新兴标准降低了产品生命周期成本

Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI:10.1109/AUTEST.1994.381519

A. M. Jackson

{"title":"新兴标准降低了产品生命周期成本","authors":"A. M. Jackson","doi":"10.1109/AUTEST.1994.381519","DOIUrl":null,"url":null,"abstract":"The product development lifecycle and in particular the transition in the product development lifecycle from the design phase to the test phase is hampered by the inability of point tools to be integrated into a common development environment. This paper describes the integration of test preparation tools from a board test system into an Electronic Design Automation (EDA) environment.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"103 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Emerging standards reduce product life-cycle costs\",\"authors\":\"A. M. Jackson\",\"doi\":\"10.1109/AUTEST.1994.381519\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The product development lifecycle and in particular the transition in the product development lifecycle from the design phase to the test phase is hampered by the inability of point tools to be integrated into a common development environment. This paper describes the integration of test preparation tools from a board test system into an Electronic Design Automation (EDA) environment.<<ETX>>\",\"PeriodicalId\":308840,\"journal\":{\"name\":\"Proceedings of AUTOTESTCON '94\",\"volume\":\"103 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-09-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of AUTOTESTCON '94\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1994.381519\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of AUTOTESTCON '94","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1994.381519","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

产品开发生命周期，特别是产品开发生命周期中从设计阶段到测试阶段的过渡，由于无法将点工具集成到公共开发环境中而受到阻碍。本文介绍了将测试准备工具从电路板测试系统集成到电子设计自动化(EDA)环境中的方法

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Emerging standards reduce product life-cycle costs

The product development lifecycle and in particular the transition in the product development lifecycle from the design phase to the test phase is hampered by the inability of point tools to be integrated into a common development environment. This paper describes the integration of test preparation tools from a board test system into an Electronic Design Automation (EDA) environment.<>

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Proceedings of AUTOTESTCON '94

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