{"title":"Design of an integrated ATE amplifier","authors":"W.J. Bowhers, J. McNeill","doi":"10.1109/AUTEST.1994.381542","DOIUrl":null,"url":null,"abstract":"A switch mode amplifier design is developed for application to automatic test equipment (ATE) instrumentation. This application requires simultaneous control and measurement of both voltage and current within a user specified region. Advantages and disadvantages of using a switch-mode topology are identified for the ATE application. Comparisons to a linear approach are presented. An integrated circuit to control crossover between voltage and current forcing is designed.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of AUTOTESTCON '94","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1994.381542","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A switch mode amplifier design is developed for application to automatic test equipment (ATE) instrumentation. This application requires simultaneous control and measurement of both voltage and current within a user specified region. Advantages and disadvantages of using a switch-mode topology are identified for the ATE application. Comparisons to a linear approach are presented. An integrated circuit to control crossover between voltage and current forcing is designed.<>