多信号流图:一种新的系统可测试性分析和故障诊断方法

Proceedings of AUTOTESTCON '94 Pub Date : 1994-09-20 DOI:10.1109/AUTEST.1994.381596

S. Deb, K. Pattipati, V. Raghavan, M. Shakeri, R. Shrestha

{"title":"多信号流图:一种新的系统可测试性分析和故障诊断方法","authors":"S. Deb, K. Pattipati, V. Raghavan, M. Shakeri, R. Shrestha","doi":"10.1109/AUTEST.1994.381596","DOIUrl":null,"url":null,"abstract":"In this paper, we present a comprehensive methodology for a formal, but intuitive, cause-effect dependency modeling using multi-signal directed graphs that correspond closely to hierarchical system schematics and develop diagnostic strategies to isolate faults in the shortest possible time without making the unrealistic single fault assumption. A key feature of our methodology is that our models lend naturally to real-world necessities, such as system integration and hierarchical troubleshooting.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"233","resultStr":"{\"title\":\"Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis\",\"authors\":\"S. Deb, K. Pattipati, V. Raghavan, M. Shakeri, R. Shrestha\",\"doi\":\"10.1109/AUTEST.1994.381596\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we present a comprehensive methodology for a formal, but intuitive, cause-effect dependency modeling using multi-signal directed graphs that correspond closely to hierarchical system schematics and develop diagnostic strategies to isolate faults in the shortest possible time without making the unrealistic single fault assumption. A key feature of our methodology is that our models lend naturally to real-world necessities, such as system integration and hierarchical troubleshooting.<<ETX>>\",\"PeriodicalId\":308840,\"journal\":{\"name\":\"Proceedings of AUTOTESTCON '94\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-09-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"233\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of AUTOTESTCON '94\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1994.381596\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of AUTOTESTCON '94","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1994.381596","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 233

摘要

在本文中，我们提出了一种全面的方法，使用与分层系统原理图密切相关的多信号有向图进行形式化但直观的因果关系建模，并制定了诊断策略，以便在尽可能短的时间内隔离故障，而不会做出不切实际的单一故障假设。我们方法论的一个关键特征是，我们的模型自然地适用于现实世界的需要，例如系统集成和分层故障排除

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Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis

In this paper, we present a comprehensive methodology for a formal, but intuitive, cause-effect dependency modeling using multi-signal directed graphs that correspond closely to hierarchical system schematics and develop diagnostic strategies to isolate faults in the shortest possible time without making the unrealistic single fault assumption. A key feature of our methodology is that our models lend naturally to real-world necessities, such as system integration and hierarchical troubleshooting.<>

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Proceedings of AUTOTESTCON '94

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