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Proceedings of AUTOTESTCON '94最新文献

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Integrated depot environment for avionics support (IDEAS) 航空电子支持综合仓库环境(IDEAS)
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381566
M. Maimone
{"title":"Integrated depot environment for avionics support (IDEAS)","authors":"M. Maimone","doi":"10.1109/AUTEST.1994.381566","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381566","url":null,"abstract":"The classical Air Force Organic Depot for avionics support is a paper intensive environment with a limited degree of automation that is not fully integrated with other levels of maintenance. In addition, with decreased DoD funding for support of avionics systems, the Air Logistics Centers (ALCs) will be tasked to do more with less budget. The C-17 Integrated Depot Environment for Avionics Support (IDEAS) concept offers a solution for improving the efficiency of maintenance personnel while greatly improving the reliability and maintainability of the C-17 Airlifter through the use of a networked computer system and a paperless environment. IDEAS explores off-the-shelf computer hardware, automatic test equipment, and integrated state-of-the-art systems software that would link to existing ground based maintenance systems such as G081 and G0868 and existing C-17 development tools.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126042923","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Computer-controlled test station for HP data acquisition system products 计算机控制的HP数据采集系统测试站产品
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381582
Daqing Lu
{"title":"Computer-controlled test station for HP data acquisition system products","authors":"Daqing Lu","doi":"10.1109/AUTEST.1994.381582","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381582","url":null,"abstract":"A computer-controlled test station was developed to conduct automated performance test and calibration procedures on a broad range of Hewlett-Packard (HP) data acquisition system products remarketed by Technical and Scientific Applications (T.S.A.) Inc. Computer system, peripherals, test equipment, and HP data acquisition system products have been successfully incorporated by use of the Hewlett-Packard Interface Bus (HP-IB) interfacing technology. Well prepared test fixtures and test programs greatly simplified the procedures in setting up the computer-aided test environment. Therefore, this newly developed test station has significantly improved the technical support capability, productivity, and reliability for the HP data acquisition system products remarketed by T.S.A.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126938489","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Draft CALS/CE-ATE Data Base requirements CALS/CE-ATE数据库要求草案
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381528
J. Bormanis, J. Roy
{"title":"Draft CALS/CE-ATE Data Base requirements","authors":"J. Bormanis, J. Roy","doi":"10.1109/AUTEST.1994.381528","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381528","url":null,"abstract":"This paper presents the information that should be included in the CALS/CE data base requirements in order to design, build and operate the ATE for the prime system. The information has been prepared by the Arizona CALS/CE Special Interest Group ATE Committee. These recommendations have been submitted to the DoD CALS/CE Project Management Office for their review and for the inclusion of these ATE requirements in the CALS/CE Data Base.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121923287","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Improving military readiness and U.S. competitiveness through dual use design and test technology 通过双重用途设计和测试技术提高军事准备和美国的竞争力
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381578
W.R. Dearborn, D. Anderson, J. Barkley
{"title":"Improving military readiness and U.S. competitiveness through dual use design and test technology","authors":"W.R. Dearborn, D. Anderson, J. Barkley","doi":"10.1109/AUTEST.1994.381578","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381578","url":null,"abstract":"This paper describes the methodology and tools being developed under the Virtual Test (VTest) Program sponsored by Wright Laboratory's, Manufacturing Technology Directorate. The VTest system will be a commercially available, test system independent, Integrated Process/Product Development (IP/PD) solution for the design and virtual testing of electronic circuits. The methodology and tools developed under the VTest program will provide measurable benefits to enterprises who have spread the printed circuit assembly (PCA) and line replaceable module (LRM) life-cycle across more than one location or test system, electrical design and manufacturing companies and electrical service depots.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123627971","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Technician centered test concepts 以技术人员为中心的测试概念
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381575
S.P. Case, M. Brown
{"title":"Technician centered test concepts","authors":"S.P. Case, M. Brown","doi":"10.1109/AUTEST.1994.381575","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381575","url":null,"abstract":"Lower cost maintenance of electronic equipment can be achieved by implementing technician centered test concepts coupled with current software technologies. The limiting tendencies of some past ATE concepts can be reversed by providing technicians with the tools, training, and authority required to be competitive. The proper use of visualization, control, paperwork reduction, and data collection/usage techniques provides much greater insight into the test process itself, as well as smoother work-flow management. The techniques discussed can lead to significant productivity and quality improvements. The traveling wave tube (TWT) automated test station (TATS) currently in use at the Warner Robins Air Logistics Center (ALC) depot provides some examples of effective visualization techniques.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"77 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134443697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
C-17, automated testing of cockpit display visual aspects C-17，座舱显示视觉方面的自动测试
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381570
D. Behnken, R. Salgado
{"title":"C-17, automated testing of cockpit display visual aspects","authors":"D. Behnken, R. Salgado","doi":"10.1109/AUTEST.1994.381570","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381570","url":null,"abstract":"The C-17 Glass Cockpit utilizes two unique display technologies whose visual characteristics are crucial to mission success. The C-17 display test set provides a single automated testing solution for the heads up display and the multi-function display utilizing off-the-shelf commercial photometric testing equipment. Automated testing of visual aspects as perceived by the pilot is implemented to quantify display characteristics such as luminance, uniformity, resolution, placement accuracy, color and convergence. Minimizing operator intervention and maximizing automatic test capability reduces subjective analysis to repeatable consistent test standards with reduced test times.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133543525","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Emerging standards reduce product life-cycle costs 新兴标准降低了产品生命周期成本
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381519
A. M. Jackson
{"title":"Emerging standards reduce product life-cycle costs","authors":"A. M. Jackson","doi":"10.1109/AUTEST.1994.381519","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381519","url":null,"abstract":"The product development lifecycle and in particular the transition in the product development lifecycle from the design phase to the test phase is hampered by the inability of point tools to be integrated into a common development environment. This paper describes the integration of test preparation tools from a board test system into an Electronic Design Automation (EDA) environment.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"103 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132582367","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
GPIB compliance testing in a large test and measurement company 大型测试测量公司的GPIB符合性测试
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381553
R. Cram
{"title":"GPIB compliance testing in a large test and measurement company","authors":"R. Cram","doi":"10.1109/AUTEST.1994.381553","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381553","url":null,"abstract":"This paper describes experiences in applying GPIB and IEEE 488.2 compliance testing to a variety of product groups within a large test and measurement organization. It covers compliance test development, hardware and software considerations, and actual experiences with enforcement.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124542225","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Digital multimedia information system (DMIS)-a futuristic paperless system used today 数字多媒体信息系统(DMIS)——当今使用的未来无纸化系统
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381527
J. Styers
{"title":"Digital multimedia information system (DMIS)-a futuristic paperless system used today","authors":"J. Styers","doi":"10.1109/AUTEST.1994.381527","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381527","url":null,"abstract":"A system which requires no paper documentation for running a test program set (TPS) has been a technician's dream for years. This paperless system would not need printed schematics, part lists, board layouts or test instructions. This information would either be available at the touch of a button or appear as it was needed on the system screen. Such a system has been developed and is being used today; it is called DMIS. This paper describes how the first programs were developed, how they are used and what has been learned from them.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116367729","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A generic floorplanning methodology 一种通用的楼层规划方法
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381541
Mohammad Mortazavi, N. Bourbakis
{"title":"A generic floorplanning methodology","authors":"Mohammad Mortazavi, N. Bourbakis","doi":"10.1109/AUTEST.1994.381541","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381541","url":null,"abstract":"One of the important and time consuming stages of design automation is the physical layout design cycle. The physical layout cycle itself consists of several steps, such as partitioning, floorplanning, placement, synthesis, muting and compaction. In this paper, a generic floorplanning methodology is presented. The methodology is based on the hierarchical cooperation of two context-free languages (SCAN and GEOMETRIA). In order to achieve an acceptable planning, the SCAN language defines the partitioning of the floor area and the global acquisition strategy (scan patterns) for the placement of the macro blocks. On the other hand, GEOMETRIA language deals with the local synthesis of the block under the constraints superimposed by global scan patterns. The results obtained by this methodology are very promising in comparison with other floorplanning methodologies.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125904618","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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