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Proceedings of AUTOTESTCON '94最新文献

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Antenna range upgrade project Indoor Doppler Antenna Test Range 天线距离升级工程室内多普勒天线试验场
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381511
David C Jackson
{"title":"Antenna range upgrade project Indoor Doppler Antenna Test Range","authors":"David C Jackson","doi":"10.1109/AUTEST.1994.381511","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381511","url":null,"abstract":"The Indoor Doppler Antenna Test Range at Robins Air Force Base, Georgia, was constructed in the mid-1970's to provide an automated test and calibration capability for the APN-185 and APN-189 navigational Doppler radar antennas. Over time, the capabilities of the facility were gradually enhanced to enable test/calibration of a variety of antennas used in navigation, terrain following, and fire control systems. In the late 1980's, a project was undertaken to upgrade the facility by replacing obsolete hardware components and by redesigning the system software and rehosting it in Ada. The project, which was completed in the spring of 1993, has resulted in notable improvements in system reliability, maintainability, and performance.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123450781","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Single measurement testing, pros and cons 单次测量测试，利弊
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381545
J.R. Miller
{"title":"Single measurement testing, pros and cons","authors":"J.R. Miller","doi":"10.1109/AUTEST.1994.381545","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381545","url":null,"abstract":"There is a school of thought that believes making a single measurement of some parameter is a proper test procedure. For reasons of speed and the large number of measurements to be made on an item, so the reasoning goes, one cannot afford to make multiple measurements, calculate the average and the variation of the readings. What are the consequences of this approach? Can one test a unit to its specifications using this approach? What are the trade-offs inherent in single measurement testing? What happens if an erratic unit is tested? An alternative testing method involves taking a few repeat values, averaging them and estimating their repeatability. The same set of questions apply. The pros and cons of these two approaches are discussed. Practical real world examples are presented.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132034974","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Reducing life-cycle costs in ATE technology insertion 降低ATE技术应用的生命周期成本
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381586
J. M. Zapata
{"title":"Reducing life-cycle costs in ATE technology insertion","authors":"J. M. Zapata","doi":"10.1109/AUTEST.1994.381586","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381586","url":null,"abstract":"As the procurement dollars dwindle we are faced with an increasing need to maintain fleet support with fewer financial resources. The Navy has taken an innovative approach to decreasing life-cycle costs while addressing the testability requirement. By using cost control and performance measurement techniques practiced in the private sector and inserting commercial-off-the-shelf equipment into aging test sets they can be made reliable and supportable. Replacing a 1970's computer with an 80486 computer and the associated hardware is discussed. Decreasing documentation costs by digitizing the technical manuals and using a CALS compliant software developed by the Army is presented.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121119423","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An object oriented ATLAS compiler 一个面向对象的ATLAS编译器
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381610
D.T. Buksbaum
{"title":"An object oriented ATLAS compiler","authors":"D.T. Buksbaum","doi":"10.1109/AUTEST.1994.381610","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381610","url":null,"abstract":"Conventional compilers require a large amount of maintenance, and are difficult to adapt to changes in the language. They are limited to parsing a single version of a language. This paper presents an alternate design to conventional compilers, a method in which ease of maintenance and enhanced flexibility is the primary goal.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"91 9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128016490","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The common architectural heritage of SMART and ABBET SMART和ABBET的共同建筑遗产
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381514
C. E. Miller, J.S. Gerg
{"title":"The common architectural heritage of SMART and ABBET","authors":"C. E. Miller, J.S. Gerg","doi":"10.1109/AUTEST.1994.381514","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381514","url":null,"abstract":"This paper examines and discusses components of the architectures for the Standard Modular Avionics Repair and Test (SMART) and a Broad-Based Environment for Test (ABBET) standards. In addition, the similarities of SMART and ABBET are cited and a discussion presented on how the architects and users of the two standards may benefit from the differences.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"104 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128022129","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Consolidated Automated Support System (CASS) Automated Technical Information (ATI) display system using ASCII data files 综合自动化支持系统(CASS)使用ASCII数据文件的自动技术信息(ATI)显示系统
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381523
K. W. Ludwick
{"title":"Consolidated Automated Support System (CASS) Automated Technical Information (ATI) display system using ASCII data files","authors":"K. W. Ludwick","doi":"10.1109/AUTEST.1994.381523","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381523","url":null,"abstract":"The Consolidated Automated Support System (CASS) Automated Technical Information (ATI) System used to display Technical Manuals and Test Program Instructions is a page turner system. Each page of a manual is a raster page (bitmapped graphics) displayable at 72 dpi. Selection of these pages is accomplished by using ASCII index files. Expanding the content and use of the ASCII index files and linking the indexes causes the CASS ATI to appear to the user as a form of an IETM with less graphic files required. This approach will save development dollars and make the CASS ATI more user friendly. The addition of duplicate Computer Graphics Metafile (CGM) for each raster file makes the optical disk data used for CASS ATI totally updatable.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125900755","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Mobile test systems for flightline and forward battle areas 用于飞行线和前方战场的移动测试系统
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381576
T.W. Buchholz
{"title":"Mobile test systems for flightline and forward battle areas","authors":"T.W. Buchholz","doi":"10.1109/AUTEST.1994.381576","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381576","url":null,"abstract":"Mobile testers are rapidly becoming a critical ingredient in present and future military automatic test equipment strategies and procurements. Lightweight, portable testers are required in flightline, at forward battle areas and in rapid deployment operations. These portable testers must have RF and microwave testing capabilities which until now have not been easily available in small, portable systems. This paper focuses on a systems approach in using digital signal processing (DSP) and monolithic microwave integrated circuits (MMIC) in developing portable testers. Leading edge MMIC technology has enabled RF/microwave systems to be downsized for completely portable flightline and field use. Future defense programs such as Joint Services Electronic Combat System Tester (JSECST) will emphasize this capability.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"146 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121518112","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Reducing costs through the use of Special Purpose Automatic Test Equipment (SPATE) 通过使用专用自动测试设备降低成本
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381584
L. Brogan
{"title":"Reducing costs through the use of Special Purpose Automatic Test Equipment (SPATE)","authors":"L. Brogan","doi":"10.1109/AUTEST.1994.381584","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381584","url":null,"abstract":"Special Purpose Automatic Test Equipment (SPATE) addresses the need for lower costs of acquisition, development and ownership while providing easy maintainability, parallel path testing, and flexible, rapid response to meet future test requirements.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121657894","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Using digital data processing to speed up radar phase noise measurements 利用数字数据处理加快雷达相位噪声测量
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381509
D. Guhse, B. Luster, M. Prcic
{"title":"Using digital data processing to speed up radar phase noise measurements","authors":"D. Guhse, B. Luster, M. Prcic","doi":"10.1109/AUTEST.1994.381509","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381509","url":null,"abstract":"Amplitude modulated noise and phase noise measurements for airborne radars have traditionally been performed by converting high frequency spectrums to the video range and measuring the analog noise and spurious parameters on conventional spectrum analyzers. The disadvantage of using spectrum analyzers is that test execution time is relatively long due to the slow sweep times required for selection of narrow resolution bandwidths. Also, since sweep times are long with spectrum analyzers, transient noise and other short time interval phenomena are difficult to detect (since they are usually \"averaged out\" due to the slow sweep). This has prompted the development of digital signal processing techniques to speed up the execution time and increase the accuracy of measurements. This paper describes an automated and efficient system that measures AM and PM response digitally. A digitizer is used to convert the analog signal to digital, whereupon a computer is used to process the digital data for noise and spurious response. This system allows for flexibility, since the processing may be altered by merely changing the computer software.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115075860","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Joint service missile testing-a CASS Navy/Air Force solution 联合服务导弹测试--CASS 海军/空军解决方案
Proceedings of AUTOTESTCON '94 Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.1994.381537
C. Davis
{"title":"Joint service missile testing-a CASS Navy/Air Force solution","authors":"C. Davis","doi":"10.1109/AUTEST.1994.381537","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381537","url":null,"abstract":"The shrinking defense budget is applying increasing pressure on the armed services for standardizing ATE. Standardization of ATE for avionics and ground systems is well established, and has proceeded based on individual service demands and solutions. Recent decisions by OSD and Congress have mandated further ATE standardization cutting across service lines, with a special focus on maximizing the return on the Navy investment in CASS. Until recently the world of missile systems has not been included in standardization efforts and special test equipment applications still proliferate.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130188350","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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