22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)最新文献_第5页

Lazy Error Detection for Microprocessor Functional Units 微处理器功能单元的惰性错误检测

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.16

Mahmut Yilmaz, A. Meixner, S. Ozev, Daniel J. Sorin

引用次数: 22

TMR and Partial Dynamic Reconfiguration to mitigate SEU faults in FPGAs TMR和局部动态重构减轻fpga中单单元故障

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.25

C. Bolchini, A. Miele, M. Santambrogio

引用次数: 143

A Sharable Built-in Self-repair for Semiconductor Memories with 2-D Redundancy Scheme 二维冗余半导体存储器的可共享内置自修复

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.28

Swapnil Bahl

引用次数: 26

High Quality Test Vectors for Bridging Faults in the Presence of IC's Parameters Variations 集成电路参数变化情况下桥接故障的高质量测试向量

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.19

M. Favalli, M. Dalpasso

引用次数: 6

A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction 粒子撞击的精细化电模型及其对SEU预测的影响

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.43

S. Hellebrand, Christian G. Zoellin, H. Wunderlich, S. Ludwig, Torsten Coym, B. Straube

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引用次数: 13

Fault Tolerant Arithmetic Operations with Multiple Error Detection and Correction 具有多重错误检测和纠错的容错算术运算

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.56

M. Valinataj, S. Safari

引用次数: 18

A Scalable Framework for Defect Isolation of DNA Self-assemlbled Networks DNA自组装网络缺陷分离的可扩展框架

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.38

Masaru Fukushi, S. Horiguchi, Luke Demoracski, F. Lombardi

引用次数: 3

Testing of Asynchronous NULL Conventional Logic (NCL) Circuits in Synchronous-Based Desig 异步NULL常规逻辑(NCL)电路在同步设计中的测试

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.40

W. Al-Assadi, S. Kakarla

引用次数: 2

A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot-Pixel Defects 一种纠正现场热像素缺陷的容错主动像素传感器

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.53

J. Dudas, M. L. Haye, Jenny Leung, G. Chapman

引用次数: 4

Quantitative analysis of in-field defects in image sensor arrays 图像传感器阵列场内缺陷的定量分析

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI: 10.1109/DFT.2007.59

Jenny Leung, J. Dudas, G. Chapman, I. Koren, Z. Koren

引用次数: 40