{"title":"Instrumentation techniques for high-temperature superconductor measurement","authors":"Y.S. Guo","doi":"10.1109/AUTEST.1994.381543","DOIUrl":null,"url":null,"abstract":"Methods of measuring the critical temperature T/sub c/, and the critical current I/sub c/ for high-temperature superconductors are described. The critical temperature T/sub c/ is that at which a normal superconducting transition occurs and is an important parameter in the evaluation of high-temperature superconductors. A four-point resistance measurement is normally used but when the resistance approaches zero, noise and interference dominate the signal. This paper describer how to reduce the noise and interference and extract a signal from the noise. In addition, a new method is described for performing automatic I/sub c/ measurements with an oscilloscope or a voltmeter.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of AUTOTESTCON '94","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1994.381543","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Methods of measuring the critical temperature T/sub c/, and the critical current I/sub c/ for high-temperature superconductors are described. The critical temperature T/sub c/ is that at which a normal superconducting transition occurs and is an important parameter in the evaluation of high-temperature superconductors. A four-point resistance measurement is normally used but when the resistance approaches zero, noise and interference dominate the signal. This paper describer how to reduce the noise and interference and extract a signal from the noise. In addition, a new method is described for performing automatic I/sub c/ measurements with an oscilloscope or a voltmeter.<>