NASA候选航天器电子设备总电离剂量和位移损伤简编

2010 IEEE Radiation Effects Data Workshop Pub Date : 1900-01-01 DOI:10.1109/redw.2010.5619507

Donna J. Cochran, Dakai Chen, T. Oldham, A. Sanders, Hak S. Kim, M. Campola, S. Buchner, K. Label, C. Marshall, J. Pellish, M. Carts, M. O’Bryan

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引用次数: 11

摘要

研究了多种候选航天器电子器件对总电离剂量和位移损伤的易损性。测试的器件包括光电子、数字、模拟、线性双极器件和混合器件。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA

Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.

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2010 IEEE Radiation Effects Data Workshop

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