Spare Parts in Analog Circuits: a Filter Example

Erik Schüler, A. Souza, L. Carro
{"title":"Spare Parts in Analog Circuits: a Filter Example","authors":"Erik Schüler, A. Souza, L. Carro","doi":"10.1109/DFT.2007.13","DOIUrl":null,"url":null,"abstract":"Spare parts technique has been widely used in digital designs. As memory cells are more susceptible to defects and faults than logic cells, redundancy has been extensively used for enhancing defect and fault tolerance through repair by spare replacement. The technique also aims yield increase, and points to be a very good solution since density integration gets ever higher. In this work, we propose the use of spare parts to develop reliable analog circuits, thus increasing fault tolerance by choosing among many identical blocks, the best ones that will compose the circuit. An example using a mixed-signal FIR filter is presented, showing that the technique can easily be adapted to help increase yield of analog circuits, too.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2007.13","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

Spare parts technique has been widely used in digital designs. As memory cells are more susceptible to defects and faults than logic cells, redundancy has been extensively used for enhancing defect and fault tolerance through repair by spare replacement. The technique also aims yield increase, and points to be a very good solution since density integration gets ever higher. In this work, we propose the use of spare parts to develop reliable analog circuits, thus increasing fault tolerance by choosing among many identical blocks, the best ones that will compose the circuit. An example using a mixed-signal FIR filter is presented, showing that the technique can easily be adapted to help increase yield of analog circuits, too.
模拟电路中的备件:一个滤波器的例子
备件技术在数字化设计中得到了广泛的应用。由于存储单元比逻辑单元更容易受到缺陷和故障的影响,冗余被广泛用于通过备件替换修复来增强缺陷和容错能力。该技术还旨在提高产量,并且由于密度集成变得越来越高,因此它是一个非常好的解决方案。在这项工作中,我们建议使用备件来开发可靠的模拟电路,从而通过在许多相同的模块中选择最好的模块来组成电路,从而增加容错性。文中给出了一个混合信号FIR滤波器的实例,表明该技术也可以很容易地用于提高模拟电路的良率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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