G. Xenoulis, M. Psarakis, D. Gizopoulos, A. Paschalis
{"title":"On-Line Periodic Self-Testing of High-Speed Floating-Point Units in Microprocessors","authors":"G. Xenoulis, M. Psarakis, D. Gizopoulos, A. Paschalis","doi":"10.1109/DFT.2007.32","DOIUrl":"https://doi.org/10.1109/DFT.2007.32","url":null,"abstract":"On-line periodic testing of microprocessors is a viable low-cost alternative for a wide variety of embedded systems which cannot afford hardware or software redundancy techniques but necessitate the detection of intermittent or permanent faults. Low-cost, on-line periodic testing has been previously applied to the integer datapaths of microprocessors but not to their high-performance real number processing counterparts consisting of sophisticated high-speed floating-point (FP) units. In this paper, we present, an effective on-line periodic self-testing methodology for high-speed FP units and demonstrate it on high-speed FP adders/subtracters of both single and double precision. The proposed self-test code development methodology leads to compact self-test routines that exploit the integer part of the processors instruction set architecture to apply test sets to the FP subsystem periodically. The periodic self-test routines exhibit very low memory storage requirements along with a very small number of memory references which are both fundamental requirements for on-line periodic testing. A comprehensive set of experiments on both single and double precision FP units including pipelined versions, and on a RISC processor with a complete FP unit demonstrate the efficacy of the methodology in terms of very high fault coverage and low memory footprint thus rendering the proposed methodology highly appropriate for on-line periodic testing.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"1228 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120939767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Alderighi, F. Casini, S. D'Angelo, M. Mancini, S. Pastore, G. Sechi, R. Weigand
{"title":"Evaluation of Single Event Upset Mitigation Schemes for SRAM based FPGAs using the FLIPPER Fault Injection Platform","authors":"M. Alderighi, F. Casini, S. D'Angelo, M. Mancini, S. Pastore, G. Sechi, R. Weigand","doi":"10.1109/DFT.2007.45","DOIUrl":"https://doi.org/10.1109/DFT.2007.45","url":null,"abstract":"SRAM based reprogrammable FPGAs are sensitive to radiation-induced single event upsets (SEU), not only in their user flip-flops and memory, but also in the configuration memory. Appropriate mitigation has to be applied if they are used in space, for example the XTMR scheme implemented by the Xilinx TMRTool and configuration scrubbing. The FLIPPER fault injection platform, described in this paper, allows testing the efficiency of the SEU mitigation scheme. FLIPPER emulates SEU-like faults by doing partial reconfiguration and then applies stimuli derived from HDL simulation (VHDL/Verilog test-bench), while comparing the outputs with the golden pattern, also derived from simulation. FLIPPER has its device-under-test (DUT) FPGA on a mezzanine board, allowing an easy exchange of the DUT device. Results from a test campaign are presented using a design from space application and applying various levels of TMR mitigation.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116299093","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"RAM-based fault tolerant state machines for FPGAs","authors":"L. Frigerio, F. Salice","doi":"10.1109/DFT.2007.33","DOIUrl":"https://doi.org/10.1109/DFT.2007.33","url":null,"abstract":"The paper presents a solution to protect FSM implemented on FPGAs from SEU, exploiting the embedded memories available in modern FPGA devices and a Hamming code for error detection and correction. A fault tolerant FSM architecture is presented, along with a generator to automate the FSM implementation. Experimental results show that this solution is particularly suited especially when FSMs with a large number of outputs are present in the target design.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124021451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Fault Tolerant SoC Architecture Design for JPEG2000 using Partial Reconfigurability","authors":"A. Doumar, Kentaroh Katoh, Hideo Ito","doi":"10.1109/DFT.2007.37","DOIUrl":"https://doi.org/10.1109/DFT.2007.37","url":null,"abstract":"In this paper, we present the design of a new architecture tolerating faults for the Image compression standard JPEG2000. The proposed fault tolerant design is based on adding a new reconfigurable core to the rest of the cores of the SoC. When a fault happens, it is tolerated using this reconfigurable core. The paper explains the hardware architecture allowing this inter-core communication toward fault tolerance. The target is to achieve a good reliability by this fault tolerance strategy and in the same time achieve the required speed allowing to the JPEG2000 to deal with video rather than still Image compression. The high speed is implemented using an optimized data organization and memories arrangement for the computation consuming blocks of the JPEG2000. The operating speed of the proposed architecture is 125 MHz for ALTERA FPGA implementation. The proposed architecture has increased the speed by a factor of 1.5, when compared to similar memory requiring architectures and decreased the memory requirement by a factor of 1.2, when compared to similar speed requiring architectures. Additionally, the proposed architecture achieves 91.45% fault coverage and it requires only 21% hardware overhead. The architecture has an optimum latency of 78.8 seconds corresponding to an optimum test sequence of n=985. The VHDL implementation of the six blocks of JPEG2000, corresponding to the full chain, has been developed and successfully validated on various types of ALTERA FPGA.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117233372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Evaluation of Register-Level Protection Techniques for the Advanced Encryption Standard by Multi-Level Fault Injections","authors":"P. Maistri, P. Vanhauwaert, R. Leveugle","doi":"10.1109/DFT.2007.41","DOIUrl":"https://doi.org/10.1109/DFT.2007.41","url":null,"abstract":"Some protection techniques had been previously proposed for encryption blocks and applied to an AES encryption IP described at RT Level. One of these techniques had been validated by purely functional fault injections (i.e. algorithmic-level fault injections) against single- and multiple- bit errors. RT-Level fault injections have been performed recently on a few AES IPs and this paper summarizes the main results obtained, highlighting the new results and comparing the outcomes of the two fault injection levels.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116178148","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Fault Tolerant Source Routing for Network-on-chip","authors":"Young Bok Kim, Yong-Bin Kim","doi":"10.1109/DFT.2007.14","DOIUrl":"https://doi.org/10.1109/DFT.2007.14","url":null,"abstract":"This paper presents a new routing protocol of network-on-chip(Noc) called \"Source Routing for Noc\" (SRN) for fault tolerant communication of Systems-on-chip(Soc). The proposed SRN algorithm is composed of two mechanisms of route discovery and route maintenance to allow nodes to discover and maintain source routes to arbitrary destinations in Noc, and all aspects of the protocol operate entirely on-demand allowing the routing packet overhead to scale automatically based on its need. The SNR algorithm in this paper demonstrates up to 50 % more fault tolerance comparing with the conventional algorithms. This new method can be easily adapted and implemented with lower cost due to less hardware overhead in SoC that integrate a large number of communicating IP cores.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125965040","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Armin Alaghi, Naghmeh Karimi, Mahshid Sedghi, Z. Navabi
{"title":"Online NoC Switch Fault Detection and Diagnosis Using a High Level Fault Model","authors":"Armin Alaghi, Naghmeh Karimi, Mahshid Sedghi, Z. Navabi","doi":"10.1109/DFT.2007.55","DOIUrl":"https://doi.org/10.1109/DFT.2007.55","url":null,"abstract":"This paper presents an efficient method for online testing of NoC switches. This method deals with control faults of NoC switches; i.e. the routing faults which cause NoC packets to be sent to output ports not intended to. A high level fault model has been proposed in this paper to model switch routing faults. The proposed method is evaluated by fault simulation that is based on our high-level fault model. This simulation and evaluation environment is modeled at the transaction level in VHDL.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126195902","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
G. Beltrame, C. Bolchini, L. Fossati, A. Miele, D. Sciuto
{"title":"A Framework for Reliability Assessment and Enhancement in Multi-Processor Systems-On-Chip","authors":"G. Beltrame, C. Bolchini, L. Fossati, A. Miele, D. Sciuto","doi":"10.1109/DFT.2007.35","DOIUrl":"https://doi.org/10.1109/DFT.2007.35","url":null,"abstract":"Reliability issues play a relevant role in the design of embedded systems for critical applications; this and the always increasing performance requirements lead to the adoption of new architectural solutions, as shown by the introduction of Multi-Processor Systems-on- Chip (MPSoC). MPSoCs raise new challenges related to the complexity of the interactions among several independent cores. This paper presents a framework, based on a simulation platform, for the design of this kind of embedded systems; the framework supports the use of reliability techniques in order to address fault detection and tolerance issues. The simulation platform is also adopted for a reliability assessment task, achieved by exploiting fault injection targeting each component of the system and by monitoring the effects on the entire architecture.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128129708","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Nanofabric PLA architecture with Redundancy Enhancement","authors":"M. Joshi, W. Al-Assadi","doi":"10.1109/DFT.2007.36","DOIUrl":"https://doi.org/10.1109/DFT.2007.36","url":null,"abstract":"Fundamental electronic structures such as diodes and FETs have been shown to be constructed using selectively doped semiconducting carbon nanotubes or silicon nanowires (CNTs, SiNWs) at nanometer scale. Memory and Logic cores have been proposed, that use the configurable junctions in 2D crossbars of CNTs. These memory and logic arrays at this scale exhibit a significant amount of defects that account for poor a yield. Configuration of these devices in the presence of defects demands an overhead in terms of area and programming time. This work introduces a PLA configuration that makes use of fixed and adaptive redundancy in terms of the number of nanowires. This is done in order to simplify the process of programming the PLA, increase the yield, reduce the time complexity, and in turn, reduce the cost of the system.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124791498","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Checker Design for On-line Testing of Xilinx FPGA Communication Protocols","authors":"M. Straka, Jiri Tobola, Z. Kotásek","doi":"10.1109/DFT.2007.21","DOIUrl":"https://doi.org/10.1109/DFT.2007.21","url":null,"abstract":"In the paper, a methodology of developing checkers for communication protocol testing is presented. It was used to develop checker to test IP cores communication protocol implemented in Xilinx FPGA based designs. A formal language enabling to describe the protocol was created for this purpose together with a generator of the formal description into VHDL code. The VHDL code can be then used for the synthesis of the checker structure and used in applications with Xilinx FPGAs.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"148 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123399590","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}