2010 IEEE Radiation Effects Data Workshop最新文献_第3页

Commercially Designed and Manufactured SDRAM SEE Data 商业设计和制造的SDRAM SEE数据

2010 IEEE Radiation Effects Data Workshop Pub Date : 2010-07-20 DOI: 10.1109/REDW.2010.5619497

C. Hafer, M. Von Thun, M. Leslie, F. Sievert, A. Jordan

引用次数: 3

Radiation Performance of Commercial SiGe HBT BiCMOS High Speed Operational Amplifiers 商用SiGe HBT BiCMOS高速运算放大器的辐射性能

2010 IEEE Radiation Effects Data Workshop Pub Date : 2010-07-20 DOI: 10.1109/REDW.2010.5619511

Dakai Chen, J. Pellish, A. Phan, Hak Kim, Sam Burns, Rafi Albarian, Bruce Holcombe, Bradley Little, J. Salzman, P. Marshall, K. Label

引用次数: 5

The Effects of ELDRS at Ultra-Low Dose Rates 超低剂量率下ELDRS的作用

2010 IEEE Radiation Effects Data Workshop Pub Date : 2010-07-20 DOI: 10.1109/REDW.2010.5619506

Dakai Chen, J. Forney, R. Pease, A. Phan, M. Carts, S. R. Cox, K. Kruckmeyer, Sam Burns, Rafi Albarian, Bruce Holcombe, Bradley Little, J. Salzman, G. Chaumont, Herve Duperray, A. Ouellet, K. Label

引用次数: 16

SEU Testing of SiGe Bipolar and BiCMOS Circuits SiGe双极和BiCMOS电路的SEU测试

2010 IEEE Radiation Effects Data Workshop Pub Date : 2010-07-20 DOI: 10.1109/REDW.2010.5619701

D. L. Hansen, A. Le, Kay Chesnut, E. Miller, S. Pong, Sichul Sung, J. Truong

引用次数: 1

Compendium of Test Results of Recent Single Event Effect Tests Conducted by the Jet Propulsion Laboratory 喷气推进实验室最近进行的单事件效应试验结果汇编

2010 IEEE Radiation Effects Data Workshop Pub Date : 2010-07-19 DOI: 10.1109/REDW.2010.5619495

S. McClure, G. Allen, F. Irom, L. Scheick, P. Adell, T. Miyahira

引用次数: 5

Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA NASA候选航天器电子器件当前单事件效应汇编

2010 IEEE Radiation Effects Data Workshop Pub Date : 2009-07-20 DOI: 10.1109/REDW.2010.5619494

M. O’Bryan, K. Label, J. Pellish, Dakai Chen, J. Lauenstein, C. Marshall, R. Ladbury, T. Oldham, Hak S. Kim, A. Phan, M. Berg, M. Carts, A. Sanders, S. Buchner, P. Marshall, M. Xapsos, F. Irom, L. Pearce, E. T. Thomson, T. Bernard, H. W. Satterfield, A. P. Williams, N. V. van Vonno, J. Salzman, Sam Burns, Rafi Albarian

引用次数: 16

Single Event Upset Characterization of the Virtex-5 Field Programmable Gate Array Using Proton Irradiation Virtex-5现场可编程门阵列的质子辐照单事件扰动表征

2010 IEEE Radiation Effects Data Workshop Pub Date : 1900-01-01 DOI: 10.1109/redw.2010.5619490

D. Hiemstra, G. Battiston, Prab Gill

引用次数: 35

Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA NASA候选航天器电子设备总电离剂量和位移损伤简编

2010 IEEE Radiation Effects Data Workshop Pub Date : 1900-01-01 DOI: 10.1109/redw.2010.5619507

Donna J. Cochran, Dakai Chen, T. Oldham, A. Sanders, Hak S. Kim, M. Campola, S. Buchner, K. Label, C. Marshall, J. Pellish, M. Carts, M. O’Bryan

引用次数: 11