{"title":"Replacing the HP2100 computer in US Navy test sets","authors":"E. R. Sandy","doi":"10.1109/AUTEST.1994.381585","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381585","url":null,"abstract":"The DOD has a large investment in ATE which has become increasingly difficult and costly to repair due to non-availability of parts and trained maintenance personnel. One example is the AN/DPM-22 Guided Missile Components Test Station, a 1970 vintage test set based on the Hewlett Packard 9500 Automated Test System. In order to increase the service life of the AN/DPM-22, the US Navy opted to replace the Hewlett Packard 2100S computer and its peripherals with an IBM-compatible 80486. One requirement was to retain the existing test equipment, which has an assortment of IEEE Standard 488 compatible and peculiar parallel interfaces. Another requirement was to minimize the software changes. This paper addresses the hardware and software designs which were implemented to achieve those goals.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116147306","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Test strategies for power supplies","authors":"N. Carmichael, C. Camargo, T. Harrison, R. Gomez","doi":"10.1109/AUTEST.1994.381551","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381551","url":null,"abstract":"Functional and diagnostic testing of switching power supplies offers unique challenges. The control loop and the prevalence of destructive and avalanche failure modes make it difficult to analyze and diagnose many failures. Traditional approaches to resting were applied to power supplies and proved inadequate. This paper illustrates, through examples, some of the problems encountered and their solutions. This paper will also discuss the process through which a depot level power supply tester, the Advanced Power Supply Tester (APST), was defined. The tester features a software environment and Graphical User Interface (GUT) provided by LabWindows CVI and FineSoft, hardware consisting of an assembly of laboratory quality instrumentation, and diagnostic tools.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125089214","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"RF/microwave test simulator","authors":"W. Fenton, J. Webber","doi":"10.1109/AUTEST.1994.381510","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381510","url":null,"abstract":"The generation of quality RF/Microwave Test Program Sets (TPS) has always been a technically challenging and expensive task. The lack of an RF/microwave test simulator makes the generation of test and diagnostic vectors a very time consuming task. RF/microwave components exhibit multiple fault modes, i.e. gain, noise figure, etc..., as compared to the \"1\" or \"0\" fault mode of digital circuitry. Also, due to the parametric nature of an RF/microwave device, each failure mode is application specific and forces the development of multiple fault classes. The result has increased TPS costs and stretched schedules when compared to digital testing where test simulators do exist. This paper outlines an approach to developing an RF/microwave Test Simulator. Design simulation software is utilized to provide a behavioral model of the Unit Under Test (UUT). A multi-dimensional fault dictionary is generated based on this behavioral knowledge which enables the tester to consider the multiple fault modes and fault classes in order to achieve \"probeless\" diagnostics.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130225017","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Neural engineering utility with adaptive algorithms","authors":"L. Kirkland, J. D. Wiederholt","doi":"10.1109/AUTEST.1994.381547","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381547","url":null,"abstract":"The neural engineering utility with adaptive algorithms (NEUWAA) is a machine-based intelligence system for automatic test equipment, which integrates various technologies in an adaptive fault-detection environment. Computer enhancements and mathematical algorithms allow for the use of man-machine and intelligent applications. The human/machine interface optimizes the test environment by providing state-of-the-art adaptive algorithms to streamline test sequences and diagnostics. NEUWAA employs state-of-the-art diagnostics methodologies coupled with self-organizing evolution to provide an efficient test environment at any level. Highlighted visual images with dialogue of the unit under test provide interactive fault-isolation including guided-probe sequences to streamline fault/diagnosis. The system is completely interoperable with all other standard software packages. This paper outlines the neural engineering utility with adaptive algorithms system including its various characteristics and the techniques involved in its creation.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129741061","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Cost effectiveness via commonality: generic aviation boresight support for the tri-services","authors":"J.J. Jaklitsch","doi":"10.1109/AUTEST.1994.381522","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381522","url":null,"abstract":"The Advanced Boresight Equipment program was conceived with the vision of producing a single, common system that would meet the current and future aviation boresight requirements for U.S. Army, Navy, and Air Force. By doing so, the many aircraft-unique boresight systems in the current inventory, along with their associated logistical support, could be eliminated, resulting in huge life cycle cost savings throughout the tri-services. The technical challenges in producing a truly generic system are formidable. This paper examines the considerations inherent in designing a single system to meet all the different requirements and environments between the services, and explores the progress of the ABE program towards its objective of a common, cost effective, aviation boresight system.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126304218","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Distributed simulation for live training","authors":"D. B. Fruchey","doi":"10.1109/AUTEST.1994.381560","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381560","url":null,"abstract":"The evolution of simulation now allows the inclusion of digital and man-in-the-loop simulations into the real-world environment. Using the Global Positioning System, real-time data links, interactive visualization tools, advanced simulation techniques, and advanced computer systems, the training environment of the future will include simulations and surrogates representing advanced threat systems, computer controlled forces, and live air, land, sea, and, quite possibly, space based systems. Interactive virtual to real-world participant links provide great opportunities to satisfy the demanding testing end training needs for future systems and users.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122836585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Instrumentation techniques for high-temperature superconductor measurement","authors":"Y.S. Guo","doi":"10.1109/AUTEST.1994.381543","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381543","url":null,"abstract":"Methods of measuring the critical temperature T/sub c/, and the critical current I/sub c/ for high-temperature superconductors are described. The critical temperature T/sub c/ is that at which a normal superconducting transition occurs and is an important parameter in the evaluation of high-temperature superconductors. A four-point resistance measurement is normally used but when the resistance approaches zero, noise and interference dominate the signal. This paper describer how to reduce the noise and interference and extract a signal from the noise. In addition, a new method is described for performing automatic I/sub c/ measurements with an oscilloscope or a voltmeter.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117149033","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Factory to fleet maintenance concept","authors":"D.P. Schulte","doi":"10.1109/AUTEST.1994.381538","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381538","url":null,"abstract":"The recent designation of CASS (Consolidated Automated Support System) as part of DoD's standard family of ATS gives us the opportunity to successfully implement the \"Factory to Fleet\" concept. CASS is a tool that can help meet the challenge of cost effective ATS for DoD in the 21st century. The requirements enhanced maintenance as close to the source as practical. CASS can be a tool to help meet the requirement in a cost effective approach. \"Factory to Fleet\" testing will not occur on its own. It will require detailed planning early in the product life to develop an integrated development/test strategy that allows for factory acceptance testing, TPS development and life cycle support. Testability/diagnostics and life cycle maintenance must be integrated into the design process. Cooperation and communication between the program acquisition requirements and the OEM must be achieved. Successful implementation can provide significant marketing advantages both domestically and foreign.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132012692","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Test station controller replacement using commercial products","authors":"C. S. Scherer, R.J. Osman, S.L. Vasquez","doi":"10.1109/AUTEST.1994.381583","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381583","url":null,"abstract":"Some existing test stations have controllers which have become obsolete or difficult to maintain. The controllers may be replaced by commercially available hardware and software. However, existing Test Program Sets (TPSs) may not run on the new platform without modification. Southwest Research Institute (SwRI) is evaluating the feasibility of replacing the existing controller in the Depot Automatic Test System for Avionics (DATSA) test stand with a personal computer (PC). Commercial software products which can replace the old Modular Automatic Test Equipment (MATE) operating system will be evaluated. Since many TPSs use Non-ATLAS Modules (NAMs), further testing will be done with TPSs using NAMs rehosted to the PC environment. Compatibility problems between existing TPSs and the proposed new configuration will be identified and the overall cost of replacing the DATSA controller will be analyzed.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127050391","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Software Interface for Communication Media: a new component standard","authors":"E.E. Cashar, J.J. Kasprick, M. Kihara","doi":"10.1109/AUTEST.1994.381602","DOIUrl":"https://doi.org/10.1109/AUTEST.1994.381602","url":null,"abstract":"The subcommittee working under the IEEE Project Authorization Request (PAR) 1226 has begun work on a new component standard P1226.5 \"Software Interface for Communications Media (SICM)\". SICM is part of the architecture defined by A Broad Based Environment for Test (ABBET). This standard defines a set of services to control and exchange data with devices. A device in this context is typically an instrument but may apply to another computer or a peripheral such as a printer. This paper is a description of the SICM component standard. This standard provides a general description of a set of services in a language independent format.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"158 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123413560","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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