喷气推进实验室最近进行的单事件效应试验结果汇编

2010 IEEE Radiation Effects Data Workshop Pub Date : 2010-07-19 DOI:10.1109/REDW.2010.5619495

S. McClure, G. Allen, F. Irom, L. Scheick, P. Adell, T. Miyahira

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引用次数: 5

摘要

本文报道了最近对多种微电子器件进行的重离子和质子诱导的单事件效应(SEE)测试结果。该纲要涵盖了喷气推进实验室在过去两年中测试的设备。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Compendium of Test Results of Recent Single Event Effect Tests Conducted by the Jet Propulsion Laboratory

This paper reports heavy ion and proton-induced single event effect (SEE) results from recent tests for a variety of microelectronic devices. The compendium covers devices tested over the last two years by the Jet Propulsion Laboratory.

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2010 IEEE Radiation Effects Data Workshop

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