Proceedings of AUTOTESTCON '94最新文献

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Standardizing diagnostic models for system test and diagnosis 标准化诊断模型,用于系统测试和诊断
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381598
J. Sheppard
{"title":"Standardizing diagnostic models for system test and diagnosis","authors":"J. Sheppard","doi":"10.1109/AUTEST.1994.381598","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381598","url":null,"abstract":"Recent standardization activities by the IEEE are focusing on defining test specification languages, services between components of test environments, and most recently, interfaces and interchange formats for intelligent test systems. Currently, the artificial intelligence and expert system tie to automatic test equipment (AI-ESTATE) set of standards (P1232) is defining formats and services for exchanging diagnostic knowledge between reasoners on next generation test systems, In this paper, we describe the theoretical underpinnings of the first knowledge format being standardized by the Data and Knowledge Representation Working Group of AI-ESTATE. We also provide a progress report on the standards activity.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122103679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A flexible maintenance information system for a downsized environment 面向小型化环境的灵活维护信息系统
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381558
K. Cross
{"title":"A flexible maintenance information system for a downsized environment","authors":"K. Cross","doi":"10.1109/AUTEST.1994.381558","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381558","url":null,"abstract":"The computer information systems for the maintenance environment of the future must be flexible enough to accommodate a myriad of platforms that support the information needs generated by constantly changing requirements. As the maintenance community downsizes, the information infrastructure must expand to handle additional capabilities. This paper presents an information system framework that allows the maintenance community to grow from its current inventory of autonomous computers and test equipment, to an integrated network of systems that intelligently control the flow of information.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"128 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115169845","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Tri-service automatic test system R&D program 三服务自动测试系统研发方案
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381580
W. Simpson, R. M. Rolfe
{"title":"Tri-service automatic test system R&D program","authors":"W. Simpson, R. M. Rolfe","doi":"10.1109/AUTEST.1994.381580","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381580","url":null,"abstract":"Recent changes in the state-of-the-art in software development and test instrumentation has provided the Department of Defense with opportunities to reduce the cost of its automatic test systems (automatic test equipment and the software and information required to drive that equipment). In order to guide and enhance this evolution, the three Services (USN, USAF, USA) have developed an automatic test system research and development program consisting of three broad areas; automatic test system functional interface convergence, next generation test environment, and automatic test system modernization methods. This program, when funded, will provide the technology necessary to transition to the open architecture test systems of the future. The balance of this paper covers the eleven identified tasks under these broad areas, and how they form a coordinated, integrated basis for an improved acquisition strategy.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125072420","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
ATLAS language and new instruments technologies: the challenge ATLAS语言和新仪器技术:挑战
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381607
P. Pestana, R. da Silva, J. Marqués
{"title":"ATLAS language and new instruments technologies: the challenge","authors":"P. Pestana, R. da Silva, J. Marqués","doi":"10.1109/AUTEST.1994.381607","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381607","url":null,"abstract":"During last years we are facing a new challenge: The test equipment manufacturers are increasing their instrument features and making the instruments more powerful, meanwhile the C/ATLAS language is 'stuck on the standard' and unable to follow the technology improvement. Solution: Addition to C/ATLAS language of new modifiers to extract all the power of ATE instrumentation. The ATE being developed at OGMA-Portugal (OGMATS), is a good example of coexistence between standard Atlas constructs and extensions regarding the compatibility with the basic language definition. This paper shows some examples of extensions and the advantages. Our objectives are: 1/ maintain C/ATLAS compatibility; 2/take advantage of instrument new features.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"281 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121044329","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
C-17, successful application of existing automatic test equipment C-17,成功应用现有的自动测试设备
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381569
F. Sidhwa, P. Bothello
{"title":"C-17, successful application of existing automatic test equipment","authors":"F. Sidhwa, P. Bothello","doi":"10.1109/AUTEST.1994.381569","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381569","url":null,"abstract":"The C-17 Program utilizes existing B-IB Automatic Test Equipment (ATE). The C-17 decision is in harmony with the Air Force emphasis on reducing proliferation of unique ATE. The ATE selection was made after consideration of cost, performance and supportability tradeoffs. Minimal augmentation of the government inventoried equipment was required which did not affect the existing hardware and software configuration. This approach significantly reduced C-17 program ATE development costs and afforded the program the use of established logistics elements and support structure. The C-17 program demanded concurrency of support structure and aircraft development-the ATE solution met that demand by reducing risks to a manageable level for both test program set development, and Air Force operation and training requirements.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"166 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121968670","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Built-in diagnostics for advanced power management 内置诊断先进的电源管理
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381592
M. Darty, L. Su, C. Bosco
{"title":"Built-in diagnostics for advanced power management","authors":"M. Darty, L. Su, C. Bosco","doi":"10.1109/AUTEST.1994.381592","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381592","url":null,"abstract":"The Army's Diagnostic Analysis and Repair Tool Set (DARTS) is an advanced software product used to perform automated fault diagnostics that results in reduced logistics costs, decreased downtime and enhanced mission performance. DARTS enabled automated, knowledge based fault diagnostics to be embedded in the Advanced Modular Power Control System (AMPCS). AMPCS is an integrated hardware and software product for aerospace power management. DARTS was used in a concurrent engineering design environment as a computer aided engineering tool to optimize the fault detection and fault isolation characteristics of the AMPCS prototype design. Project results indicate a new method for linking the diagnostic knowledge base captured during design with the hardware under development to achieve automated fault isolation throughout the hardware life cycle. A successful demonstration of real-time fault diagnostics was conducted using the AMPCS prototype unit and the DARTS software in a hardware-in-the-loop laboratory system. This project reduced to practice the concept of automated, knowledge based diagnostics for electronic systems.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123815285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Achieving tester independence 实现测试人员独立性
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381601
D. Weiss
{"title":"Achieving tester independence","authors":"D. Weiss","doi":"10.1109/AUTEST.1994.381601","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381601","url":null,"abstract":"Currently, the cost of avionics testing is extremely high. Typically experienced testing costs-as high as 50 percent of the product's cost-are a result of a continual need to reverse engineer at each stage in the product's life cycle to obtain essential information necessary to accomplish testing and the relative inability to reuse information gained at one stage in similar situations during subsequent stages. The root cause of this limited reuse capability is the dependency of the Test Program Set (TPS) on a particular software language, instrument(s) and/or technology. This dependency is manifested by the inability to capitalize on previous investments. In turn, this inability to reuse the components of the TPS causes each developed TPS to be an item of expense, rather than an opportunity to leverage a previous TPS development activity that would render each TPS an investment. This paper discussses a high-level view of some of the key reasons these dependency constraints exist and describes the efforts underway to leverage new programming techniques to turn the \"typical\" TPS development circumstance from an expense to an investment and, ultimately, drive down the cost of avionics testing.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"95 10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126052297","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Direction for growth in automated tools 自动化工具的发展方向
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381532
K.R. Hurley, W. Young
{"title":"Direction for growth in automated tools","authors":"K.R. Hurley, W. Young","doi":"10.1109/AUTEST.1994.381532","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381532","url":null,"abstract":"Government sponsored technology-infusion related to automated tools and their application to military and commercial technologies, such as automotive, airline and consumer systems is presently being planned through the Automatic Test Systems (ATS) strategy. This ATS strategy is proceeding in a direction which includes a DoD and industry organization that will standardize the test interfaces for the application of tools for design, production and support. This standardization relates to the development of an Interface Information Exchange Standard. At present the majority of automated tools operate as stand alone entities not allowing for multiple program application without major modifications tailored to the target system. This paper addresses the requirement to establish and implement standardized interfaces that allow interchangeability, flexibility and reusability of automated tools to satisfy both government and commercial requirements. This paper will also discuss the requirements that must be established to meet the above goals as well as the method of implementation and the contributions required by both government and industry.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126827201","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Standard instrument drivers and soft front panels for VXI systems VXI系统的标准仪表驱动器和软面板
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381549
S. Rust
{"title":"Standard instrument drivers and soft front panels for VXI systems","authors":"S. Rust","doi":"10.1109/AUTEST.1994.381549","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381549","url":null,"abstract":"The VXlplug&play Systems Alliance was formed on September 22, 1993 with the objective of increasing ease of use for end-users of VXI technology. The alliance members share a common commitment to end-user success with open, multivendor VXI systems including both hardware and system-level software. The member companies intend to accomplish major improvements in ease of use by defining and implementing standard frameworks for system-level issues beyond the scope of the baseline VXlbus Specifications. These standard frameworks give end users true \"plug&play\" interoperability. To achieve this vision, the VXlplug&play Systems Alliance has assembled a variety of working groups to address issues such as: technical support, software and hardware installation, fixturing, instrument driver architecture and design, and soft front panels. This paper describes the goals of the Instrument Driver and Soft Front Panel Working Groups, and the hierarchy, model, and other requirements of VXlplug&play instrument drivers and soft front panels.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"97 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128139575","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Monitoring power supply current and using a neural network routine to diagnose circuit faults 监测电源电流并利用神经网络程序诊断电路故障
Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI: 10.1109/AUTEST.1994.381556
L. Kirkland, J. Dean
{"title":"Monitoring power supply current and using a neural network routine to diagnose circuit faults","authors":"L. Kirkland, J. Dean","doi":"10.1109/AUTEST.1994.381556","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381556","url":null,"abstract":"As a circuit is tested, the current drawn from a power supply can vary as different functions are invoked by the test. The current draw can be plotted against time, showing a characteristic trace for the test performed. Sensors in the ATS power supply can be used to monitor the current flow during test execution. Defective components can be classified using a neural network according to the pattern of variation from the \"trace\" of a good card. This can be performed as a background function, with the network gaining in accuracy over time. This paper discusses the neural network routine for diagnosing circuit faults using monitored power supply current.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132024963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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