cost benefit analysis is given to evaluate the cost-effectiveness of TPS training.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117220092","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Using IVI drivers to increase test system performance 使用IVI驱动程序提高测试系统性能
D. Cheij
{"title":"Using IVI drivers to increase test system performance","authors":"D. Cheij","doi":"10.1109/AUTEST.2000.885616","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885616","url":null,"abstract":"Instrument driver technology has evolved tremendously during 1990s. Initiatives such as SCPI and VXIplug&play have simplified remote instrument programming with standardized command messages and high-level utility functions. The latest such initiative is the Interchangeable Virtual Instrument (IVI) Foundation. IVI defines standards for instrument drivers that offer many benefits to provide higher performance. These benefits include instrument interchangeability, instrument simulation, and instrument state caching. Because instrument drivers are an integral part of a modern test system, IVI promises to provide developers with the tools to increase their system performance significantly. This paper reviews the technical aspects of the IVI specification and the IVI architecture and describes how IVI can help the test system developer improve performance and lower long-term software maintenance costs.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127721715","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Test program set rehosting 测试程序设置重新托管
U.Z. Sanal
{"title":"Test program set rehosting","authors":"U.Z. Sanal","doi":"10.1109/AUTEST.2000.885597","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885597","url":null,"abstract":"In this study the advantages and disadvantages of rehosting will be presented based on a real world project the critical points of a project, mainly depending on rehosting of large number of test program sets (TPS) on various automated test equipments (ATE) are covered. To name few of the topics to be presented in this study, quality of unit under test (UUT) data; quality of the former TPS to be rehosted; technology of the TPS (digital, analog, hybrid, etc.); ATEs; Software (SW) development environment, SW tools and translators; interface test adapters (ITA); contractual requirements; mating connectors, test connectors and fixtures; evaluation of a TPS to be rehosted. This study covers all the processes ranging from the inspection of the available data to the estimation of the rehosting duration and cost.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131575517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Generating custom, real-world waveforms integrating test equipment into the design process 将测试设备集成到设计过程中,生成定制的真实波形
J. Kikuchi, G. Jue
{"title":"Generating custom, real-world waveforms integrating test equipment into the design process","authors":"J. Kikuchi, G. Jue","doi":"10.1109/AUTEST.2000.885614","DOIUrl":"https://doi.org/10.1109/AUTEST.2000.885614","url":null,"abstract":"This paper demonstrates how design software and test instrumentation can be used together to create and analyze newly developed 3G signal formats for system design. An example of the creation of a real-world cdma2000 signal will be demonstrated. Wireless manufacturers are designing to standards while the standards are evolving with intense pressures to be first to market. This highlights the need for system, DSP, and RF designers to work within the same simulation tool to ensure success when the different design domains are brought together.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131175559","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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