NASA候选航天器电子器件当前单事件效应汇编

2010 IEEE Radiation Effects Data Workshop Pub Date : 2009-07-20 DOI:10.1109/REDW.2010.5619494

M. O’Bryan, K. Label, J. Pellish, Dakai Chen, J. Lauenstein, C. Marshall, R. Ladbury, T. Oldham, Hak S. Kim, A. Phan, M. Berg, M. Carts, A. Sanders, S. Buchner, P. Marshall, M. Xapsos, F. Irom, L. Pearce, E. T. Thomson, T. Bernard, H. W. Satterfield, A. P. Williams, N. V. van Vonno, J. Salzman, Sam Burns, Rafi Albarian

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引用次数: 16

摘要

我们提出了单事件效应(SEE)测试和分析的结果，研究了辐射对电子器件的影响。本文是对试验结果的总结。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.

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2010 IEEE Radiation Effects Data Workshop

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