{"title":"使用行为刺激测试(BEST test)软件进行复杂微电路仿真和测试开发","authors":"R. D. Cox","doi":"10.1109/AUTEST.1994.381507","DOIUrl":null,"url":null,"abstract":"Developing comprehensive test stimulus for complex microcircuits, particularly microprocessor boards, can be a tedious and time consuming task of hunt and peck; racking up thousands of work hours of labor. This paper describes a behavioral simulation method using software emulators for the creation and automatic timing generation of test stimulus. \"BEST TEST(c)\" software was used to develop tests for a 1750A based microprocessor module which also contains a MIL-STD-1553 data bus controller hybrid and other circuitry for which stimulus can be developed using behavioral methods. This paper shows how this technique saved many hours of tedious analysis and on tester debugging.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"118 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Complex microcircuit simulation and test development using BEhavioral STimulus test (BEST TEST) software\",\"authors\":\"R. D. Cox\",\"doi\":\"10.1109/AUTEST.1994.381507\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Developing comprehensive test stimulus for complex microcircuits, particularly microprocessor boards, can be a tedious and time consuming task of hunt and peck; racking up thousands of work hours of labor. This paper describes a behavioral simulation method using software emulators for the creation and automatic timing generation of test stimulus. \\\"BEST TEST(c)\\\" software was used to develop tests for a 1750A based microprocessor module which also contains a MIL-STD-1553 data bus controller hybrid and other circuitry for which stimulus can be developed using behavioral methods. This paper shows how this technique saved many hours of tedious analysis and on tester debugging.<<ETX>>\",\"PeriodicalId\":308840,\"journal\":{\"name\":\"Proceedings of AUTOTESTCON '94\",\"volume\":\"118 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-09-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of AUTOTESTCON '94\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1994.381507\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of AUTOTESTCON '94","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1994.381507","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Complex microcircuit simulation and test development using BEhavioral STimulus test (BEST TEST) software
Developing comprehensive test stimulus for complex microcircuits, particularly microprocessor boards, can be a tedious and time consuming task of hunt and peck; racking up thousands of work hours of labor. This paper describes a behavioral simulation method using software emulators for the creation and automatic timing generation of test stimulus. "BEST TEST(c)" software was used to develop tests for a 1750A based microprocessor module which also contains a MIL-STD-1553 data bus controller hybrid and other circuitry for which stimulus can be developed using behavioral methods. This paper shows how this technique saved many hours of tedious analysis and on tester debugging.<>
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