{"title":"Emerging standards reduce product life-cycle costs","authors":"A. M. Jackson","doi":"10.1109/AUTEST.1994.381519","DOIUrl":null,"url":null,"abstract":"The product development lifecycle and in particular the transition in the product development lifecycle from the design phase to the test phase is hampered by the inability of point tools to be integrated into a common development environment. This paper describes the integration of test preparation tools from a board test system into an Electronic Design Automation (EDA) environment.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"103 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of AUTOTESTCON '94","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1994.381519","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The product development lifecycle and in particular the transition in the product development lifecycle from the design phase to the test phase is hampered by the inability of point tools to be integrated into a common development environment. This paper describes the integration of test preparation tools from a board test system into an Electronic Design Automation (EDA) environment.<>