{"title":"Comparing fail-safe microcontroller architectures in light of IEC 61508","authors":"R. Mariani, P. Fuhrmann","doi":"10.1109/DFT.2007.63","DOIUrl":null,"url":null,"abstract":"In this paper, an overview is given on the main architectures used in the automotive to implement fail-safe microcontrollers. The concept of a new HW-centric, distributed and optimized architecture is also presented. In light of the IEC 61508 norm for safety related electronic systems, a comparisons between these different architectures is done based on a reference design. The paper concludes discussing how the presented architectures can be extended to become fail-functional","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2007.63","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 15
Abstract
In this paper, an overview is given on the main architectures used in the automotive to implement fail-safe microcontrollers. The concept of a new HW-centric, distributed and optimized architecture is also presented. In light of the IEC 61508 norm for safety related electronic systems, a comparisons between these different architectures is done based on a reference design. The paper concludes discussing how the presented architectures can be extended to become fail-functional