{"title":"DTULive: functional digital programming environment","authors":"F. Meunier, G. Puzio","doi":"10.1109/AUTEST.2000.885587","DOIUrl":null,"url":null,"abstract":"As the cost and complexity of digital test programs have been increasing exponentially with the level of integration, new, move effective methods of developing test programs must be used to develop effective tests. This paper presents an overview of a new product, DTULive, that provides a functional, non-simulation, test programming environment for complex circuit cards.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2000.885587","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
As the cost and complexity of digital test programs have been increasing exponentially with the level of integration, new, move effective methods of developing test programs must be used to develop effective tests. This paper presents an overview of a new product, DTULive, that provides a functional, non-simulation, test programming environment for complex circuit cards.