纳米织物的安全性评价

22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Pub Date : 2007-09-26 DOI:10.1109/DFT.2007.50

M. Grosso, M. Rebaudengo, M. Reorda

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引用次数: 0

摘要

化学组装的电子纳米技术是一种有前途的替代CMOS制造。特别是，纳米织物已被证明是实现数字电路的可行解决方案。基于自动化故障仿真平台的一些结果，提出了应用纳米织物安全性的一些初步考虑。特别地，提出并评估了一种单故障检测方法。为了评估备选方案，考虑了不同的故障模型。

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Safety Evaluation of NanoFabrics

Chemically assembled electronic nanotechnology is a promising alternative to CMOS fabrication. In particular, the nanoFabric has proven to be a viable solution for implementing digital circuits. The paper proposes some preliminary considerations about safety of application-oriented nanoFabrics based on some results obtained through an automated platform for fault simulation. In particular, a single-fault detecting methodology is proposed and evaluated. Different fault models have been taken into account in order to evaluate alternative scenarios.

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22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)

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