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Proceedings of AUTOTESTCON '94最新文献

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The US Army IETM-one year later 美国陆军ietm——一年后
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381516
J. Brown
{"title":"The US Army IETM-one year later","authors":"J. Brown","doi":"10.1109/AUTEST.1994.381516","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381516","url":null,"abstract":"SAIC and the US Army have created a new approach to diagnostic testing that is both economical to develop and capable of tackling real world trouble shooting problems. This technology resulted in the development of a set of Interactive Electronic Technical Manuals (IETMs) for a new breed of heavy trucks also developed by the Army. The original concept was first presented in the 1993 proceedings of AutoTestCon when the IETMs were still under development and the architecture was fluid. This paper is a follow up on the completion of the project. It analyzes the effectiveness of the various multimedia techniques used in the IETM such as sound, video clips, text to speech translation, hyper-text and hyper-procedures. It also presents a series of metrics collected on the IETMs such as mass storage space requirements, authoring problems encountered and other lessons learned about developing IETMs.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133888005","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Testing the subscriber interface to the ARINC 629 current mode bus 测试连接 ARINC 629 当前模式总线的用户接口
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381555
L. Cohen
{"title":"Testing the subscriber interface to the ARINC 629 current mode bus","authors":"L. Cohen","doi":"10.1109/AUTEST.1994.381555","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381555","url":null,"abstract":"The use of the ARINC 629 Bus on the Boeing 777 airplane introduces new capabilities and new testing challenges. Complete testing of an LRU interface to the 629 Bus requires a sophisticated test approach to validate the redundancy and error checking incorporated in the Terminal Controller, SIM and Current-Mode-Coupler bus interface components. This paper describes basic 629 Bus operation and the redundancy and error checking incorporated in the 629 Bus interface components. The implications this carries for thorough testing lead to a discussion of the test resources required to perform this testing. A coupler module test resource is described that supports 629 stub waveform monitoring, attenuating and stress testing.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131332909","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Behavioral stimulus generation for digital test programs 数字测试程序的行为刺激生成
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381589
G. Puzio, F. Meunier
{"title":"Behavioral stimulus generation for digital test programs","authors":"G. Puzio, F. Meunier","doi":"10.1109/AUTEST.1994.381589","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381589","url":null,"abstract":"This paper describes a process, developed by Integrated Test Solutions, Inc. (ITS), that provides the test programmer with a new type of environment for developing true functional tests using ATPG. This process is called BEhavioral STimulus for TEST Development, or BestTest. BestTest allows for the development of true functional tests using much smaller test patterns than with conventional ATPG alone. Test vectors produced using the BestTest approach result in higher levels of fault detection at significantly lower cost. The heart of the BestTest approach is to provide the test programmer with a behavioral stimulus generation capability that provides for: the ability to generate conditional stimulus; the ability to create complex functions; and the ability to sense the state of the simulation at run time.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130598221","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analog/mixed signal fault diagnosis algorithm and tool review 模拟/混合信号故障诊断算法及工具综述
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381597
S. Goodall
{"title":"Analog/mixed signal fault diagnosis algorithm and tool review","authors":"S. Goodall","doi":"10.1109/AUTEST.1994.381597","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381597","url":null,"abstract":"The development of fault diagnosis algorithms for digital systems has been intensively studied, reported and ultimately implemented in commercial-grade toolkits for testing applications. But the analog/mixed signal fault diagnosis problem, which encompasses the digital problem domain, is only now receiving much more attention. Computer-aided tools using algorithms that efficiently diagnose the cause of any unacceptable circuit behavior are now indispensable testing resources for electronics manufacturing and maintenance processes. This report is a description of several analog/mixed signal fault diagnosis algorithms and their implementation in computer-based tools.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132071851","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
An expert systems approach for automating performance analysis of the air launch cruise missile tests 空中发射巡航导弹试验性能自动化分析的专家系统方法
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381574
R. G. Lopez
{"title":"An expert systems approach for automating performance analysis of the air launch cruise missile tests","authors":"R. G. Lopez","doi":"10.1109/AUTEST.1994.381574","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381574","url":null,"abstract":"Ten years of automated field test data has been collected on random intervals for the required air launch cruise missile (ALCM) Level I primary stationary ground test quality control of ALCM testing can substantially be improved with proper utilization of the Level I database. Economic benefits derived from automating the Level I analysis provide the incentives to develop the expert system. An expert system will transform the raw data into relevant information concerning problem tests and problem missile serial numbers. The expert system approach will provide the means to examine the validity of ALCM Level I test data that varies over time. The expert system will provide trend analysis on test numbers which degrade over time, provide statistical information on consistently marginal test numbers, and expose missiles that do not perform well.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133686208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis 多信号流图:一种新的系统可测试性分析和故障诊断方法
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381596
S. Deb, K. Pattipati, V. Raghavan, M. Shakeri, R. Shrestha
{"title":"Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis","authors":"S. Deb, K. Pattipati, V. Raghavan, M. Shakeri, R. Shrestha","doi":"10.1109/AUTEST.1994.381596","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381596","url":null,"abstract":"In this paper, we present a comprehensive methodology for a formal, but intuitive, cause-effect dependency modeling using multi-signal directed graphs that correspond closely to hierarchical system schematics and develop diagnostic strategies to isolate faults in the shortest possible time without making the unrealistic single fault assumption. A key feature of our methodology is that our models lend naturally to real-world necessities, such as system integration and hierarchical troubleshooting.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129498329","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 233
Re-engineering the test development process 重新设计测试开发过程
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381573
P. Giordano, F. Levy
{"title":"Re-engineering the test development process","authors":"P. Giordano, F. Levy","doi":"10.1109/AUTEST.1994.381573","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381573","url":null,"abstract":"Traditional development of the diagnostic portion of test programs required a highly labor-intensive process of going through pages of schematics and circuit diagrams, hypothesizing all potential failure modes, and developing discrete test paths to ensure fault propagation. In the re-engineered test process, model-based diagnostic software is separated from test software. In run-time, the diagnostic software provides dynamic fault isolation without complex diagnostic test programs. In the re-engineered test process, the fundamental nature and structure of the test process has been changed. The interpretation of the tests is done by dynamic interaction of the product or process knowledge base with an Al Inference Engine that on-the-fly interprets test information based upon all information it receives-in any order. In this type of test program structure, no code is duplicated. The fist of faults is clearly identified and diagnostic data for each fault is kept in one location. Model-based reasoning makes diagnostics affordable for limited production testing and effective for complex system test. The re-engineered test process also supports design of embedded fault management systems, trade-offs between on-line and off-line test, as well as automatic production and field service diagnostics.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"93 15","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114309721","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Computer Aided Re-Engineering (CARE) for Automatic Test Equipment (ATE) 自动测试设备(ATE)的计算机辅助再设计(CARE)
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381559
D. Tyler, S. Whiseant
{"title":"Computer Aided Re-Engineering (CARE) for Automatic Test Equipment (ATE)","authors":"D. Tyler, S. Whiseant","doi":"10.1109/AUTEST.1994.381559","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381559","url":null,"abstract":"This paper addresses a current and future requirement to maintain out moded and obsolete Automatic Test Equipment (ATE) and their associated Test Program Set (TPS) software. There are two major issues with regard to this requirement; first, the ATE hardware is no longer supportable and must be replaced with newer computers and instrumentation. Second, the TPS software must be migrated to the new ATE hardware. This paper presents currently available Computer Aided Re-Engineering (CARE) techniques that will greatly assist the user with this migration.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123241526","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
C-17 intermediate level automatic test system for avionics maintenance C-17航空电子设备维修中级自动测试系统
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381571
J. Allen, C. A. McNeil
{"title":"C-17 intermediate level automatic test system for avionics maintenance","authors":"J. Allen, C. A. McNeil","doi":"10.1109/AUTEST.1994.381571","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381571","url":null,"abstract":"Significant challenges exist when automatic test systems are developed concurrently with avionics to support initial aircraft deployment. The C-17 Globemaster III Intermediate Level Avionics Maintenance System meets those challenges. The C-17A \"support by capability\" program requirement is a unique contractual environment for Test Program Set development. Process based management coupled with low risk development strategies provided a path for on-time Test Program Set deployment. The strategy of using government inventory B-1B Automatic Test Equipment contributed to concurrent Test Program Set operations with the very first day of the C-17A aircraft deployment. This industry \"first\" is not without some valuable lessons learned.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123833707","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
ATE enabling technologies ATE支持技术
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381581
L. Kirkland, J. Dean
{"title":"ATE enabling technologies","authors":"L. Kirkland, J. Dean","doi":"10.1109/AUTEST.1994.381581","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381581","url":null,"abstract":"A discussion of the current and emerging core technologies and philosophies that will enable Air Force personnel to quickly, accurately and intuitively diagnose faults in increasingly complex systems.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127212498","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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