{"title":"根据IEC 61508比较故障安全微控制器体系结构","authors":"R. Mariani, P. Fuhrmann","doi":"10.1109/DFT.2007.63","DOIUrl":null,"url":null,"abstract":"In this paper, an overview is given on the main architectures used in the automotive to implement fail-safe microcontrollers. The concept of a new HW-centric, distributed and optimized architecture is also presented. In light of the IEC 61508 norm for safety related electronic systems, a comparisons between these different architectures is done based on a reference design. The paper concludes discussing how the presented architectures can be extended to become fail-functional","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"Comparing fail-safe microcontroller architectures in light of IEC 61508\",\"authors\":\"R. Mariani, P. Fuhrmann\",\"doi\":\"10.1109/DFT.2007.63\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, an overview is given on the main architectures used in the automotive to implement fail-safe microcontrollers. The concept of a new HW-centric, distributed and optimized architecture is also presented. In light of the IEC 61508 norm for safety related electronic systems, a comparisons between these different architectures is done based on a reference design. The paper concludes discussing how the presented architectures can be extended to become fail-functional\",\"PeriodicalId\":259700,\"journal\":{\"name\":\"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-09-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFT.2007.63\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2007.63","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Comparing fail-safe microcontroller architectures in light of IEC 61508
In this paper, an overview is given on the main architectures used in the automotive to implement fail-safe microcontrollers. The concept of a new HW-centric, distributed and optimized architecture is also presented. In light of the IEC 61508 norm for safety related electronic systems, a comparisons between these different architectures is done based on a reference design. The paper concludes discussing how the presented architectures can be extended to become fail-functional