Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects最新文献

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Analysis of PCB Discontinuities Using FD-TD and Wavelets 基于FD-TD和小波的PCB不连续分析
Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects Pub Date : 2002-05-12 DOI: 10.1109/SPI.2002.258301
R. Araneo, S. Celozzi, S. Barmada, Marco Raugi
{"title":"Analysis of PCB Discontinuities Using FD-TD and Wavelets","authors":"R. Araneo, S. Celozzi, S. Barmada, Marco Raugi","doi":"10.1109/SPI.2002.258301","DOIUrl":"https://doi.org/10.1109/SPI.2002.258301","url":null,"abstract":"A wavelet-based technique is proposed for the extraction of a two-port equivalent circuit of typical printed circuit board (PCB) discontinuities from full-wave FD-TD results. An equivalent representation in the wavelet domain of the discontinuity is obtained by expanding the computed time domain quantities. Hence the wavelet transformed scattering parameters can be included in a wavelet equivalent of TEM wave propagation paths along the PCB in order to obtain an overall equivalent of the entire structure. The wavelet representation drastically minimizes the CPU time and computer storage requirements while maintaining excellent accuracy, so that it proves to be a very useful modeling tool especially in the design stage.","PeriodicalId":290013,"journal":{"name":"Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects","volume":"108 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122523375","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Signal Integrity Design for High-Performance, Low-Cost Interconnects and Optoelectronics 高性能、低成本互连和光电子学的信号完整性设计
Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects Pub Date : 2002-05-12 DOI: 10.1109/SPI.2002.258275
J. Nickel, S. Crane, Myoung-soo Jeon, Ton Wang, Z. Horvath, Sangwook Lee, Andreas Cangellaris Cangellari
{"title":"Signal Integrity Design for High-Performance, Low-Cost Interconnects and Optoelectronics","authors":"J. Nickel, S. Crane, Myoung-soo Jeon, Ton Wang, Z. Horvath, Sangwook Lee, Andreas Cangellaris Cangellari","doi":"10.1109/SPI.2002.258275","DOIUrl":"https://doi.org/10.1109/SPI.2002.258275","url":null,"abstract":"We present enabling technologies for the high-speed highperformance optical and electronic components market. While signal integrity requirements are paramount to these interconnect and packages, design must include other critical multidisciplinary considerations such as manufacturing, hermeticity, optical alignment, thermal dissipation, and most importantly, cost.","PeriodicalId":290013,"journal":{"name":"Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132219285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Non-Ideal Frequency Dependent Loss In Realistic PCB Transmission Lines 实际PCB传输线的非理想频率相关损耗
Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects Pub Date : 2002-05-12 DOI: 10.1109/SPI.2002.258282
J. McCall, D. Shykind
{"title":"Non-Ideal Frequency Dependent Loss In Realistic PCB Transmission Lines","authors":"J. McCall, D. Shykind","doi":"10.1109/SPI.2002.258282","DOIUrl":"https://doi.org/10.1109/SPI.2002.258282","url":null,"abstract":"Digital signaling frequencies are approaching the GHz range for a variety of CPU, memory and peripheral interconnect schemes. The portions of timing budgets allocated to chip-to-chip interfaces are becoming concomitantly smaller, making accurate high-frequency characterization of physical layer components critical to robust HVM designs. At GHz frequencies the primary contributor to the physical layer timing budget is inter-symbol interference (ISI), which is a strong function of transmission line loss. This loss is dependent on the physical properties of the package and/or board materials, which exhibit batch-to-batch and vendor-to-vendor variation. Understanding these variations is imperative to close modeling gaps and enable predictable system designs. This document describes a simple, sparameter based measurement method for extracting RLGC parameters and presents results showing the impact of copper roughness and dielectric loss as functions of frequency for a variety of common PCB materials.","PeriodicalId":290013,"journal":{"name":"Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134130380","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Imperfect Return Path Effects on RLCG Model of Single and Coupled Interconnects: Propagation delay, Rise Time and Crosstalk Prediction 不完全返回路径对RLCG模型的影响:传播延迟、上升时间和串扰预测
Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects Pub Date : 2002-05-12 DOI: 10.1109/SPI.2002.258279
J. Legier, E. Paleczny, K. Bouazzati, D. Deschachi, F. Huret
{"title":"Imperfect Return Path Effects on RLCG Model of Single and Coupled Interconnects: Propagation delay, Rise Time and Crosstalk Prediction","authors":"J. Legier, E. Paleczny, K. Bouazzati, D. Deschachi, F. Huret","doi":"10.1109/SPI.2002.258279","DOIUrl":"https://doi.org/10.1109/SPI.2002.258279","url":null,"abstract":"If we take a look at the latest ITRS 2001 edition[1], we will realize the number and difficulties of technical challenges the semiconductor industry must solve. Traditional scaling which has been at the basis of the semi conductor industry during these last three decades is indeed beginning to show limits in CMOS planar process as well as in connecting each elementary active device. The new edition roadmap highlight the need of modeling lithography technology, deposition and etch variation across a wafer, and simulating gate stack and ultra shallow dopant distributions, and junctions. Extensive studies are also required in high frequency circuit modeling. Efficient simulation of full chip interconnect delay is also needed as well as 3D transmission line interconnect simulation.","PeriodicalId":290013,"journal":{"name":"Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132714137","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
LFSR Test Pattern Crosstalk in Nanometer Technologies 纳米技术中LFSR测试模式串扰
Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects Pub Date : 2002-05-12 DOI: 10.1109/SPI.2002.258315
D. Treytnar, M. Redeker, H. Grabinski, F. Ktata
{"title":"LFSR Test Pattern Crosstalk in Nanometer Technologies","authors":"D. Treytnar, M. Redeker, H. Grabinski, F. Ktata","doi":"10.1109/SPI.2002.258315","DOIUrl":"https://doi.org/10.1109/SPI.2002.258315","url":null,"abstract":"In this paper we investigate the crosstalk influence of interconnects on test patterns in integrated circuits in today and future technologies. The test patterns are produced by a linear feedback shift register (LFSR). We show the per unit length line parameters L’, C’ and R’ of interconnects in 150 nm down to 35 nm technologies wherefore we assume the smallest geometries predicted by the SIA roadmap. Using these parameters we demonstrate that crosstalk influences the signal behaviour depending on the technology used. The test patterns were generated by a 5 bit LFSR using an interconnect system with a length of 1 mm in these future technologies.","PeriodicalId":290013,"journal":{"name":"Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131804236","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Influence of the Cross Sectional Shape of Board-integrated Optical Waveguides on the Propagation Characteristics 板集成光波导截面形状对传输特性的影响
Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects Pub Date : 2002-05-12 DOI: 10.1109/SPI.2002.258273
T. Bierhoff, Y. Sonmez, J. Schrage, A. Himmler, E. Griese, G. Mrozynski
{"title":"Influence of the Cross Sectional Shape of Board-integrated Optical Waveguides on the Propagation Characteristics","authors":"T. Bierhoff, Y. Sonmez, J. Schrage, A. Himmler, E. Griese, G. Mrozynski","doi":"10.1109/SPI.2002.258273","DOIUrl":"https://doi.org/10.1109/SPI.2002.258273","url":null,"abstract":"The influence of the cross s ectional shape of highly multimode optical step-index waveguides on the attenuation is analyzed by an advanced ray tracing method, which is able to take mode coupling and additional losses due to surface roughness into account. Straight waveguides with trapezoidal crosssections, characterized by different tilt angles are investigated and their static propagation characteristic is compared to that of a waveguide with a rectangular cross-section.","PeriodicalId":290013,"journal":{"name":"Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132421941","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
S-Parameter Macromodels Incorporated into FDTD Simulation of Transmission Line Networks 输电线网络时域有限差分仿真中的s参数宏模型
Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects Pub Date : 2002-05-12 DOI: 10.1109/SPI.2002.258270
I. Rumsey, G. Emili, M. Piket-May
{"title":"S-Parameter Macromodels Incorporated into FDTD Simulation of Transmission Line Networks","authors":"I. Rumsey, G. Emili, M. Piket-May","doi":"10.1109/SPI.2002.258270","DOIUrl":"https://doi.org/10.1109/SPI.2002.258270","url":null,"abstract":"The Finite Difference Time Domain (FDTD) method for the numerical solution of Maxwell’s equations is widely used for simulation of microwave and high speed digital circuits. Frequently, large scale circuit simulations include features whose electromagnetic behavior is desired to be found, interconnected by networks whose behavior is known a priori, either through measurement, simulation, or analytical models. If the known, “circuit-like” parts of the problem can be separated from the pertinent electromagnetic features and replaced by behavioral macromodels, computational savings a can be realized. The technique presented allows for these “circuit-like” components to be described by macromodels based on the S-parameters at their connection points and integrated into an FDTD simulation. This technique is applicable to a class of problems composed of a mixture of circuit and electromagnetic features, where the known behavior of the circuit features can be separated from the other electromagnetic interests. 1 Macromodeling Macromodeling is a common practice in circuit simulation, where a complex system is represented by a simplified model at its connection points. Logic circuits or operational amplifiers are frequently encountered examples of macromodels. Methods for extracting low-order models of complex systems is an active area of research which is being investigated by a number of researchers [1]. The method presented here uses established extraction techniques to derive transfer functions, and then seeks to plug those derived macromodels back into the FDTD method to enable system level simulation of large circuits.","PeriodicalId":290013,"journal":{"name":"Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114965644","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Simulation and Measurement of Interconnect Structures for High Speed Digital Systems
Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects Pub Date : 2002-05-12 DOI: 10.1109/SPI.2002.258305
M. Nisznansky, C. Ziegler, S. Martius, L. Schmidt, J.muller
{"title":"Simulation and Measurement of Interconnect Structures for High Speed Digital Systems","authors":"M. Nisznansky, C. Ziegler, S. Martius, L. Schmidt, J.muller","doi":"10.1109/SPI.2002.258305","DOIUrl":"https://doi.org/10.1109/SPI.2002.258305","url":null,"abstract":"Results of electromagnetic simulations and measurements of simple interconnect structure are discussed in this paper. The presented structure was realised on LTCC multilayer board which are suitable for manufacturing of multichip modules for next generation communication systems with clock rates in the 10-100 GHz range. From the presented results it is possible to obtain an impression about distortion of high speed digital signals after passing this or similar interconnect structures. Precision microwave measurement techniques that are important for verification of such simulations are discussed, too.","PeriodicalId":290013,"journal":{"name":"Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126006466","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Crosstalk and Delay Optimization via Neural Net-Based Topological Decomposition of 3D Interconnect 基于神经网络的三维互连拓扑分解串扰和延迟优化
Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects Pub Date : 2002-05-12 DOI: 10.1109/SPI.2002.258298
A. Ilumoka, B. Kalla, V. Venkatraman
{"title":"Crosstalk and Delay Optimization via Neural Net-Based Topological Decomposition of 3D Interconnect","authors":"A. Ilumoka, B. Kalla, V. Venkatraman","doi":"10.1109/SPI.2002.258298","DOIUrl":"https://doi.org/10.1109/SPI.2002.258298","url":null,"abstract":"","PeriodicalId":290013,"journal":{"name":"Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124705044","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Field Theoretic Description of TEM-Waves on Lossless Multiconductor Transmission Lines 无损多导体传输线上tem波的场论描述
Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects Pub Date : 2002-05-12 DOI: 10.1109/SPI.2002.258291
A. Reibiger
{"title":"Field Theoretic Description of TEM-Waves on Lossless Multiconductor Transmission Lines","authors":"A. Reibiger","doi":"10.1109/SPI.2002.258291","DOIUrl":"https://doi.org/10.1109/SPI.2002.258291","url":null,"abstract":"We present a proof that an electromagnetic field is a TEM wave on a lossless multiconductor transmission line if and on ly if the a ssociated conductor voltages and currents obey the transmission line equations. A corollary of this result shows that t he flow of the Poynting v ector f ield through a c ross section of such a transmission line is equal to the sum of the products of the conductor voltages and currents. Additionally we give a proof of the relationship LC = eμE between the matrices of inductances and capacitances per length which is based on the theory of holomorphic functions.","PeriodicalId":290013,"journal":{"name":"Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130746876","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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