{"title":"用于计算故障解决和错误清除统计的基于仿真的技术","authors":"E. Gould, D. Hartop","doi":"10.1109/AUTEST.2000.885627","DOIUrl":null,"url":null,"abstract":"This paper discusses the use of diagnostic simulations to generate the Fault Resolution metric for a system or equipment. Simulation-based calculations are free of some of the biases that inhere within traditional, math-based approaches. Moreover, a simulation-based evaluation of the replacement of failed items also provides a basis for the calculation of the effect of diagnostic ambiguity upon false removals-including the estimated costs that can be attributed to removals beyond those that would be expected during a product's intended lifetime.","PeriodicalId":334061,"journal":{"name":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","volume":"132 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Simulation-based techniques for calculating fault resolution and false removal statistics\",\"authors\":\"E. Gould, D. Hartop\",\"doi\":\"10.1109/AUTEST.2000.885627\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses the use of diagnostic simulations to generate the Fault Resolution metric for a system or equipment. Simulation-based calculations are free of some of the biases that inhere within traditional, math-based approaches. Moreover, a simulation-based evaluation of the replacement of failed items also provides a basis for the calculation of the effect of diagnostic ambiguity upon false removals-including the estimated costs that can be attributed to removals beyond those that would be expected during a product's intended lifetime.\",\"PeriodicalId\":334061,\"journal\":{\"name\":\"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)\",\"volume\":\"132 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2000.885627\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Future Sustainment for Military Aerospace (Cat. No.00CH37057)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2000.885627","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Simulation-based techniques for calculating fault resolution and false removal statistics
This paper discusses the use of diagnostic simulations to generate the Fault Resolution metric for a system or equipment. Simulation-based calculations are free of some of the biases that inhere within traditional, math-based approaches. Moreover, a simulation-based evaluation of the replacement of failed items also provides a basis for the calculation of the effect of diagnostic ambiguity upon false removals-including the estimated costs that can be attributed to removals beyond those that would be expected during a product's intended lifetime.