Non-Ideal Frequency Dependent Loss In Realistic PCB Transmission Lines

J. McCall, D. Shykind
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引用次数: 4

Abstract

Digital signaling frequencies are approaching the GHz range for a variety of CPU, memory and peripheral interconnect schemes. The portions of timing budgets allocated to chip-to-chip interfaces are becoming concomitantly smaller, making accurate high-frequency characterization of physical layer components critical to robust HVM designs. At GHz frequencies the primary contributor to the physical layer timing budget is inter-symbol interference (ISI), which is a strong function of transmission line loss. This loss is dependent on the physical properties of the package and/or board materials, which exhibit batch-to-batch and vendor-to-vendor variation. Understanding these variations is imperative to close modeling gaps and enable predictable system designs. This document describes a simple, sparameter based measurement method for extracting RLGC parameters and presents results showing the impact of copper roughness and dielectric loss as functions of frequency for a variety of common PCB materials.
实际PCB传输线的非理想频率相关损耗
对于各种CPU、内存和外设互连方案,数字信号频率正在接近GHz范围。分配给芯片到芯片接口的时间预算部分也随之变得越来越小,这使得物理层组件的准确高频特性对稳健的HVM设计至关重要。在GHz频率下,影响物理层时序预算的主要因素是码间干扰(ISI),它是传输线损耗的一个重要函数。这种损耗取决于封装和/或电路板材料的物理特性,这些特性表现出批次之间和供应商之间的差异。理解这些变化对于缩小建模差距和实现可预测的系统设计至关重要。本文描述了一种简单的,基于参数的测量方法,用于提取RLGC参数,并给出了显示铜粗糙度和介电损耗作为各种常见PCB材料频率函数的影响的结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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