22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)最新文献_第4页

Comparing fail-safe microcontroller architectures in light of IEC 61508 根据IEC 61508比较故障安全微控制器体系结构

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.63

R. Mariani, P. Fuhrmann

引用次数: 15

Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines 考虑相邻线路的开路故障测试生成与诊断测试生成

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.11

Hiroshi Takahashi, Y. Higami, Toru Kikkawa, T. Aikyo, Y. Takamatsu, H. Yotsuyanagi, M. Hashizume

引用次数: 7

A Functional Verification based Fault Injection Environment 基于功能验证的故障注入环境

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.31

A. Benso, A. Bosio, S. Carlo, R. Mariani

引用次数: 23

Test Generation for Single and Multiple Stuck-at Faults of a Combinational Circuit Designed by Covering Shared ROBDD with CLBs 用clb覆盖共享ROBDD设计的组合电路单卡故障和多卡故障的测试生成

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.42

A. Matrosova, Ekaterina Loukovnikova, S. Ostanin, Alexandra Zinchuk, E. Nikolaeva

引用次数: 9

Estimation of Electromigration-Aggravating Narrow Interconnects Using a Layout Sensitivity Model 利用布局灵敏度模型估计电迁移加剧的窄互连

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.12

R. Ghaida, P. Zarkesh-Ha

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引用次数: 5

Soft Error Hardening for Asynchronous Circuits 异步电路的软错误加固

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.15

W. Kuang, C.M. Ibarra, P. Zhao

引用次数: 15

Semi-Concurrent On-Line Testing of Transition Faults Through Output Response Comparison of Identical Circuits 基于相同电路输出响应比较的过渡故障半并发在线检测

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.10

I. Pomeranz, S. Reddy

引用次数: 3

Effective Checkpoint and Rollback Using Hardware/OS Collaboration 使用硬件/操作系统协作的有效检查点和回滚

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.48

P. Michele, L. Regis

引用次数: 2

Probabilistic Analysis of a Molecular Quantum-Dot Cellular Automata Adder 分子量子点元胞自动机加法器的概率分析

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.39

T. J. Dysart, P. Kogge

引用次数: 42

Spare Parts in Analog Circuits: a Filter Example 模拟电路中的备件:一个滤波器的例子

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.13

Erik Schüler, A. Souza, L. Carro

引用次数: 4