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A simple procedure for characterizing line-stretcher phase shifters 一个简单的程序表征线拉伸相移器
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034564
J. E. Zuniga-Juarez, J. Reynoso‐Hernández, M. C. Maya‐Sanchez, J. R. Loo-Yau
{"title":"A simple procedure for characterizing line-stretcher phase shifters","authors":"J. E. Zuniga-Juarez, J. Reynoso‐Hernández, M. C. Maya‐Sanchez, J. R. Loo-Yau","doi":"10.1109/ARFTG77.2011.6034564","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034564","url":null,"abstract":"A novel procedure to characterize coaxial line-stretcher phase shifter based on the two-line method is presented in this work. Intrinsic losses and differential phase shift are determined using S-parameters data measured with an uncalibrated vector network analyzer. To validate the method, different trombone-type line-stretcher phase shifters are used with arbitrary connectors.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123879306","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analyses of RF impedance analyzer and LCR meter readout noise 射频阻抗分析仪和LCR表读出噪声分析
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034577
X. Liu, Hui Huang, Hui Xu
{"title":"Analyses of RF impedance analyzer and LCR meter readout noise","authors":"X. Liu, Hui Huang, Hui Xu","doi":"10.1109/ARFTG77.2011.6034577","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034577","url":null,"abstract":"Readout noise of RF impedance analyzer and LCR meter are observed and analyzed with narrow bandwidth noise theory. The difference between theory analysis and actual measurement results is shown. The effect of impedance measurement format on noise is discussed at last.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134538980","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Characterizations of asymmetric fixtures with a two-gate approach 用双栅极方法表征非对称夹具
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034555
J. Dunsmore, Ning Cheng, Yong-xun Zhang
{"title":"Characterizations of asymmetric fixtures with a two-gate approach","authors":"J. Dunsmore, Ning Cheng, Yong-xun Zhang","doi":"10.1109/ARFTG77.2011.6034555","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034555","url":null,"abstract":"A technique for extracting asymmetric fixtures from a through standard and de-embedding the fixture effects from the composite measurement of DUT and fixture combination has been proposed. The technique consists of: 1) building a through standard which is the cascaded combination of the two fixtures. The two fixtures can be asymmetric in return loss but are symmetric in insertion loss and have the same electrical lengths, 2) extracting the fixture S-parameters from the measurement of the through standard, 3) de-embedding the fixture effects from the composite measurement and characterizing only the DUT. The 2-port single-ended case was investigated first and then we extended the technique to 4-port mixed mode. Deductions for extracting the S-parameters of the two fixtures are described in details and the extraction result was validated with simulations and measurements.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126826091","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
MOS-16: A new method for in-fixture calibration and fixture characterization MOS-16:一种夹具内标定和夹具表征的新方法
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034560
M. Schramm, M. Hrobak, J. Schur, L. Schmidt, M. Konrad
{"title":"MOS-16: A new method for in-fixture calibration and fixture characterization","authors":"M. Schramm, M. Hrobak, J. Schur, L. Schmidt, M. Konrad","doi":"10.1109/ARFTG77.2011.6034560","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034560","url":null,"abstract":"The calibration of test fixtures or the estimation of their performance are well known tasks. In the case of fixtures with variable length, there are some established methods to de-embed the DUT (Device Under Test). The calibration or evaluation of a fixture with a fixed length, like a socket or a probe-card offers less possibilities. This contribution presents a novel calibration procedure, capable of gathering not only the information required for a proper de-embedding but also for an absolute characterization of fixed length fixtures, including crosstalk. In order to achieve this, specific assumptions have to be made. These assumptions, the resulting calibration scheme as well as a first validation through a known device will be addressed together with a first discussion on error propagation.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121525957","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Uncertainty in multiport S-parameters measurements 多端口s参数测量中的不确定度
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034578
A. Ferrero, M. Garelli, B. Grossman, Susan Choon, V. Teppati
{"title":"Uncertainty in multiport S-parameters measurements","authors":"A. Ferrero, M. Garelli, B. Grossman, Susan Choon, V. Teppati","doi":"10.1109/ARFTG77.2011.6034578","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034578","url":null,"abstract":"Measurement uncertainty is an often overlook aspect of modern RF and signal integrity measurements. Currently, one- and two-port measurement systems have been studied quite in detail, but few investigations have focused on multiport network analyzers. This paper presents recent advances of multiport S-parameters uncertainty analysis applied to inter-laboratory comparisons and large scale test instruments, such multiport cable testers.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132189553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
New calibration technique for coaxial network analyzer reflection measurements at millimeter-wave frequencies 同轴网络分析仪毫米波反射测量标定新技术
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034562
M. Horibe, N. Ridler, M. Salter, C. Eio
{"title":"New calibration technique for coaxial network analyzer reflection measurements at millimeter-wave frequencies","authors":"M. Horibe, N. Ridler, M. Salter, C. Eio","doi":"10.1109/ARFTG77.2011.6034562","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034562","url":null,"abstract":"This paper describes the development of a new calibration technique for Vector Network Analyzers (VNA) operating in coaxial lines at millimeter-wave frequencies. The technique utilizes a new design of primary reference standard — the air-dielectric open-circuit. These standards are mechanically robust and provide a simple route to achieving VNA measurements that are traceable to the International System of units (SI). Examples are given showing the calibration technique realized in the 1.85 mm coaxial line size. Results are presented of reflection coefficient measurements made to 70 GHz in this line size.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"3 6","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113936311","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A superior solution to control the connection repeatability of Coaxial Airline Impedance standards used for network analyzer verification 一个优越的解决方案，以控制连接的可重复性同轴航空阻抗标准用于网络分析仪验证
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034575
T. Roberts, Y. Lee
{"title":"A superior solution to control the connection repeatability of Coaxial Airline Impedance standards used for network analyzer verification","authors":"T. Roberts, Y. Lee","doi":"10.1109/ARFTG77.2011.6034575","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034575","url":null,"abstract":"There have been many attempts with regard to mitigate the effects of pin gap when dealing with beadless (unsupported) airline impedance standards in order to improve calibration accuracy. This paper discusses common mechanical and electrical problems with the use of beadless airlines. Connection repeatability is a main concern since these errors cannot be corrected for. There are many aspects which can influence connection repeatability of beadless airlines. Pin gap of the mating connectors can greatly influence the center conductor's longitudinal position with respect to its outer conductor is one important example. Beaded Coaxial Airline Impedance standards can offer advantages over beadless versions. Some of these advantages are: known pin gap on each end when mated, good concentricity, ease of use and reduced risk in damage when mated with another connector, etc. When used as verification standards, beaded airlines can offer improved reproducibility and repeatability characteristics by eliminating the various connection repeatability problems associated with beadless airlines.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129988956","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Design study of a thermocouple power sensor as a monolithic fin-line 作为单片鳍线的热电偶功率传感器设计研究
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034554
Mark H. Jones, Jonathan B. Scott
{"title":"Design study of a thermocouple power sensor as a monolithic fin-line","authors":"Mark H. Jones, Jonathan B. Scott","doi":"10.1109/ARFTG77.2011.6034554","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034554","url":null,"abstract":"Making traceable power measurements above 110 GHz using current measurement technologies is challenging. We investigate a design of power sensor consisting of a thermocouple-based integrated circuit (IC) mounted as a finline component in WR-6 waveguide. The design is original in that it contains an antenna, terminating resistor and thermocouples on-chip. We detail the design and report results from simulations and measurements made on a two-port 16:1 scale model. Our design of scale model provides both insertion and reflection loss measurements. Electromagnetic simulation and easily-calibrated model measurements confirm that the short antenna fins feasible on a monolithic microwave integrated circuit (MMIC) can achieve acceptable specifications. The design proves to be relatively insensitive to the value of the terminating resistance or the size of the antenna fins.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134007815","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Modification of waveguide flange design for millimeter and submillimeter-wave measurements 毫米波和亚毫米波测量波导法兰设计的改进
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034557
M. Horibe, K. Noda
{"title":"Modification of waveguide flange design for millimeter and submillimeter-wave measurements","authors":"M. Horibe, K. Noda","doi":"10.1109/ARFTG77.2011.6034557","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034557","url":null,"abstract":"Waveguide flange design makes major impact to measurement reproducibility in the range of millimeter and sub-millimeter-wave frequencies, e.g. above 110 GHz. Original concept of flange design, so-call “Oshima” flange, was established in the early 2000s. Its flange alignment is ensured using ring with tight tolerance, however, it is not compatible to MIL-DTL-3922/67C (UG-387) flange. This paper describes a modification of “Oshima” flange in order to establishing a compatibility with UG-387 flange design, and evaluation result of its capability of connection repeatability in the WR-3 (220 GHz–330 GHz) frequency band. Furthermore, the quarter wave length shim, as a TRL “through” line standard, is specially modified to fit with a new design of “Oshima” flange, then, its capability of connection repeatability is also measured and discussed.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127861597","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
An improved stability broadband/mm-wave VNA structure 一种改进的稳定性宽带/毫米波VNA结构
77th ARFTG Microwave Measurement Conference Pub Date : 2011-06-10 DOI: 10.1109/ARFTG77.2011.6034567
J. Martens, K. Noujeim, T. Roberts
{"title":"An improved stability broadband/mm-wave VNA structure","authors":"J. Martens, K. Noujeim, T. Roberts","doi":"10.1109/ARFTG77.2011.6034567","DOIUrl":"https://doi.org/10.1109/ARFTG77.2011.6034567","url":null,"abstract":"In the past, the stability and quality of broadband mm-wave network analysis measurements have sometimes been challenges because of required high frequency multiplexing schemes, physically large and inhomogeneous measurement structures and complex receiver chains. A newer structure for this class of VNA measurements will be presented where a broadband, miniature front-end receiver is used for more of the acquisition with a single receiver chain. Using this system structure, improved stabilities have been demonstrated including thru line S21 deviations below 0.02 dB and 0.5 degree over 24 hours from 70 kHz to 120 GHz and temperature sensitivities on the order of 0.01 dB/C and 0.1 deg/C over the same range. This could allow for longer intervals between calibration and improved measurement results.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128965156","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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