Proceedings of AUTOTESTCON '94最新文献

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Automating the design process: a design process model implementation 使设计过程自动化:设计过程模型实现
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381588
L. Carmichael, A. Mangum
{"title":"Automating the design process: a design process model implementation","authors":"L. Carmichael, A. Mangum","doi":"10.1109/AUTEST.1994.381588","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381588","url":null,"abstract":"In 1990, Andrzej Wnuk of Siemens A.G. proposed a comprehensive model of the system design process. The model combines an extended design AND/OR decision tree, aspects of the design process for the High Level Design Assistant (HILDA) developed by Siemens Research and Technology Laboratory, structured requirements, and process decomposition. A suitable requirements description language did not exist which resulted in a model which could not be implemented that is, until now. The recent development of the MIMIC (Microwave and Millimeter Wave Integrated Circuits) Hardware Description Language [MHDL] relieves that problem. Hierarchical, functional, and object oriented features of the language make it ideal for modeling the system design process, as well as capturing/cataloging the system and its components as they progress towards implementation. This paper reports on the implementation of a design process model and the associated impacts (i.e. automation of the design process; the creation of an homogeneous design complete, historical, electronic etc.). Additionally, solutions/migration paths for upgrading existing systems are discussed.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133010124","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An overview of the support equipment data acquisition and control system 保障设备数据采集与控制系统概述
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381568
P.F. Burrus, P. Hrosch
{"title":"An overview of the support equipment data acquisition and control system","authors":"P.F. Burrus, P. Hrosch","doi":"10.1109/AUTEST.1994.381568","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381568","url":null,"abstract":"The C-17 program developed Test Program Sets (TPS) at a single location. The concurrent aircraft avionics development plus the wide geographic C-17 avionics supplier base could have proven a significant roadblock to TPS deliveries. Support Equipment Data Acquisition and Control System (SEDACS) controls the communication links for TPS development and supplier electronic data. The benefits are a versatile conversational link with both data suppliers and users. Engineering productivity and centralized configuration management by SEDACS successfully provided a key tool for product deliveries to the first C-17 operational squadron, the 437th Airlift Wing at Charleston Air Force Base.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"119 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116210386","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Neural recognition of diagnostic test data transforms 诊断测试数据变换的神经识别
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381587
J. Scully
{"title":"Neural recognition of diagnostic test data transforms","authors":"J. Scully","doi":"10.1109/AUTEST.1994.381587","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381587","url":null,"abstract":"By extending the concept of fault signatures on the primary outputs of the UUT to include the multiple parameters required of mixed signal testing, a fault dictionary approach to mixed signal UUT diagnostics can be developed. Transforms of fault signature ensemble information, as opposed to transforms of the time varying test signals themselves, can then be used as inputs to a neural net, the outputs of which are available to enhance conventional, fault dictionary processing of the original fault signature information.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122678328","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Creating a diagnostic engineering tool set 创建诊断工程工具集
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381564
D. Bartz, R.A. Sallade
{"title":"Creating a diagnostic engineering tool set","authors":"D. Bartz, R.A. Sallade","doi":"10.1109/AUTEST.1994.381564","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381564","url":null,"abstract":"The development of supportability techniques and tools which keep pace with mission equipment technology is essential to minimize long term maintenance costs. The DoD's solution is the use of an integrated diagnostic (ID) process. An integral part of MDA's plan to implement ID is the use of automated tools to effectively assess diagnostic capabilities during the design process. The development and implementation of a procedure to effectively diagnose an item of mission equipment involves several analyses performed during various phases of the equipment development. A mixture of automated tools and manual methods are currently used to perform these analyses. The effort required to perform these diagnostic analyses can be significantly reduced and the quality of the analyses can be significantly improved by developing an automated method of implementing those portions of the analysis which are currently performed manually. Additional improvements can be realized by integrating those automated tools, utilized separately to perform each analysis, into a unified tool set operating on a common set of design data.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131584299","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Down-sized multi-functional EO Test Collimators 小型化多功能EO测试准直器
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381521
R. James
{"title":"Down-sized multi-functional EO Test Collimators","authors":"R. James","doi":"10.1109/AUTEST.1994.381521","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381521","url":null,"abstract":"Current and future electro-optical (EO) test equipment requirements demand down-sized, multi-functional, multi-spectral, lightweight, low-cost Test Collimators. The Product Support Division of Hughes Aircraft Company has developed such collimator assemblies for field, depot, and mobile test applications. This has been achieved using diamond turned, all-metal mirrors and multi-spectral Integrated Target Assemblies. Diamond turning permits an optimized opto-mechanical design. The Hughes patented Integrated Target Assemblies are single, compact assemblies that utilize emissivity targets to combine multi-spectral test sources and detectors. This overall approach offers significant size, weight, cost, performance, and reliability/maintainability advantages over traditional methods.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132527042","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
An update to applications of open standards to test automation to board-level testing 对开放标准应用程序的更新,以测试自动化到板级测试
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381533
W. Horth, J.M. Nagy, W. Debany, H. Pritchett, C.R. Unkle, W.G. Swavely, J. Newberg
{"title":"An update to applications of open standards to test automation to board-level testing","authors":"W. Horth, J.M. Nagy, W. Debany, H. Pritchett, C.R. Unkle, W.G. Swavely, J. Newberg","doi":"10.1109/AUTEST.1994.381533","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381533","url":null,"abstract":"An application of open standard formats to board-level test was described in a paper presented at AUTOTESTCON 1993. This paper provides an update to this work, including descriptions of the problems encountered and solutions developed in applying such standards to two specific printed circuit boards and two automatic test systems (ATSs): the GenRad 2751 and a Modular Automatic Test Equipment (MATE) compatible system. A complete test automation flow process developed around these open standards and data formats is described, including the specific software tools developed, and the input and output requirements of each tool.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133554026","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Avionics maintenance training using equipment simulation 航电设备模拟维修培训
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381518
S. Royse
{"title":"Avionics maintenance training using equipment simulation","authors":"S. Royse","doi":"10.1109/AUTEST.1994.381518","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381518","url":null,"abstract":"For tasks that involve diagnostic troubleshooting and the use of sophisticated equipment items the use of equipment simulation techniques for training offers many advantages over the use of actual equipment. Furthermore, the development of simulation technologies has provided affordable options for implementing simulator-based training. The F-16 Avionics Intermediate Shop (AIS) is an expensive and extremely complicated device combining aircraft components under test with an array of electronic test equipment and sophisticated software diagnostic tools. As the hardware and software configuration of the aircraft changes, it impacts the test equipment and the procedures for troubleshooting and maintenance of aircraft components. The AIS Maintenance Procedures Trainer provides an excellent example of the application of state-of-the-art simulation techniques to training. The AIS-MPT provides a desktop simulation of the AIS equipment, along with the tools required for avionics maintenance experts to update and maintain existing training exercises, and to provide new training exercises without changing the simulation software of the trainer.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126230172","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Capturing board-level test requirements in generic formats 以通用格式捕获电路板级测试需求
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381530
J.M. Nagy, J. Newberg
{"title":"Capturing board-level test requirements in generic formats","authors":"J.M. Nagy, J. Newberg","doi":"10.1109/AUTEST.1994.381530","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381530","url":null,"abstract":"Accurate and timely capture of test requirements have long been problems in the test support world. The generation and maintenance of Test Program Sets (TPS) at depot-level test facilities are often hindered by the lack of such documentation, especially when migrating old TPSs to newer Automated Test Systems (ATS). This paper will describe a generic, non-proprietary format for capturing test requirement information for component and board-level test. Demonstration software tools that generate the necessary ATS level information and post-process that information to generate a TPS for multiple Automatic Test Systems are also described. The paper discusses case studies of how the software tools and generic formats are being used to create test programs for two different printed circuit boards on two different ATSs.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116003090","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The management of acquired knowledge in expert systems 在专家系统中对获得的知识进行管理
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381565
S. Sumanth
{"title":"The management of acquired knowledge in expert systems","authors":"S. Sumanth","doi":"10.1109/AUTEST.1994.381565","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381565","url":null,"abstract":"This paper is concerned with the methods and strategies behind the acquisition of new knowledge in an expert system and its subsequent management. The acquired knowledge is assumed to be stored in a database which is not part of the knowledge base of the system. By the process of analogical inference the acquired knowledge is used to produce results, partial or whole, that depend on the measure of similarity between the problem set and the facts stored in the database. The paper argues for the application of inference mechanisms on the acquired knowledge so that the outcome of such inference can be used as a heuristic for reducing the search space relating to the given problem. There are three different topics discussed here: analogical reasoning; inductive inference; and a combinational learning strategy. A combination of these can be used to minimize the number of production rules inferred.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125989643","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Software process modeling using object-oriented programming and rule-based reasoning 软件过程建模使用面向对象编程和基于规则的推理
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381562
B. Phillips, D.D. Haley
{"title":"Software process modeling using object-oriented programming and rule-based reasoning","authors":"B. Phillips, D.D. Haley","doi":"10.1109/AUTEST.1994.381562","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381562","url":null,"abstract":"In the context of software process modeling (process definition and simulation), this paper presents an object-oriented programming and rule-based reasoning method to simulate a part of an existing software process model. Presently, our process simulation emphasizes process training and enactment. That is, the simulation is on the \"what and how\" portion of the model.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127515696","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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