S. Deb, K. Pattipati, V. Raghavan, M. Shakeri, R. Shrestha
{"title":"Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis","authors":"S. Deb, K. Pattipati, V. Raghavan, M. Shakeri, R. Shrestha","doi":"10.1109/AUTEST.1994.381596","DOIUrl":null,"url":null,"abstract":"In this paper, we present a comprehensive methodology for a formal, but intuitive, cause-effect dependency modeling using multi-signal directed graphs that correspond closely to hierarchical system schematics and develop diagnostic strategies to isolate faults in the shortest possible time without making the unrealistic single fault assumption. A key feature of our methodology is that our models lend naturally to real-world necessities, such as system integration and hierarchical troubleshooting.<<ETX>>","PeriodicalId":308840,"journal":{"name":"Proceedings of AUTOTESTCON '94","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-09-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"233","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of AUTOTESTCON '94","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1994.381596","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 233
Abstract
In this paper, we present a comprehensive methodology for a formal, but intuitive, cause-effect dependency modeling using multi-signal directed graphs that correspond closely to hierarchical system schematics and develop diagnostic strategies to isolate faults in the shortest possible time without making the unrealistic single fault assumption. A key feature of our methodology is that our models lend naturally to real-world necessities, such as system integration and hierarchical troubleshooting.<>