{"title":"内部/外部测试协调,垂直性和性能指标-系统方法","authors":"J. Scully","doi":"10.1109/AUTEST.1994.381529","DOIUrl":null,"url":null,"abstract":"On-line BIT (built in test) and off-line TPS (test program sets) both suffer from a history of chronic performance deficiencies. Many of these deficiencies can be remedied by more closely coordinating concurrent BIT/TPS development and by applying the same quantitative test performance metrics to both areas under a vertical test design approach.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Internal/external test harmonization, verticality and performance metrics-a systems approach\",\"authors\":\"J. Scully\",\"doi\":\"10.1109/AUTEST.1994.381529\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"On-line BIT (built in test) and off-line TPS (test program sets) both suffer from a history of chronic performance deficiencies. Many of these deficiencies can be remedied by more closely coordinating concurrent BIT/TPS development and by applying the same quantitative test performance metrics to both areas under a vertical test design approach.<<ETX>>\",\"PeriodicalId\":308840,\"journal\":{\"name\":\"Proceedings of AUTOTESTCON '94\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-09-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of AUTOTESTCON '94\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1994.381529\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of AUTOTESTCON '94","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1994.381529","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Internal/external test harmonization, verticality and performance metrics-a systems approach
On-line BIT (built in test) and off-line TPS (test program sets) both suffer from a history of chronic performance deficiencies. Many of these deficiencies can be remedied by more closely coordinating concurrent BIT/TPS development and by applying the same quantitative test performance metrics to both areas under a vertical test design approach.<>