发布求助
文献互助 智能选刊 最新文献

Proceedings of AUTOTESTCON '94最新文献

筛选
英文 中文
Intelligent maintenance aid "software" 智能维修辅助“软件”
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381563
G. deMare, G. Giordano
{"title":"Intelligent maintenance aid \"software\"","authors":"G. deMare, G. Giordano","doi":"10.1109/AUTEST.1994.381563","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381563","url":null,"abstract":"The test industry is developing many forms of maintenance aids built around programs such as the Army SPORT and the Air Force IMIS. This paper presents a key software component called Diagnostician which fits into any hardware implementation to provide the \"intelligence\". Commercial tools for automatic generation of the UUT knowledge base makes the concept very cost effective.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134502128","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Methodologies in user interface design 用户界面设计的方法论
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381557
P. Landseadel
{"title":"Methodologies in user interface design","authors":"P. Landseadel","doi":"10.1109/AUTEST.1994.381557","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381557","url":null,"abstract":"Software applications that require a high learning curve, a mountain of documentation, and weeks of training should be things of the past. Today's applications need to be simple to learn and to use. The human/computer interface should be intuitive and consistent. Context sensitive help should be available to keep the user on track. This paper provides some guidelines for taking commercial world concepts and applying them to the automatic test equipment world. Examples included are from the integrated maintenance information system (IMIS).<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"6 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131945093","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Internal/external test harmonization, verticality and performance metrics-a systems approach 内部/外部测试协调，垂直性和性能指标-系统方法
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381529
J. Scully
{"title":"Internal/external test harmonization, verticality and performance metrics-a systems approach","authors":"J. Scully","doi":"10.1109/AUTEST.1994.381529","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381529","url":null,"abstract":"On-line BIT (built in test) and off-line TPS (test program sets) both suffer from a history of chronic performance deficiencies. Many of these deficiencies can be remedied by more closely coordinating concurrent BIT/TPS development and by applying the same quantitative test performance metrics to both areas under a vertical test design approach.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133160193","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Dependency modelling pitfalls 依赖性建模缺陷
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381546
W. Simpson, J. Sheppard
{"title":"Dependency modelling pitfalls","authors":"W. Simpson, J. Sheppard","doi":"10.1109/AUTEST.1994.381546","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381546","url":null,"abstract":"Model based diagnostic systems are becoming quite popular partially because of the large number of successful applications. Many tools exist for the use of the model based approach, each with a diagnostic advisor. However, experience at modeling over 250 systems has shown that the process of modelling is not straight forward and requires a number of considerations not generally dealt with in the literature. Since the modelling process involves some aspects of art and some aspects of science, the ability to model incorrectly and obtain inaccurate answers is great. This is especially true in the area of automated model development where the concept of a test may be improperly or poorly defined. Some of the more subtle nuances of the modelling approach are discussed and illustrative examples to demonstrate these subtleties are presented.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122857562","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
VISTA: virtual instrument standard test architecture 虚拟仪器标准测试体系结构
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381534
J. Valle, H. Tondre, A. Bernal
{"title":"VISTA: virtual instrument standard test architecture","authors":"J. Valle, H. Tondre, A. Bernal","doi":"10.1109/AUTEST.1994.381534","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381534","url":null,"abstract":"Diagrammatic programming environments provide a unique challenge for the developers of test software. These cost effective environments facilitate access to technologies such as VXI, provide speedy development of highly effective user interfaces, and eliminate many of the tasks often associated with hardware integration in complex test systems. Nonetheless, difficulties can arise when designing functional and diagnostic test software in this environment. This paper introduces VISTA, a promising new architecture which allows users to elude most of the difficulties of building detailed functional and diagnostic TPSs, while taking full advantage of the benefits of diagrammatic programming environments. Here we examine an implementation of the VISTA architecture, the integration of advanced diagnostics, and the use of diagrammatic programming as a test language cross compiler.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"166 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122559663","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Navy air-launched missile maintenance process action teams-a bridge between technology and total quality management 海军空射导弹维修过程行动小组——技术与全面质量管理之间的桥梁
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381520
C.D. Paladino
{"title":"Navy air-launched missile maintenance process action teams-a bridge between technology and total quality management","authors":"C.D. Paladino","doi":"10.1109/AUTEST.1994.381520","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381520","url":null,"abstract":"Current Navy air launched missile (ALM) maintenance includes automatic test equipment (ATE) with varying levels of technology, training, software, and test requirements. These factors, along with excessive and redundant testing have greatly increased maintenance costs. Subsequent ATE inefficiencies and obsolescence influenced the Naval Air Systems Command (NAVAIR) and Naval Sea Systems Command (NAVSEA) to form a Quality Management Board (QMB) to address these problems. The QMB established thirteen Process Action Teams (PAT's) to evaluate the Navy's ALM testing philosophies. This paper outlines the current PAT efforts and accomplishments with emphasis on Army and Air Force practices such as mobile and proximity testing.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126409559","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Current and future thrusts in automated RF and microwave testing 自动化射频和微波测试的当前和未来重点
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381512
K. C. Craig, S. P. Case, R. Neese, C. D. Depriest
{"title":"Current and future thrusts in automated RF and microwave testing","authors":"K. C. Craig, S. P. Case, R. Neese, C. D. Depriest","doi":"10.1109/AUTEST.1994.381512","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381512","url":null,"abstract":"Development of generic test algorithms for broadband RF and microwave components can be challenging due to the wide variances in device properties. Test assumptions, which are suitable for devices with tightly constrained setup and operating ranges, tend to break down when generalized to the broader population of microwave devices. These difficulties are compounded when dealing with high power components, such as traveling wave tubes. The key to design of truly general-purpose algorithms is to minimize or eliminate the constraining assumptions used to simplify test code. At the same time, extreme care must be taken to protect high-cost components from damage during setup and test. Automated test algorithms must achieve closure even when assumptions concerning normal device behavior break down. In this paper, we discuss our current work, and future initiatives for such robust algorithm design.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125385562","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
The anatomy of the test language standard required for autonomous, cooperative information exchange in a distributive open test environment (Test object reuse) 对分布式开放测试环境中自治的、协作的信息交换所需的测试语言标准的剖析(测试对象重用)
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381609
J. Stanco, H. McGuckin
{"title":"The anatomy of the test language standard required for autonomous, cooperative information exchange in a distributive open test environment (Test object reuse)","authors":"J. Stanco, H. McGuckin","doi":"10.1109/AUTEST.1994.381609","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381609","url":null,"abstract":"While numerous application tools and significant standards such as VXI have emerged, little has been done to enhance the use and reuse of key information required for test. This situation occurs because higher order test procedures, methods and standards required by high end users are not being pursued by the commercial sector. Required information infrastructures and their associated architectures and standards have not been evolving at a rate required to keep up with the technology needs. This situation results in the development of autonomous uncooperative (across applications) tools. C/ATLAS-94 has introduced a number of substantial improvements to ATLAS. In the incorporation of these improvements, a need to restructure the language became apparent. The introduction of complex signal, bus testing, new digital and the event enhancements reinforces this need. In addition, the current technology trends and efforts such as A Broad Based Environment for Test (ABBET) require standards that can accommodate an open architecture layered approach to information exchange.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"170 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126938913","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The role of test in total quality management 测试在全面质量管理中的作用
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381544
B. Neblett
{"title":"The role of test in total quality management","authors":"B. Neblett","doi":"10.1109/AUTEST.1994.381544","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381544","url":null,"abstract":"The quality of a delivered product or system is ultimately limited by the quality of its design and manufacturing process. Defects that escape the design, manufacturing, and test processes are delivered to customers. Process Potential Index (Cp) and Process Capability Index (Cpk) are now widely used to express design and manufacturing quality. Design quality may be estimated from product models, if they exist, or measured using parametric test data. The difficulty in using test data is not so much in the calculations, but in the recording, storing, and selection of the data to be used in the calculations, This paper defines the metrics of quality estimation and describes an implementation of a system for estimating defect levels and process capabilities. The implementation includes the definition of a standardized parametric data exchange language for test data and an analytical system to standardize product quality measurement.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126951254","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Automating towards a paperless facility 自动化迈向无纸化设施
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381525
J. Radcliffe, M. Hagler
{"title":"Automating towards a paperless facility","authors":"J. Radcliffe, M. Hagler","doi":"10.1109/AUTEST.1994.381525","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381525","url":null,"abstract":"GDE Systems, Inc.'s Columbus Operation has made major strides in breaking the shackles of the Paper Prison. An integrated database has been developed that does away with dozens of paper forms, and, with one entry, distributes the data to multiple records and reports instantly. The modular database system, which can swiftly be modified, altered and expanded, currently links multiple users to the following systems: Configuration Status Accounting, Hardware Change Control, Master Data Summary, Correspondence Log, GFP/BFP Tracking, and the Integrated Quality System. In a separate effort, Mechanical Engineering has linked to Technical Publications so that drawings, parts lists and schematics can be electronically transferred between SUNs, PCs and Macintoshes. The efficiency gained so far encourages us to continue at an increased pace.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132728574","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：604180095
Book学术官方微信