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22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)最新文献

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Safety Evaluation of NanoFabrics 纳米织物的安全性评价
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.50
M. Grosso, M. Rebaudengo, M. Reorda
{"title":"Safety Evaluation of NanoFabrics","authors":"M. Grosso, M. Rebaudengo, M. Reorda","doi":"10.1109/DFT.2007.50","DOIUrl":"https://doi.org/10.1109/DFT.2007.50","url":null,"abstract":"Chemically assembled electronic nanotechnology is a promising alternative to CMOS fabrication. In particular, the nanoFabric has proven to be a viable solution for implementing digital circuits. The paper proposes some preliminary considerations about safety of application-oriented nanoFabrics based on some results obtained through an automated platform for fault simulation. In particular, a single-fault detecting methodology is proposed and evaluated. Different fault models have been taken into account in order to evaluate alternative scenarios.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133433604","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Error Tolerance of DNA Self-Healing Assemblies by Puncturing 刺穿DNA自愈组装体的容错性
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.8
M. Hashempour, Z. M. Arani, F. Lombardi
{"title":"Error Tolerance of DNA Self-Healing Assemblies by Puncturing","authors":"M. Hashempour, Z. M. Arani, F. Lombardi","doi":"10.1109/DFT.2007.8","DOIUrl":"https://doi.org/10.1109/DFT.2007.8","url":null,"abstract":"Self-assembly is affected by high error rates due to incorrect tiles in nano-technology manufacturing. Tile sets that can heal (fully or partially) an erroneous assembly have been proposed. Self-healing requires growth to be restarted such that erroneous tiles can be removed and the correct tiles to bind to the aggregate. Punctures can be used for this purpose. The goal of this paper is to characterize an intentionally induced puncture (and its relevant properties) on an erroneous tile site in the assembly. This allows to propagate any newly generated error away from the source of growth (i.e. the seed tile), such that self-assembly can continue along specific directions. Different types of puncture are considered with respect to growth direction, error and aggregate types. Puncture resilience is analyzed using a new characterization metric; different tile sets are investigated in detail. Analytical and simulation results are provided.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"539 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124265851","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
A-Diagnosis: A Complement to Z-Diagnosis A诊断:对z诊断的补充
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.9
I. Pomeranz, S. Reddy
{"title":"A-Diagnosis: A Complement to Z-Diagnosis","authors":"I. Pomeranz, S. Reddy","doi":"10.1109/DFT.2007.9","DOIUrl":"https://doi.org/10.1109/DFT.2007.9","url":null,"abstract":"Z-diagnosis was proposed for speeding up diagnostic fault simulation by identifying in an efficient manner fault pairs that are guaranteed to be distinguished by a fault detection test set. Z-diagnosis is based on z-sets, which capture information about the outputs to which fault effects may be propagated. We introduce a dual concept of a-diagnosis that is based on a-sets, which capture fault activation conditions. More generally, a-sets include necessary assignments for the detection of target faults. We use a -sets to speed up diagnostic fault simulation in two ways, as part of a test set independent process and as part of a test set dependent process. The test set dependent process uses only logic simulation of the test set to identify fault pairs that are guaranteed to be distinguished by the test set. We present experimental results to demonstrate the speed up in diagnostic fault simulation obtained by using a -sets in addition to z-sets.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"81 10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128135456","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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