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Proceedings of AUTOTESTCON '94最新文献

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Increasing the performance of GPIB-controlled VXI systems 提高gpib控制的VXI系统的性能
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381550
L. Golla
{"title":"Increasing the performance of GPIB-controlled VXI systems","authors":"L. Golla","doi":"10.1109/AUTEST.1994.381550","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381550","url":null,"abstract":"The HS488 protocol increases the maximum GPIB transfer rate up to 8 Mbytes/s. By using a hardware signaling mechanism to enable HS488 and to handle the data transfer issues, this protocol meets the requirements of speed, compatibility, and transparency with existing systems. When choosing between GPIB and MXI for external control of a VXI system, one must take several factors into account. For message-based instruments, both MXI and GPIB transfer short strings at the same rate, because the VXI Word Serial Protocol is slower than GPIB. In the past, if one used message-based instruments, MXI was the only choice because GPIB was too slow. Now, with HS488, GPIB is comparable to MXI. So, the choice between the two communication protocols becomes a cost and configuration issue. If, however, one uses register-based instruments, GPIB is not the right choice. Instead, one should use an embedded controller or MXI. Regardless, because of its substantial performance increase, HS488 extends the usability of GPIB systems into the next generation of instrumentation.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121140124","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A generic IEEE Std. 488.2 test suite 一个通用的IEEE Std. 488.2测试套件
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381554
C. Bagge
{"title":"A generic IEEE Std. 488.2 test suite","authors":"C. Bagge","doi":"10.1109/AUTEST.1994.381554","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381554","url":null,"abstract":"A generic test suite for the IEEE Std. 488.2-1992 has been developed. The test suite makes it possible to perform an in-depth test of conformance to the standard. The paper starts by explaining the background for the work. This is followed by a presentation of the different phases of the work, and products from each of these phases. A major product, the test tool set, is presented in details with examples on how to configure the test suite for actual instruments and examples of actual test cases. A summary of the experience from using the test tool against actual instruments and information on the availability of the different products developed are presented.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128958164","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Diagnostic Inference Model error sources 诊断推理模型的错误来源
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381593
H. Dill
{"title":"Diagnostic Inference Model error sources","authors":"H. Dill","doi":"10.1109/AUTEST.1994.381593","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381593","url":null,"abstract":"Application of tools such as WSTA, DARTS, STAT and STAMP is now widely accepted as a viable approach to determining the testability of systems and developing rigorous and efficient test strategies. These tools an have one thing in common-the dependency model, more recently known as the diagnostic inference model. The author discusses error sources that can corrupt a dependency model and introduce significant error into the testability predictions and diagnostic sequence recommendations provided by inference model based tools.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121542739","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Object technology applied to mixed signal and RF testing 对象技术应用于混合信号和射频测试
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381599
K. D. Thompson
{"title":"Object technology applied to mixed signal and RF testing","authors":"K. D. Thompson","doi":"10.1109/AUTEST.1994.381599","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381599","url":null,"abstract":"Object-oriented programming (OOP) technology has been available to software specialists for a number of years but has not yet been widely accepted in test programming. This is in spite of observations that electronic test is an environment which could benefit greatly from its use, This paper focuses on the application of OOP technology to mixed signal and RF testing, leading to a reusable test object library.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126526697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Complex microcircuit simulation and test development using BEhavioral STimulus test (BEST TEST) software 使用行为刺激测试(BEST test)软件进行复杂微电路仿真和测试开发
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381507
R. D. Cox
{"title":"Complex microcircuit simulation and test development using BEhavioral STimulus test (BEST TEST) software","authors":"R. D. Cox","doi":"10.1109/AUTEST.1994.381507","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381507","url":null,"abstract":"Developing comprehensive test stimulus for complex microcircuits, particularly microprocessor boards, can be a tedious and time consuming task of hunt and peck; racking up thousands of work hours of labor. This paper describes a behavioral simulation method using software emulators for the creation and automatic timing generation of test stimulus. \"BEST TEST(c)\" software was used to develop tests for a 1750A based microprocessor module which also contains a MIL-STD-1553 data bus controller hybrid and other circuitry for which stimulus can be developed using behavioral methods. This paper shows how this technique saved many hours of tedious analysis and on tester debugging.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116375431","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Interactive Authoring and Display System-a PC based document access/reference environment 交互式创作和显示系统——基于PC的文档访问/参考环境
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381524
I. Lieberman, R. Geer
{"title":"Interactive Authoring and Display System-a PC based document access/reference environment","authors":"I. Lieberman, R. Geer","doi":"10.1109/AUTEST.1994.381524","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381524","url":null,"abstract":"Interactive Authoring and Display System (IADS), a Microsoft Windows application, provides an environment to develop (author) and read (display) documents via a PC. IADS provides both a textual and graphic environment. IADS uses Standard Generalized Markup Language, ISO 8879 (SGML) as its internal file format for textual data. Both vector and raster graphics are supported through CALS standard data formats MIL-D-28003 CGM and MIL-R-28002 Raster Type I as well as Windows .BMP, .PCX and other industry standard formats. IADS was chosen by the Naval Air Warfare Center Weapons Division, Point Mugu as the environment for all Technical Manual publications for the Sparrow Missile Test Set (AN/DPM22-12(V)). Technical Manual development on IADS has been straight forward, requiring a minimal amount of self training. This paper presents development and operational features of IADS, encouraging others to develop/maintain manuals (of any complexity level) in the same manner.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124857379","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
CASS: design for supportability CASS:可保障性设计
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381540
A. Mena
{"title":"CASS: design for supportability","authors":"A. Mena","doi":"10.1109/AUTEST.1994.381540","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381540","url":null,"abstract":"Supportability is an integral performance parameter of any integrated weapon system. The Consolidated Automated Support System (CASS) provides this requirement by exploiting support system design technologies such as electronic technical manuals, maintenance data collection, support of support, automated calibration, and integrated maintenance systems. As a result, greater efficiencies are realized by reducing the required time needed to service, troubleshoot and repair the weapon system and the CASS station itself. This paper briefly describes how CASS meets these objectives.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121861626","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Diagrammatic-graphical programming languages and DoD-STD-2167A 图解-图形编程语言和DoD-STD-2167A
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381508
S.D. Bragg, C. Driskill
{"title":"Diagrammatic-graphical programming languages and DoD-STD-2167A","authors":"S.D. Bragg, C. Driskill","doi":"10.1109/AUTEST.1994.381508","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381508","url":null,"abstract":"Many times it is assumed that diagrammatic programming environments such as National Instruments' LabVIEW and Hewlett-Packard's VEE-Test cannot be used for DoD software because of requirements to conform to DoD-STD-2167A. Frontier Engineering has developed government-acceptable TPS's in graphical programming environments to DoD-STD-2167A, by defining the following: a coding standard to address presentation and use of language features; a complexity metric to gauge the relative size and complexity of CSUs; an SDD format that addresses relevant requirements from DI-MCCR-80012A; configuration-management methods.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"115 33","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120828023","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Design of an integrated ATE amplifier 集成ATE放大器的设计
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381542
W.J. Bowhers, J. McNeill
{"title":"Design of an integrated ATE amplifier","authors":"W.J. Bowhers, J. McNeill","doi":"10.1109/AUTEST.1994.381542","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381542","url":null,"abstract":"A switch mode amplifier design is developed for application to automatic test equipment (ATE) instrumentation. This application requires simultaneous control and measurement of both voltage and current within a user specified region. Advantages and disadvantages of using a switch-mode topology are identified for the ATE application. Comparisons to a linear approach are presented. An integrated circuit to control crossover between voltage and current forcing is designed.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126287702","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Potential applications of IEEE standards to IFTE IEEE标准在IFTE中的潜在应用
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381517
R. Fletcher, D. Roggendorff
{"title":"Potential applications of IEEE standards to IFTE","authors":"R. Fletcher, D. Roggendorff","doi":"10.1109/AUTEST.1994.381517","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381517","url":null,"abstract":"The development of various parts of DoD Automatic Test Systems (ATSs), follows a costly process starting with the description of the products to be tested through fielding and operation of the ATS items. Insufficient implementation of standards in the ATS process is, to a large part, the reason for the high cost and risk. The IEEE Standards Coordinating Committee 20 (SCC20) is endeavoring to provide standards that address concerns of developing ATS and reducing associated costs. Two IEEE test standards are currently used by the Integrated Family of Test Equipment (IFTE). This paper investigates the potential benefits of greater use of IEEE standards during the development and maintenance cycles of IFTE and the associated Test Program Sets.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126369080","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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