{"title":"集成ATE放大器的设计","authors":"W.J. Bowhers, J. McNeill","doi":"10.1109/AUTEST.1994.381542","DOIUrl":null,"url":null,"abstract":"A switch mode amplifier design is developed for application to automatic test equipment (ATE) instrumentation. This application requires simultaneous control and measurement of both voltage and current within a user specified region. Advantages and disadvantages of using a switch-mode topology are identified for the ATE application. Comparisons to a linear approach are presented. An integrated circuit to control crossover between voltage and current forcing is designed.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design of an integrated ATE amplifier\",\"authors\":\"W.J. Bowhers, J. McNeill\",\"doi\":\"10.1109/AUTEST.1994.381542\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A switch mode amplifier design is developed for application to automatic test equipment (ATE) instrumentation. This application requires simultaneous control and measurement of both voltage and current within a user specified region. Advantages and disadvantages of using a switch-mode topology are identified for the ATE application. Comparisons to a linear approach are presented. An integrated circuit to control crossover between voltage and current forcing is designed.<<ETX>>\",\"PeriodicalId\":308840,\"journal\":{\"name\":\"Proceedings of AUTOTESTCON '94\",\"volume\":\"82 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-09-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of AUTOTESTCON '94\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1994.381542\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of AUTOTESTCON '94","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1994.381542","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A switch mode amplifier design is developed for application to automatic test equipment (ATE) instrumentation. This application requires simultaneous control and measurement of both voltage and current within a user specified region. Advantages and disadvantages of using a switch-mode topology are identified for the ATE application. Comparisons to a linear approach are presented. An integrated circuit to control crossover between voltage and current forcing is designed.<>