G. Beltrame, C. Bolchini, L. Fossati, A. Miele, D. Sciuto
{"title":"多处理器片上系统可靠性评估与增强框架","authors":"G. Beltrame, C. Bolchini, L. Fossati, A. Miele, D. Sciuto","doi":"10.1109/DFT.2007.35","DOIUrl":null,"url":null,"abstract":"Reliability issues play a relevant role in the design of embedded systems for critical applications; this and the always increasing performance requirements lead to the adoption of new architectural solutions, as shown by the introduction of Multi-Processor Systems-on- Chip (MPSoC). MPSoCs raise new challenges related to the complexity of the interactions among several independent cores. This paper presents a framework, based on a simulation platform, for the design of this kind of embedded systems; the framework supports the use of reliability techniques in order to address fault detection and tolerance issues. The simulation platform is also adopted for a reliability assessment task, achieved by exploiting fault injection targeting each component of the system and by monitoring the effects on the entire architecture.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"A Framework for Reliability Assessment and Enhancement in Multi-Processor Systems-On-Chip\",\"authors\":\"G. Beltrame, C. Bolchini, L. Fossati, A. Miele, D. Sciuto\",\"doi\":\"10.1109/DFT.2007.35\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Reliability issues play a relevant role in the design of embedded systems for critical applications; this and the always increasing performance requirements lead to the adoption of new architectural solutions, as shown by the introduction of Multi-Processor Systems-on- Chip (MPSoC). MPSoCs raise new challenges related to the complexity of the interactions among several independent cores. This paper presents a framework, based on a simulation platform, for the design of this kind of embedded systems; the framework supports the use of reliability techniques in order to address fault detection and tolerance issues. The simulation platform is also adopted for a reliability assessment task, achieved by exploiting fault injection targeting each component of the system and by monitoring the effects on the entire architecture.\",\"PeriodicalId\":259700,\"journal\":{\"name\":\"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)\",\"volume\":\"71 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-09-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFT.2007.35\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2007.35","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Framework for Reliability Assessment and Enhancement in Multi-Processor Systems-On-Chip
Reliability issues play a relevant role in the design of embedded systems for critical applications; this and the always increasing performance requirements lead to the adoption of new architectural solutions, as shown by the introduction of Multi-Processor Systems-on- Chip (MPSoC). MPSoCs raise new challenges related to the complexity of the interactions among several independent cores. This paper presents a framework, based on a simulation platform, for the design of this kind of embedded systems; the framework supports the use of reliability techniques in order to address fault detection and tolerance issues. The simulation platform is also adopted for a reliability assessment task, achieved by exploiting fault injection targeting each component of the system and by monitoring the effects on the entire architecture.