DTULive:功能数字编程环境

2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057) Pub Date : 2000-09-18 DOI:10.1109/AUTEST.2000.885587

F. Meunier, G. Puzio

{"title":"DTULive:功能数字编程环境","authors":"F. Meunier, G. Puzio","doi":"10.1109/AUTEST.2000.885587","DOIUrl":null,"url":null,"abstract":"As the cost and complexity of digital test programs have been increasing exponentially with the level of integration, new, move effective methods of developing test programs must be used to develop effective tests. This paper presents an overview of a new product, DTULive, that provides a functional, non-simulation, test programming environment for complex circuit cards.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"DTULive: functional digital programming environment\",\"authors\":\"F. Meunier, G. Puzio\",\"doi\":\"10.1109/AUTEST.2000.885587\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As the cost and complexity of digital test programs have been increasing exponentially with the level of integration, new, move effective methods of developing test programs must be used to develop effective tests. This paper presents an overview of a new product, DTULive, that provides a functional, non-simulation, test programming environment for complex circuit cards.\",\"PeriodicalId\":334061,\"journal\":{\"name\":\"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2000.885587\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2000.885587","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

随着数字化测试程序的成本和复杂性随着集成化程度呈指数级增长，必须采用新的、更有效的测试程序开发方法来开发有效的测试。本文概述了一个新产品，DTULive，它为复杂的电路卡提供了一个功能，非模拟，测试编程环境。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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DTULive: functional digital programming environment

As the cost and complexity of digital test programs have been increasing exponentially with the level of integration, new, move effective methods of developing test programs must be used to develop effective tests. This paper presents an overview of a new product, DTULive, that provides a functional, non-simulation, test programming environment for complex circuit cards.

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2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)

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