{"title":"Matching new TPS applications to existing ATE","authors":"B. Widner, J. Walsh","doi":"10.1109/AUTEST.1994.381535","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381535","url":null,"abstract":"This paper details a successful method of selecting Automated Test Equipment (ATE) to host new Test Program Set (TPS) requirements. It explains the purpose of detailed analyses, understanding customer requirements, and ATE selection criteria. It also highlights required and other available sources of data such as MIL-HDBK-300, SEAMs electronic database, commercial catalogs, etc. The methodology compares potential Units Under Test (UUTs) requirements with existing ATE stimulus and measurement capabilities. It utilizes a matrix format, which allows engineers to easily identify and compare potential ATE hosts for any UUT set. This method also provides a historical record for future opportunities.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127955162","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Applying class library technology to TPS development","authors":"M. Bostic, D. Gaissert","doi":"10.1109/AUTEST.1994.381600","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381600","url":null,"abstract":"Various approaches to software reuse, both for the software community in general and test programming community in particular are defined and discussed. Also discussed is the in-progress Principles of ABBET (PAD) demonstration which concentrates on the benefit to be derived from test-oriented reuse constructs similar to those facilitated by ABBET.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131645608","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Object-oriented test development in ABBET","authors":"R. McGarvey","doi":"10.1109/AUTEST.1994.381505","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381505","url":null,"abstract":"ABBET is an acronym for A Broad Based Environment for Test. The ABBET standard is being developed by the ABBET Subcommittee of the IEEE SCC20 Standards Coordinating Committee. ABBET's goal is to establish an integrated set of standards that support product test related needs over the full product life cycle. ABBET will support user needs such as testability analysis of new products, specification of test requirements, analysis of alternative maintenance strategies, test program generation, reapplication of test knowledge, reuse of software components, test implementation on heterogenous platforms, implementation of innovative diagnostic techniques, and continuous improvement of the test process. An ABBET compliant software environment is based on an open framework that manages a test knowledge repository and physical test resources in accordance with accepted test related standards. This paper describes an object-oriented methodology for software development based on efforts by the ABBET Subcommittee to analyze the product test domain. The paper presents models of the test domain that have helped committee members to arrive at a common understanding of product test problems and proposed solutions. The models presented here represent a high level overview, suitable for technical managers interested in understanding the scope of ABBET and its basic methodology for test software development. The final section discusses several major problem areas that are prevalent in the test industry today and how application of the ABBET test methodology can help users to manage these problems more effectively.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"708 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131493757","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"ABBET: an introduction","authors":"J. Dean, A. Greenspan, W. Simpson","doi":"10.1109/AUTEST.1994.381606","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381606","url":null,"abstract":"The testing of products to diagnose and repair their failures has been attacked from various perspectives for decades. Dependent on the nature of the product, who manufactured it and who is maintaining it, multiple tools, languages and standards have arisen to address the test requirements for maintaining the product. These efforts have been for the most part fragmented in approach, focusing on a small part of the overall problem of test. ABBET is a standardization effort aimed at encompassing the whole test domain, from product definition to test specification to ATS bus control. This paper discusses the goals, philosophy and products of the ABBET standard.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134480922","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An analyzer for detecting intermittent faults in electronic devices","authors":"B. Sorensen, G. Kelly, A. Sajecki, P.W. Sorensen","doi":"10.1109/AUTEST.1994.381590","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381590","url":null,"abstract":"Intermittent defects are a major cause of failure in electronic systems throughout all branches of the Armed Forces and the electronics industry. They result in unnecessary repairs, low operational readiness, premature system replacement, and preventable accidents. The problems associated with troubleshooting and resolving intermittents are discussed, along with the need to change current mind-sets. New technologies and equipment developed by Universal Synaptics to detect and isolate intermittents are described. In addition, recommendations are made on how to maximize the benefits of these new technologies.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114626728","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Diagnostician-on-a-chip (DOC)","authors":"M. Nolan, M. Granieri","doi":"10.1109/AUTEST.1994.381591","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381591","url":null,"abstract":"This paper describes the principal concepts and initial implementation of an innovative approach for embedding a diagnostic reasoning capability onto microcontroller. The approach is predicated upon the use of an automated concurrent engineering tool set that is utilized to develop a diagnostic knowledge base which is subsequently incorporated into microcontroller's diagnostic run-time system. Examples of centralized and distributed architectures utilizing the subject approach are described.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115684867","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Application of fiber-optic delay lines in radar phase noise measurement","authors":"M. Fisk, M. Prcic, G. Rzyski, R. Stevens","doi":"10.1109/AUTEST.1994.381513","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381513","url":null,"abstract":"A critical parameter in the performance of airborne radars is the phase noise of the radar's carrier frequency. Low phase noise is important for accurate long range detection of a target. Many phase noise test sets utilize waveguide delay lines as part of the test circuit. Because of its size, weight, and signal attenuation, the waveguide delay line has length limitation. Replacing waveguide with fiber-optic delay line allows for a major reduction in size and weight, as well as an added ability to improve the sensitivity of the test set in measuring phase noise close to the radar's carrier frequency. This paper describes characteristics of waveguide and fiber-optic delay line based phase noise test sets. The advantages and disadvantages of both types of delay lines are discussed along with recommendations for the use of one versus the other as well as a combination of both.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121037879","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Object-oriented analysis as applied to the ABBET test resource standards","authors":"T.W. Griffin, G. Hardenburg","doi":"10.1109/AUTEST.1994.381603","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381603","url":null,"abstract":"The IEEE A Broad Based Environment for Test (ABBET) Test Resources Working Group is in the process of developing a set of resource standards concerning the information about and the control of ATE test assets. This paper will discuss the use of the Booch Object-Oriented Analysis (OOA) methodology in the definition of the content of these standards. This includes the definition of test resource objects, their methods, and their interrelationships.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123943542","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Lifecycle software support for the C-17 Globemaster III","authors":"A. Liosis","doi":"10.1109/AUTEST.1994.381567","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381567","url":null,"abstract":"The advanced avionics computer systems of the C-17 Globemaster III contain operational flight program software which requires a life cycle support system to accommodate user mission changes and aircraft upgrades. Building upon its C-17 avionics development experience, McDonnell Douglas has developed an integration support facility concept which will substantially reduce the costs of maintaining the C-17 flight software over its projected life cycle. The concept unites the benefits of open architecture, distributed processing, and advanced UNIX-based workstations, as well as the cost advantages of available commercial off-the-shelf software and equipment.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122872507","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A generic VHDL testbench to aid in development of board-level test programs","authors":"W. Swavely, J. Beaton, W. Debany, J. Guerra","doi":"10.1109/AUTEST.1994.381506","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381506","url":null,"abstract":"This paper describes a generic VHDL testbench that has been developed to produce test vector information, including variable length cycles and strobe times. The test vector formats are appropriate for translation to several Automatic Test Systems (ATSs) for test. The testbench is created automatically using a tool developed by IITRI/RAC and the Rome Laboratory. The tool reads a VHDL structural model of a circuit board and generates the testbench. The testbench uses stimulus/response data captured in the IEEE Standard 1029.1, Waveform And Vector Exchange Specification (WAVES), format. Case examples for two different board models and two different ATSs are presented.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122060835","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
