{"title":"Diagnostician-on-a-chip (DOC)","authors":"M. Nolan, M. Granieri","doi":"10.1109/AUTEST.1994.381591","DOIUrl":null,"url":null,"abstract":"This paper describes the principal concepts and initial implementation of an innovative approach for embedding a diagnostic reasoning capability onto microcontroller. The approach is predicated upon the use of an automated concurrent engineering tool set that is utilized to develop a diagnostic knowledge base which is subsequently incorporated into microcontroller's diagnostic run-time system. Examples of centralized and distributed architectures utilizing the subject approach are described.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Diagnostician-on-a-chip (DOC)\",\"authors\":\"M. Nolan, M. Granieri\",\"doi\":\"10.1109/AUTEST.1994.381591\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the principal concepts and initial implementation of an innovative approach for embedding a diagnostic reasoning capability onto microcontroller. The approach is predicated upon the use of an automated concurrent engineering tool set that is utilized to develop a diagnostic knowledge base which is subsequently incorporated into microcontroller's diagnostic run-time system. Examples of centralized and distributed architectures utilizing the subject approach are described.<<ETX>>\",\"PeriodicalId\":308840,\"journal\":{\"name\":\"Proceedings of AUTOTESTCON '94\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-09-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of AUTOTESTCON '94\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1994.381591\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of AUTOTESTCON '94","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1994.381591","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper describes the principal concepts and initial implementation of an innovative approach for embedding a diagnostic reasoning capability onto microcontroller. The approach is predicated upon the use of an automated concurrent engineering tool set that is utilized to develop a diagnostic knowledge base which is subsequently incorporated into microcontroller's diagnostic run-time system. Examples of centralized and distributed architectures utilizing the subject approach are described.<>
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