{"title":"基于ram的fpga容错状态机","authors":"L. Frigerio, F. Salice","doi":"10.1109/DFT.2007.33","DOIUrl":null,"url":null,"abstract":"The paper presents a solution to protect FSM implemented on FPGAs from SEU, exploiting the embedded memories available in modern FPGA devices and a Hamming code for error detection and correction. A fault tolerant FSM architecture is presented, along with a generator to automate the FSM implementation. Experimental results show that this solution is particularly suited especially when FSMs with a large number of outputs are present in the target design.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"RAM-based fault tolerant state machines for FPGAs\",\"authors\":\"L. Frigerio, F. Salice\",\"doi\":\"10.1109/DFT.2007.33\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents a solution to protect FSM implemented on FPGAs from SEU, exploiting the embedded memories available in modern FPGA devices and a Hamming code for error detection and correction. A fault tolerant FSM architecture is presented, along with a generator to automate the FSM implementation. Experimental results show that this solution is particularly suited especially when FSMs with a large number of outputs are present in the target design.\",\"PeriodicalId\":259700,\"journal\":{\"name\":\"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)\",\"volume\":\"53 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-09-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFT.2007.33\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2007.33","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The paper presents a solution to protect FSM implemented on FPGAs from SEU, exploiting the embedded memories available in modern FPGA devices and a Hamming code for error detection and correction. A fault tolerant FSM architecture is presented, along with a generator to automate the FSM implementation. Experimental results show that this solution is particularly suited especially when FSMs with a large number of outputs are present in the target design.