{"title":"Performance of asymmetric gate oxide on gate-drain overlap in Si and Si1−xGex double gate tunnel FETs","authors":"S. Poorvasha, B. Lakshmi","doi":"10.1109/VLSI-SATA.2016.7593036","DOIUrl":"https://doi.org/10.1109/VLSI-SATA.2016.7593036","url":null,"abstract":"This paper studies the performance of asymmetric gate oxide on gate-drain overlap for Si and Si<sub>1-x</sub>Ge<sub>x</sub> based double gate (DG) Tunnel FETs (TFETs). For the first time, asymmetric gate oxide is introduced in the gate-drain overlap and compared with that of DG TFETs. For the different values of the mole fraction (x), Si<sub>1-x</sub>Ge<sub>x</sub> is optimized to get ON current (I<sub>ON</sub>) enhancement. Si<sub>1-x</sub>Ge<sub>x</sub> based DG TFETs with gate-drain overlap offers a very good I<sub>ON</sub> of 232 μA with the subthreshold swing (SS) of 26 mV/dec. This is achieved because of the high tunneling rate of electrons occurring at the source side of Si<sub>1-x</sub>Ge<sub>x</sub>.","PeriodicalId":328401,"journal":{"name":"2016 International Conference on VLSI Systems, Architectures, Technology and Applications (VLSI-SATA)","volume":"66 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126400082","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Aneesh Raveendran, Vinayak Patil, D. Selvakumar, Vivian Desalphine
{"title":"A RISC-V instruction set processor-micro-architecture design and analysis","authors":"Aneesh Raveendran, Vinayak Patil, D. Selvakumar, Vivian Desalphine","doi":"10.1109/VLSI-SATA.2016.7593047","DOIUrl":"https://doi.org/10.1109/VLSI-SATA.2016.7593047","url":null,"abstract":"Micro-architecture design and analysis of a RISC-V instruction set processor has been articulated in this paper. Instruction Set Architectures (ISAs) for processors from Intel, AMD, Intel, MIPS etc. is protected through IP Rights and Infringements. Few ISAs do exist as open-source viz. Open RISC, SPARC, RISC-V etc. RISC-V ISA has been evolved from the efforts at University of California, Berkeley and has been open sourced as BSD license. This paper details the microarchitecture design and analysis of a 5-stage pipelined RISC-V ISA compatible processor and effects of instruction set on the pipeline / micro-architecture design. The design have been analyzed in terms of instructions encoding, functionality of instructions, instruction types, decoder logic complexity, data hazard detection, register file organization and access, functioning of pipeline, effect of branch instructions, control flow, data memory access, operating modes and execution unit hardware resources. The processor has been micro-architected, simulated using Blue-spec System Verilog, synthesized and analyzed on FPGA platform and 65nm and 130nm technology nodes for ASIC. The synthesis results are compared and analyzed with similar efforts on RISC-V ISA based processor core.","PeriodicalId":328401,"journal":{"name":"2016 International Conference on VLSI Systems, Architectures, Technology and Applications (VLSI-SATA)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129334386","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. K. Megalingam, C. Jayakrishnan, Sriraj Nambiar, Rudit Mathews, Vishnu Das, Pramesh Rao
{"title":"Automatic pressure maintenance system for tyres in automobiles to reduce accidents","authors":"R. K. Megalingam, C. Jayakrishnan, Sriraj Nambiar, Rudit Mathews, Vishnu Das, Pramesh Rao","doi":"10.1109/VLSI-SATA.2016.7593028","DOIUrl":"https://doi.org/10.1109/VLSI-SATA.2016.7593028","url":null,"abstract":"One of the important factors that play key role in increasing automobile efficiency and reducing number of road accidents, is optimum tyre pressure maintenance. Variation of tyre pressure from the optimum value can result in reduction of fuel mileage, tyre life, and safety and often in tyre bursts causing accidents. We propose the design of an automatic system that can ensure and maintain tyre pressure to its optimum safe value. The design consists of real time tyre pressure monitoring system for taking periodic pressure readings, a pressure control system that makes adjustments to achieve the desired pressure settings and a wireless communication link to integrate both these systems together. The design in addition allows adjustments to predefined terrain based tyre pressure settings and to manually entered pressure settings. The implementation, testing, and analysis of the system is provided in this research work.","PeriodicalId":328401,"journal":{"name":"2016 International Conference on VLSI Systems, Architectures, Technology and Applications (VLSI-SATA)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132326767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Non-intrusive FPGA-based profiler for loop execution characterization","authors":"Pavan Kumar Nadimpalli, S. Roy","doi":"10.1109/VLSI-SATA.2016.7593046","DOIUrl":"https://doi.org/10.1109/VLSI-SATA.2016.7593046","url":null,"abstract":"Embedded system design involves meeting strict design goals such as performance, area and power consumption. In-order to meet these design goals embedded systems are implemented in programmable processors and application-specific hardware. Hardware/Software partitioning is thus, a critical step in the realization of embedded systems. The initial software description of the application is profiled to identify the critical sections of the software code which consume the largest percentage of execution time. These critical sections are then chosen as ideal candidates to be implemented as application specific hardware. It is reported that 90 percent of the execution time is spent in executing loops in typical embedded systems applications. In this paper we present a non-intrusive, low overhead FPGA based hardware profiler to identify at run-time the different loops and the time taken to execute these loops from the execution of different scenarios of the application software when compiled on the chosen programmable processor.","PeriodicalId":328401,"journal":{"name":"2016 International Conference on VLSI Systems, Architectures, Technology and Applications (VLSI-SATA)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124423025","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reconfigurable side channel attack resistant true random number generator","authors":"Vijay Bahadur, D. Selvakumar, Vijendran, P. Sobha","doi":"10.1109/VLSI-SATA.2016.7593048","DOIUrl":"https://doi.org/10.1109/VLSI-SATA.2016.7593048","url":null,"abstract":"Random Number Generators (RNGs) play an important role in cryptography. The security of cryptographic algorithms and protocols relies on the ability of RNGs to generate unpredictable secret keys and random numbers. This paper presents an implementation of Side Channel Attack resistant Galois Ring Oscillator (GARO) based True Random Number Generator (TRNG) on FPGA. To study and prove the robustness of the random number generator against placement sensitivity, due to various physical properties of logic elements and thermal variations of FPGA, the design (single instance of GARO) was implemented at four different quadrants in the FPGA and the generated random bit streams were analyzed. Such designs enable resilience against side channel attacks by injection locking. Further, to prove that the implemented TRNG is resilient against side channel attack (Electromagnetic Injection (EM) Attack, Frequency Injection Attack) the frequency spectrum of GARO was captured and analyzed. It was observed that the output of GARO is not dominated by any single frequency unlike non-GARO based ring oscillator which makes it difficult to get locked due to EM / Frequency injection at the specific oscillator frequency. The output bit-stream has been sampled from multiple spatially distributed TRNG units by round-robin. National Institute of Standards and technology (NIST) statistical test suite has been used to benchmark the statistical properties of generated random bit streams and bit streams fulfills all the test suite requirements.","PeriodicalId":328401,"journal":{"name":"2016 International Conference on VLSI Systems, Architectures, Technology and Applications (VLSI-SATA)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116039350","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Design of CMOS programmable output binary and fibonacci switched capacitor step-down DC-DC converter","authors":"Mahesh Zanwar, S. Sen","doi":"10.1109/VLSI-SATA.2016.7593034","DOIUrl":"https://doi.org/10.1109/VLSI-SATA.2016.7593034","url":null,"abstract":"This paper describes the CMOS implementation of an open-loop variable output voltage switched capacitor step-down DC-DC converter with a large number of target voltages. The number of target voltages generated using n-flying capacitors are of the order of 2n. A switch selection scheme is presented that optimizes silicon area. Expressions for equivalent series resistance Req, conduction, switching power loss and efficiency are obtained and compared with the spice simulation results. The Digital Switch Controller is designed to switch between various target voltages and simulated in Cadence Analog-Mixed Signal flow. The 3/4 step-down converter circuit is described and analysed by varying switching frequency and load for different values of bottom plate parasitic capacitance. The optimum value of switching frequency and switch sizes is obtained for a switched capacitor converter. An efficiency of about 78.4% is achieved with 5% bottom plate parasitic capacitance for a load current of 1.35 mA and input voltage of 1.8 V at 20 MHz of switching frequency.","PeriodicalId":328401,"journal":{"name":"2016 International Conference on VLSI Systems, Architectures, Technology and Applications (VLSI-SATA)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116266585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Sourabhkumar Jain, Parimal Govani, Kamal B. Poddar, A. K. Lal, R. Parmar
{"title":"Functional verification of DSP based on-board VLSI designs","authors":"Sourabhkumar Jain, Parimal Govani, Kamal B. Poddar, A. K. Lal, R. Parmar","doi":"10.1109/VLSI-SATA.2016.7593030","DOIUrl":"https://doi.org/10.1109/VLSI-SATA.2016.7593030","url":null,"abstract":"The Usage of Field Programmable Gate Arrays (FPGA) and Application Specific Integrated Circuits (ASICs) with complex functionalities such as Digital Signal Processing (DSP) is increasing in onboard space applications. Verification of these complex designs within limited schedule and resources is challenging. In order to ensure reliable functioning of these designs in all possible run time conditions, functional verification is required to be carried out thoroughly. Development of an automated self-checking verification environment or test benches, including generation of bit-accurate golden reference values, is complex and time consuming task even with the use of state-of-the-art Hardware Verification Languages (HVLs) and methodology such as System-Verilog (SV) and Universal Verification Methodology (UVM) respectively. This paper discusses a method for functional verification of DSP based VLSI design using SV and Matlab. The architecture of verification environment and technique for coupling of Matlab with SV based verification environment and generation of bitaccurate golden references, in real time is also discussed in detail, along with two case studies.","PeriodicalId":328401,"journal":{"name":"2016 International Conference on VLSI Systems, Architectures, Technology and Applications (VLSI-SATA)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121212675","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Clock skew optimized VLSI architecture for zero frequency filter","authors":"K. Radhakrishnan, S. Rani","doi":"10.1109/VLSI-SATA.2016.7593032","DOIUrl":"https://doi.org/10.1109/VLSI-SATA.2016.7593032","url":null,"abstract":"In today's world, mobile phones play an important role in communication. People using mobile phones often face the problem of noise signals affecting the quality of speech. Passive noise control suppresses the higher frequency acoustic noise. It is a technique that provides sound reduction by noise-isolating materials such as insulation, sound-absorbing tiles, or a muffler rather than a power source. In lower frequencies, passive techniques require material that is too bulky and heavy. So an alternative method called active noise cancellation that separates noise signal and speech signal is chosen. Zero frequency filter is a technique used for active noise cancellation of noisy speech signals. This filter is used for the characterization of glottal activity from speech signals thereby cancelling the noise. The main advantage of this method when compared to other noise cancellation methods is that noise need not be modeled separately. In this paper is to present the VLSI implementation architecture of zero frequency filter with useful clock skew optimization. This architecture can be used as voice processor in mobile applications. As clock frequency increases and the technology move towards sub-nanometer process, handling timing violations in the design becomes an increasingly complex and challenging task. Traditional approaches target for global zero skew in the process of timing closure costs in area and power and also limits the maximum achievable operating frequency. Useful clock skew optimization is an emerging technique that helps achieve timing closure. The work presented in this paper achieves timing closure with an area overhead of about 15.87% through useful clock skew optimization.","PeriodicalId":328401,"journal":{"name":"2016 International Conference on VLSI Systems, Architectures, Technology and Applications (VLSI-SATA)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133542833","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A circuit technique for leakage power reduction in CMOS VLSI circuits","authors":"Venkata Ramakrishna Nandyala, K. Mahapatra","doi":"10.1109/VLSI-SATA.2016.7593044","DOIUrl":"https://doi.org/10.1109/VLSI-SATA.2016.7593044","url":null,"abstract":"Scaling of CMOS technology improved the speed nevertheless the leakage currents are leftover as an adverse effect. The problem has taken a serious turn as the scaling extends into ultra-deep-submicron (UDSM) region. These unsolicited leakage currents should be minimized for the smooth functioning of the circuit. Designing of such leakage free nanoscale CMOS circuits turns to be a challenging task. In this work, we address the issue of leakage power that arises with the device channel length scaling to sub-100nm. We present a circuit technique to mitigate the leakage currents of MOSFET through controlling the voltage at the source terminal of the MOSFET. CMOS inverter designed using the proposed technique results in 98% and 30% improvement in static and total power dissipation respectively compared with its conventional design. The simulation results of NAND and NOR gates designed using the same technique indicates 15.89% and 18.83% improvement in the total power compared with their corresponding conventional designs. 11-stage CMOS ring oscillator designed using the proposed technique is analyzed, and corresponding simulation results are reported. Comparison of the proposed circuits in terms of power dissipation and delay with two existing techniques is presented. The circuits designed using the proposed technique results in good Power-Delay Product (PDP).","PeriodicalId":328401,"journal":{"name":"2016 International Conference on VLSI Systems, Architectures, Technology and Applications (VLSI-SATA)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121168085","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. Mishra, Sowbhagya, S. Sudhakar, B. Sudeesh, A. M. Nagalakshmi, S. Udupa
{"title":"RF tracking test system design for closed loop testing of Ku-band antenna","authors":"R. Mishra, Sowbhagya, S. Sudhakar, B. Sudeesh, A. M. Nagalakshmi, S. Udupa","doi":"10.1109/VLSI-SATA.2016.7593049","DOIUrl":"https://doi.org/10.1109/VLSI-SATA.2016.7593049","url":null,"abstract":"Ku band antennae are one of the unique features of GSAT11 spacecraft. As the pointing accuracy of the satellite platform is around 0.1°, improved antenna pointing is achieved using the steerable Deployment Pointing Mechanism (DPM), Radio Frequency (RF) Tracking based measurement system and Attitude and Orbit Control Electronics (AOCE) resident controller. Testing of these subsystems in open and closed loop has been carried out for the first time in zero-g environment. This test has been instrumental in evaluating/validating the closed loop performance of all the subsystems along with the characterization of the RF tracking system and its system response. This paper discusses the design approach and development of RF Tracking Test System and improvements carried out therein to enable smooth testing and lessons learnt. Here, AOCE simulator design has been effected for accelerating the product design cycle and in-parallel carrying out the interface testing along with the algorithmic validation and system characterization.","PeriodicalId":328401,"journal":{"name":"2016 International Conference on VLSI Systems, Architectures, Technology and Applications (VLSI-SATA)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129578911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}